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LATW

12

th

IEEE Latin-American Test Workshop

2011

(2)

LATW

12

th

IEEE Latin-American Test Workshop

2011

SUNDAY, 27th MARCH

Registration

Test Technology Educational Program

Design for Yield & Reliability Yervant Zorian, Synopsys, USA

Lunch break

Test Technology Educational Program

The Art and Science of Delay Testing: Theory and Practice

Suriyaprakash Natarajan, Strategic CAD Laboratories at Intel Corporation, USA Arani Sinha, Advanced Micro Devices, USA

MONDAY, 28th MARCH

Registration Opening Session Keynote Address Coffee-break

Special Session 1: Low-Power and Thermal-Aware Design and Test

Enrico MACII, Politecnico di Torino, Italy

Letícia Maria BOLZANI POEHLS, PUCRS, Brazil

3D Thermal-Aware Floorplanner for Many-Core Single-Chip Systems

David CUESTA*, Jose RISCO-MARTIN*, Jose AYALA*(Speaker), David ATIENZA** * Universidad Complutense de Madrid, Spain

** EPFL, Switzerland 09:30 - 10:00: 10:00 - 13:00: Tutorial 1: Presenter: 13:00 - 14:30: 14:30 - 17:30: Tutorial 2: Presenters: 08:00 - 09:00: 09:00 - 09:20: 09:20 - 10:00: 10:00 - 10:20: 10:20 - 12:15: Organizer: Chair: Invited Talk: Speaker:

(3)

LATW

12

th

IEEE Latin-American Test Workshop

2011

MONDAY, 28th MARCH

Low-Power and Thermal-Aware Design and Test: Behavioral-Level Thermal- and Aging-Estimation Flow Sven ROSINGER*, Malte METZDORF*, Domenik HELMS*, Wolfgang H. NEBEL**

* OFFIS - Institute for Information Technology Oldenburg, Germany ** University of Oldenburg Oldenburg, Germany

A New Built-In Current Sensor Scheme to Detect Dynamic Faults in Nano-Scale SRAMs Felipe LAVRATTI*, Andrea CALIMERA**, Letícia Maria BOLZANI POEHLS*, Fabian VARGAS*, Enrico MACII**

* Catholic University – PUCRS, Brazil ** Politecnico di Torino

András TIMAR, Marta RENCZ

Budapest University of Technology and Economics

NBTI-Aware Data Allocation Strategies for Scrathpad Based Embedded Systems Cesare FERRI*, Dimitra PAPAGIANNOPOULOU*, Andrea CALIMERA**, Ruth BAHAR* * Brown University, USA

** Politecnico di Torino, Italy

Lunch break

Special Session 2: Analog and Mixed-Signal Test and Diagnosis

Florence AZAIS, LIRMM, France

Signature Based Test, Validation and Tuning of Mixed-Signal/RF Systems Abhijit CHATERJEE

School of Electrical and Computer Engineering - Georgia Tech, USA Pablo PETRASHIN*, Carlos DUALIBE**

* Universidad Católica de Córdoba (UCC)

** Faculté Polytechnique - Université de Mons (UMons), Belgium

(CONT.): Papers: 12:15 - 14:00: 14:00 - 16:15: Organizer: Invited Talk: Speaker: Papers:

(4)

LATW

12

th

IEEE Latin-American Test Workshop

2011

MONDAY, 28th MARCH

Test and Calibration of MEMS Convective Accelerometers with a Fully Electrical Setup Ahmed REKIK*,**, Florence AZAIS*, Norbert DUMAS*, Frédérick MAILLY*, Pascal NOUET* * LIRMM - CNRS/Univ. Montpellier 2, France

** ENIS - University of Sfax, Tunisia

Testing Linear and Non-Linear Analog Circuits Using Moment Generating Functions Suraj SINDIA*, Vishwani AGRAWAL*, Virendra SINGH**

* Auburn University, USA

** Indian Institute of Science, India Adaptive Alternate Analog Test Haralampos STRATIGOPOULOS TIMA Laboratory/CNRS, France

Investigating the Effects of Transient Faults in Programmable Capacitor Arrays

Tiago R. BALEN*, Guilherme S. CARDOSO*, Odair L. GONÇALEZ**, Marcelo S. LUBASZEWSKI* * Universidade Federal do Rio Grande do Sul – Porto Alegre, RS, Brazil

** Instituto de Estudos Avançados (IEAv) – São José dos Campos, SP, Brazil

Coffee-break

Session 1: Built-In Self-Test

Nicola NICOLICI, McMaster University, Canada

Vladimir PASCA, Lorena ANGHEL, Mounir BENABDENBI TIMA Laboratory, France

On-line BIST for Performance Failure Prediction under Aging Effects in Automotive Safety-Critical Applications

Ricardo OLIVEIRA*,**, Jorge SEMIAO*,***, Isabel TEIXEIRA*,**, MARCELINO BICHO DOS SANTOS*,**,

