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High field induced stress suppression of GIDL effects in TFTs

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Figure

Fig. 1. Example accumulation-mode p-type TFT ID-VG characteristic pre-stress and post-stress showing reduction in GIDL current
Fig. 2. Subthreshold characteristics of two NFETs showing GIDL current at various drain voltages
Fig.   Fig. 3. GIDL in a gated diode configuration showing deep-depletion region and hole and 3
Fig. 4. Schematic of N-channel TFT showing the PBT GIDL effect [6].  n-poly Gate
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