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Measurement of the emission spectrum of a semiconductor laser using laser-feedback interferometry

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Figure

Figure 1. Schematic diagram of the experimental system showing laser-feedback interferometer (box A) and Fourier transform infrared (FTIR) spectrometer (box B), used for the purposes of spectral comparison
Figure 2. Interferograms recorded via the laser terminal voltage and (interferograms corresponding to data presented in (VLFI with the laser operating on (a) single and (b) multiple longitudinal cavity modes
Figure 3. Normalised emission spectra obtained by laser-feedback interferometry (blue) and FTIR spectroscopy (red) for diferent dc driving currents, corresponding to both single- and multiple-mode operating regimes
Figure 4. Frequency perturbation ∆v of the laser cavity mode at ~2.241 THz under optical feedback, measured over a cavity extension in the laser-feedback interferometer ∆Lext = 200 µm, for feedback parameters (a) C ≈ 1.5 and (b) C ≈ 0.5 (blue circles)
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