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Tungsten 'fuzz' growth re-examined: the dependence on ion fluence in non-erosive and erosive helium plasma

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Figure

Table 1. He plasma parameter spaces for the devices used in this study.
Figure 1. Comparison of tungsten fuzz layer thickness measured by CFM and cross-sectional SEM
Figure 2. Fuzz layer thickness versus He ion fluence for data presented in tables A1and A2
Figure 3. Optimizing equation (3) fitting parameters: (a) varyingline is the optimized case where α and C, Φ0 fixed(b) varying C, with α and Φ0 fixed and (c) varying Φ0, with C and α fixed
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