September 2015 Tanja Braun
Opportunities and Challenges
for Fan-out Panel Lev el Packaging
(FOPLP)
T. Braun (1), M. Töpper (1), S. Raatz (1), S. Voges (2), R. Kahle (2), V. Bader (1), J. Bauer (1),
K.-F. Becker (1), T. Thomas (2), R. Aschenbrenner (1), K.-D. Lang (2)
(1) Fraunhofer Institute for Reliability and Microintegration
Gustav-Meyer-Allee 25, 13355 Berlin, Germany e-mail: [email protected]
phone: +49-30/464 03 244 fax.: +49-30/464 03 254 (2) Technical University Berlin, Microperipheric Center
Outline
Motiv ation for Panel Lev el Packaging
PLP Res ults
As s em bly on 24”x 18” Panel Lev el
Com pres s ion Molding
Die S hift
Redis tribution Outlook
S um m ary : Adv antages & Challenges for FOPLP
September 2015 Tanja Braun
FOWLP/FOPLP Process Flow Options
Die assembly on carrier
Wafer/panel overmolding
Carrier release
RDL (e.g. thin film, PCB based, …), balling, singulation
Apply thermal release tape on carrier Apply release layer on carrier
RDL (e.g. thin film, PCB based, …)
Die assembly on carrier
Wafer/panel overmolding
Carrier release, balling, singulation
September 2015 Tanja Braun
Roadmap Fan-Out Panel Level Packaging
Challenges for Panel Packaging
as s em bly com pres s ion m olding carrier preparation debonding redis tri-bution handling, thinning & s ingulation E q u ip m e n t M a te ri a l • Carrier steel, glass,..? • Thermo release tape Alternatives? • EMC liquid, granular, sheet? • Dielectric polymers liquid or film? photosensitive or not? • Sputter targets • Plating • Handling carrier Tape or other material Temporary adhesives • Tape laminator Available automatic equipment?
• Pick and Place Accuracy on panel size? • Material application Dispensing, sprinkle, … • Molding Uniformity, thickness control, … • Debonder Available automatic equipment? • Lithography Stepper, laser ablation, LDI • Sputtering, plating Thickness variation, lines & spaces
• Thinning & Dicing Available
automatic equipment?
September 2015 Tanja Braun
From Wafer to Panel Size for Fan-out Packaging
24“ x 18“
610 x 457 mm²
12“
300 mm
8“
6“
Wafer Technologies
PCB Technologies
IZM Wafer Level Packaging Line (RDL)
for Wafer Sizes 100 mm / 150 mm / 200mm / 300 mm
Sputter Spin Coater Mask Aligner Wafer Plating Wet Etching
Spin Coater
September 2015 Tanja Braun
IZM Panel Level Embedding Line
from Wafer Scale to Panel Scale 610 x 456 mm²/24”x18”
Datacon evo/ ASM Siplace CA3
Mahr OMS 600/ IMPEX proX3 WL: Towa up to 8” PL: APIC up to 18”x24” incl. 12” WL Lauffer/ Bürkle Siemens Microbeam/ Schmoll Picodrill with
HYPER RAPID 50 Ramgraber automatic plating line Schmoll MX1 Orbotech Paragon Ultra 200 Schmid CREAMET 600 CI 2 S3
September 2015 Tanja Braun
FOWLP/FOPLP Process Flow Steps
Die assembly on carrier
Wafer/panel overmolding
Carrier release
RDL (e.g. thin film, PCB based, …), balling, singulation
Apply thermal release tape on carrier Apply release layer on carrier
RDL (e.g. thin film, PCB based, …)
Die assembly on carrier
Wafer/panel overmolding
Carrier release, balling, singulation
Mold first
RDL first
24”x 18” 24”x 18”
High Speed Assembly on 24”x18”
Assembly of dies and fiducials
5.680 chips (2 x 3 x 0.25 mm³) have been placed on the panel
Assembly speed of
~ 6.500 chips/h using one collect and place 20-nozzle revolver head
using four assembly heads maximum assembly speed could be accelerated up to 32.000 chips/h
September 2015 Tanja Braun
Assembly Strategies on 18”x 24”
G1 G2 G3 B A B A B A B A C C C C Binitial fiducial dies
A -300 -200 -100 0 100 200 300 -0,10 -0,08 -0,06 -0,04 -0,02 0,00 0,02 0,04 0,06 0,08 0,10 x [m m] x-position [mm] -200 -100 0 100 200 -0,10 -0,08 -0,06 -0,04 -0,02 0,00 0,02 0,04 0,06 0,08 0,10 y [m m] y-position [mm] -300 -200 -100 0 100 200 300 -0,10 -0,08 -0,06 -0,04 -0,02 0,00 0,02 0,04 0,06 0,08 0,10 x [m m] x-position [mm] -200 -100 0 100 200 -0,10 -0,08 -0,06 -0,04 -0,02 0,00 0,02 0,04 0,06 0,08 0,10 y [m m] y-position [mm] Assembly Option A:
three fiducial dies have been placed first and in a second step all other dies have been place in reference to the initial fiducial dies
Assembly Option B:
Global fiducials (G1, G2 and G3) have been assembled first. Local fiducial dies for the four segments (A, B, C) have been placed in a second step in reference to the global fiducials. Finally all other dies are
Compression Molding - Principle
2 – 15 min
Short cycle time
Constant temperature
-> no heating or cooling ramps
No full compression pressure over longer time
PMC and mold release extra process steps Vacuum Mold Tool Mold Tool Wafer Cavity Release Film EMC process profile process principle
September 2015 Tanja Braun
Molding Compounds for Large Area Encapsulation
Liquid Compression
Molding Compounds
Granular Compression
Molding Compounds
Sheet Lamination
Molding Compounds
Standard material for wafer level embedding
Paste-like material is
dispensed in the cavity and flows during tool closing and compression of the tooling
Limited potential for large
area due to complex
dispense patterns needed and longer flow length?
