Integrated Epitaxial Ni/VO2/c-YSZ/Si(001) Thin Film Heterostructures and Properties.
178
0
0
Full text
Figure
+7
Outline
Yttria Stabilized Zirconia (YSZ) – Buffer Layer
Growth Techniques: Pulsed Laser Deposition (PLD)
Structural & Mechanical Properties: X-ray Diffraction (XRD)
Structural & Interfacial Properties & Defects:
Film growth and Epitaxial Relationships
Epitaxial Relationships and Atomic Alignments
Results & Discussion
Conclusions & Future Work
Related documents