Paulo TEIXEIRA*,**

* INESC-ID, Lisboa, Portugal

** Instituto Superior Técnico, UTL, Lisboa, Portugal *** Universidade do Algarve, Faro, Portugal

(CONT.):

16:15 - 16:35: 16:35 - 17:35:

Chair: Papers:

(5)

LATW

12

th

IEEE Latin-American Test Workshop

2011

MONDAY, 28th MARCH

On the Functional Test of MESI Controllers

Edgar Ernesto SANCHEZ SANCHEZ**, ***, E. SANCHEZ*, M. SONZA REORDA*, A. TONDA*, J. VELASCO MEDINA**

* Politecnico di Torino, Torino, Italy ** Universidad del Valle, Cali, Colombia

*** Universidad Pedagógica y Tecnológica de Colombia, Sogamoso, Colombia

Session 2: Design & Synthesis for Testability, Automatic Test Generation

Francisco RUSSI, Synopsys, USA Martin CHLOUPEK, Ondrej NOVAK

Czech Technical University, Prague, Czech Republic

Programmable Sensor for On-Line Checking of Signal Integrity in FPGA-Based Systems Subject to Aging Effects

Maria VALDES*, Judit FREIJEDO*, Maria MOURE*, JUAN J. RODRIGUEZ-ANDINA*, Jorge SEMIAO**, Fabian VARGAS***, Isabel Cacho TEIXEIRA****, João Paulo TEIXEIRA ****

* University of Vigo, Vigo, Spain

** Instituto Superior Engenharia - Universidade do Algarve *** Catholic University – PUCRS, Brazil

**** IST/TUL, INESC-ID, Portugal

Test Power Reduction via Deterministic Alignment of Stimulus and Response Bits Eman ALQURAISHI*, Sobeeh ALMUKHAIZIM*, Ozgur SINANOGLU**

* Kuwait University, Kuwait ** New York University, Abu Dhabi

Functional Test Generation for the Replacement Mechanisms of Embedded Cache Memories Edgar Ernesto SANCHEZ SANCHEZ*, Wilson PEREZ HOLGIN**, Matteo SONZA REORDA*, Alberto TONDA*, Jaime VELASCO-MEDINA**

* Politecnico Di Torino, Torino, Italy ** Univ. del Valle, Colombia

(CONT.):

17:35 - 18:55:

Chair: Papers:

(6)

LATW

12

th

IEEE Latin-American Test Workshop

2011

TUESDAY, 29th MARCH

Session 3: Industrial Experience, Process Control and Measurements

César DUEÑAS, Freescale, Brazil

Testing in an Agile Product Development Environment: An Industry Experience Report Andreia DOS SANTOS

Instituto Nokia de Tecnologia, Manaus, Brazil

Sebastian SIEGL*, Kai-Steffen HIELSCHER*, Reinhard GERMAN*, Christian BERGER** * Universität Erlangen-Nürnberg, Erlangen, Germany

** Automotive Safety Technologies GmbH, Germany Modular and Adaptative test-Bed for Infrared Photodetectors Lester FARIA, Newton GOMES, Luis Felipe NOHRA, Fabio ALVES Instituto Tecnológico de Aeronáutica (ITA), São José dos Campos, Brazil

Session 4: Process Variation, Fault Modeling and Analysis

Vincent POUGET, IMS/CNRS, France

Resistive Bridge Defect Detectability Considering Process Variation and Technology Scaling Hector VILLACORTA*, Victor Hugo CHAMPAC*, Sebastian BOTA**, Jaume SEGURA** * INAOE, Mexico

** Universitat de les Illes Balears, Spain

Modeling the Effect of Process Variations on the Timing Response of Nanometer Digital Circuits Judit FREIJEDO*, Jorge SEMIAO**, Juan J. RODRIGUEZ-ANDINA*, Fabian VARGAS***, Isabel TEIXEIRA****, Paulo TEIXEIRA****

* University of Vigo, Vigo, Spain ** Universidade do Algarve, Portugal *** Catholic University – PUCRS, Brazil **** IST / INESC-ID, Portugal

08:15 - 09:15: Chair: Papers: 09:15 - 10:15: Chair: Papers:

(7)

LATW

12

th

IEEE Latin-American Test Workshop

2011

TUESDAY, 29th MARCH

Error-Resilient Design of Branch Predictors for Effective Yield Improvement Sobeeh ALMUKHAIZIM*, Ozgur SINANOGLU**

* Kuwait University, Kuwait ** New York University, Abu Dhabi

Coffee-break

Special Session 3: Design of ICs for Electromagnetic Robustness

Sonia BEN DHIA, INSA / Toulouse, France

VLSI Internal Testing: a Solution to Survive CAD Less Situation for High-Reliability Devices Philippe PERDU

CNES – Toulouse, France

Prediction of Long-Term Immunity of Integrated Circuits

Alexandre BOYER, Sonia BEN DHIA, Binhong LI, Bertrand VRIGNON INSA, Toulouse, France

IC Immunity Modeling Process Validation Using On-Chip Measurements

Sonia BEN DHIA*, Alexandre BOYER*, Bertrand VRIGNON*, Mikael DEOBARRO** * INSA, Toulouse, France