€€
Standard material for MAP compression molding
Granular material is
distributed nearly homo-geneously all over the cavity and melts and the droplets have to fuse during closing and compression of the tooling
No limitations for large area application
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Standard material for wafer level embedding
Material sheets are
melting and only flow around dies for
encapsulation
Sheets in defined thicknesses/volume
No limitations for large area application
Material Evaluation for Compression Molding
properties A B
liquid granular
filler content 89 wt.-% 90 wt.-%
filler cut size 75 µm 55 µm
CTE1 7,5 ppm/K 7,2 ppm/K
CTE1 33 ppm/K 30 ppm/K
Tg 165 C 175 C
flexural modulus @ RT 22 GPa 27 GPa
mold temperature 125 C 125 C
inmold cure time 600 s 420 s
PMC temperature 125 C 125 h PMC time 1 h 2 h 40 60 80 100 120 140 160 180 -0.04 -0.02 0.00 material B material A hea t flow [W/ g] temperature [°C] 20 40 60 80 100 120 102 103 104 105 106 107 material B visco sity [Pas] temperature [°C] material A DS C Rheology
Comparable cured material properties
Comparable low mold and cure temperature but different cure times
September 2015 Tanja Braun
Mold Compound Application
Liquid EMC
Granular EMCs
Dispensing of dot patterns
Volume control by insitu weighing
Homogeneous spreading
Volume control by weighing
Manually by sieve technology, automatically by vibrating unit
Compression Molding on 12”/300 mm Wafer Size
Liquid EMC
Granular EMCs
Dispensing of one dot in the center
Homogeneous filling without flow marks or knit lines
Homogeneous spreading
Homogeneous filling without flow marks or knit lines
September 2015 Tanja Braun
Compression Molding on 24”x18” Panel Size
Liquid EMC – Evaluation of dot size pattern
Evaluation of different dot patterns – target panel thickness of 450 µm (~ 250 g)
Dispense time with state of the art material and equipment 20 – 30 min
1
2
Compression Molding on 24”x18” Panel Size
Liquid EMC – Evaluation of dot size pattern
Complete filling of the 24”x18” panel feasible
Strong flow marks and knit lines for all patterns, dispense time too long
1
2
3
4
Strong flow marks and knit lines
Strong flow marks and knit lines
Strong flow marks and knit lines
Panel broken along knit line
Strong flow marks and knit lines
September 2015 Tanja Braun
Compression Molding on 24”x18” Panel Size
Granular EMC – Evaluation of spreading
Evaluation of two different spreading patterns – target panel thickness of 450 µm (~ 250 g)
o Dot pattern
o Homogeneous spreading
Application time with state of the art material and manual equipment 5 – 10 min
Compression Molding on 24”x18” Panel Size
Granular EMC – Evaluation of spreading
Complete filling of the 24”x18” panel feasible
Granular compound distribution has also an influence on flow marks
Homogeneous distribution of the compound required
1
2
Flow marks in the shape of the granular dot pattern
September 2015 Tanja Braun
Compression Molding on 24”x18” Panel Size
Liquid EMC
Granular EMCs
Molded panels with liquid EMC show less flow marks as blank panels
Significant marks only visible at the panel edges where no dies are assembled
Molding of panels with assembled dies
(die thickness: 250 µm, mold thickness: 450 m)
Molded panels with granular EMC show nearly no flow marks
Encapsulation of assembled panels with liquid and granular compound feasible
Die Shift on 18”x 24”
initial fiducial dies
A
Assembly Option A:
three fiducial dies have been placed first and in a second step all other dies have been place in reference to the initial fiducial dies
-300 -200 -100 0 100 200 300 -0,6 -0,5 -0,4 -0,3 -0,2 -0,1 0,0 0,1 0,2 0,3 0,4 0,5 0,6 x [m m] x-position [mm] -200 -100 0 100 200 -0,6 -0,5 -0,4 -0,3 -0,2 -0,1 0,0 0,1 0,2 0,3 0,4 0,5 0,6 y [m m] y-position [mm]
Linear die shift in x- and y-direction => compensation possible
September 2015 Tanja Braun
Die Shift on 18”x 24”
G1 G2 G3 B A B A B A B A C C C C B Assembly Option B:Global fiducials (G1, G2 and G3) have been assembled first. Local fiducial dies for the four segments (A, B, C) have been placed in a second step in reference to the global fiducials. Finally all other dies are assembled in reference to the local fiducials.
-300 -200 -100 0 100 200 300 -0,6 -0,5 -0,4 -0,3 -0,2 -0,1 0,0 0,1 0,2 0,3 0,4 0,5 0,6 x [m m] x-position [mm] -200 -100 0 100 200 -0,6 -0,5 -0,4 -0,3 -0,2 -0,1 0,0 0,1 0,2 0,3 0,4 0,5 0,6 y [m m] y-position [mm]
Reference to global fiducials
Comparable results to assembly option A
Linear die shift in x- and y-direction => compensation possible
Die Shift on 18”x 24”
G1 G2 G3 B A B A B A B A C C C C B Assembly Option B:Global fiducials (G1, G2 and G3) have been assembled first. Local fiducial dies for the four segments (A, B, C) have been placed in a second step in reference to the global fiducials. Finally all other dies are assembled in reference to the local fiducials.
Reference to local fiducials
Linear die shift in x- and y-direction in each quarter => compensation possible
Same slopes in all quarters
September 2015 Tanja Braun
RDL on Panel Size – Quo Vadis?
24“ x 18“ 610 x 457 mm² 12“ 300 mm 8“ 6“ PCB based technologies
Already available on panel level – proof of concept has been demonstrated
Currently limited to 10 µm lines and spaces
Maskless adaptable processes possible
No die surface opening possible for e.g. sensors or LEDs
Low cost potential Thin film technologies
Proven and established process for FOWLP
Fine line structuring down to 2 µm lines and spaces
Die surface opening possible for e.g. sensors or LEDs
Quite expensive equipment
No simple upscaling of technologies from WL to PL
Not one solution for everything
Application defined – “best of both worlds”
New materials in combination with new processes must be developed
September 2015 Tanja Braun
• Electrical Performance:
Proof of concept for very RF-Modules beyond 30 GHz.
• Improved wiring and I/O:
There is several decades of experience in fine line wiring and
interconnection technology in the IC industry that can be leveraged for
packaging technology.
• Standardization:
Standardization is key for embedding die package to multi-sourcing
• Thermo-mechanical reliability :
Improved reliability compared to FIWLP due to additional plastic
packaging
• Cost:
Cost advantages are perceived with the ultra-miniaturized approach
proposed when coupled with large area, high throughput and high
volume production.
Challenges for FOPLP
• Warpage ( Assembly, Manufacturability)
• Heterogeneous materials and non-symmetric structure cause bow
• Polymer materials with adapted CTE& modulus and low shrinkage are
required
• Optimized layer sequence and design required
• Accuracy/Resolution ( Miniaturization)
• Improved optical recognition systems for placement equipment
• Die shift compensation
• Imaging with high depth of focus and high resolution
• Local alignment LDI or scanner or stepper
• Yield ( Cost)
• Suited materials and components
• Optimized processes
• Production experience learning curve
• Low k Polymers for RDL ( Performance)
• Standard epoxy polymers are not sufficient for high performance RDL
• Low k with low loss are essential for RF performance
September 2015 Tanja Braun
FOPLP – Current Status
cost
performance
f(L/S, pitch, no. dies, ….)
PL
Fraunhofer IZM FOPLP Industrial Consortium
Phase I
cost
performance
f(L/S, pitch, no. dies, ….)
PL
WL
Validation of current FOPLP concerning equipment, material, performance and cost
September 2015 Tanja Braun
Fraunhofer IZM FOPLP Industrial Consortium
Phase II
cost
performance
f(L/S, pitch, no. dies, ….)
PL
WL
FOPLP enhancement with adapted/optimized equipment and materials