** Freescale Semiconductor Inc, France

Shielding Effectiveness Analysis for the Automotive Industry and the Application of Composite Materials Lucas TRAVASSOS, Yan MEDEIROS, Josiane DANTAS VIANA, Zora IONARA GAMA DOS SANTOS SENAI CIMATEC, Salvador, Bahia

First studies of the impact of dose radiation on the electromagnetic susceptibility of bipolar transistors Sylvie JARRIX, Laurent DUSSEAU, Nathalie CHATRY, Christian CHATRY, Patrick HOFFMANN, Adrien DORIDANT

Université Montpellier 2, France

(CONT.): 10:15 - 10:35: 10:35 - 13:10: Organizer: Invited Talk: Speaker: Papers:

(8)

LATW

12

th

IEEE Latin-American Test Workshop

2011

TUESDAY, 29th MARCH

Impact of RF-Based Fault Injection in Pierce Type Crystal Oscillators under EMC Standard Tests in Microcontrollers

Ricardo MALTIONE, Alfredo OLMOS, Andre BOAS, Eduardo DA SILVA, Jose SILVA * Freescale Semiconductor Inc, Campinas, Brazil

** CTI, Campinas, Brazil Interference

Juliano BENFICA*, Letícia Maria BOLZANI POEHLS*, Fabian VARGAS*, José LIPOVETZKY**, Ariel LUTENBERG**, Sebastián E. GARCÍA**, Edmundo GATTI***, Fernando HERNANDEZ****

* Catholic University – PUCRS, Brazil

** University of Buenos Aires – UBA, Buenos Aires, Argentina

*** Instituto Nacional de Tecnología Industrial – INTI, Buenos Aires, Argentina **** Universidad ORT, Montevideo, Uruguay

Lunch break

Special Session 4: Radiation Effects on ICs

Fréderic SAIGNÉ / Frédéric WROBEL, Univ. of Montpellier II, France Radiation Effects at Ground Level

Antoine TOUBOUL

Université Montpellier 2, France

Analysis of SEU parameters for the study of SRAM cells reliability under radiation Karine CASTELLANI-COULIÉ, Jean Michel PORTAL, Gilles MICOLAU, Hassen AZIZA IM2NP/UMR CNRS 6242 - Université Aix-Marseille, France

IMT Technopôle de Château – Gombert, Marseille, France

Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench Luigi DILILLO, Paolo RECH, Jean-Marc GALLIERE, Patrick GIRARD, Frédéric WROBEL,

Frédéric SAIGNE

LIRMM, Université Montpellier 2, France

(CONT.): 13:10 - 14:30: 14:30 - 16:45: Organizers: Invited Talk: Speaker: Papers:

(9)

LATW

12

th

IEEE Latin-American Test Workshop

2011

TUESDAY, 29th MARCH

Jimmy TARRILLO, Eduardo CHIELLE, Raul CHIPANA, Fernanda de LIMA KASTENSMIDT Instituto de Informática – Universidade Federal do Rio Grande do Sul (UFRGS), Brazil Robustness with respect to SEUs of a self-converging algorithm

Raoul VELAZCO, Gilles FOUCARD, Fabrice PANCHER, Wassim MANSOUR, Greicy MARQUÉS-COSTA, Devan SOHIER, Alain BUI

TIMA Laboratory – UJF - INPG, France

G. MICOLAU, H. AZIZA, K. CASTELLANI-COULIÉ, J-M. PORTAL Université Aix-Marseille

Coffee-break Embedded Tutorial 1

Ignacio ARRUENGO, Instituto Nacional de Técnica Aeroespacial INTA, Spain

Session 5: Fault-Tolerance in HW/SW

Carlos LISBOA, UFRGS, Brazil

Adaptive Approach to Tolerate Multiple Faulty Links in Network-on-Chip

Anelise KOLOGESKI, Caroline CONCATTO, Luigi CARRO, Fernanda de LIMA KASTENSMIDT Instituto de Informática – Universidade Federal do Rio Grande do Sul (UFRGS), Brazil

Reliability Enhancement via Sleep Transistors

Frank SILL TORRES*, Claas CORNELIUS**, Dirk TIMMERMANN** * Federal University of Minas Gerais, Belo Horizonte, Brazil

** University of Rostock, Germany

(CONT.): 16:45 – 17:05: 17:05 - 17:40: Tutorial: Speaker: 17:40 - 19:00: Chair: Papers:

(10)

LATW

12

th

IEEE Latin-American Test Workshop

2011

TUESDAY, 29th MARCH

A Fault Tolerant Service Discovery Protocol for Emergency Search and Rescue Missions Janine KNIESS*,**, Orlando LOQUES**, Celio ALBUQUERQUE**

* Santa Catarina State University (UDESC), Joinville, Brazil ** Fluminense Federal University (UFF), Rio de Janeiro, Brazil

Rodrigo POSSAMAI BASTOS, Giorgio DI NATALE, Marie-Lise FLOTTES, Bruno ROUZEYRE LIRMM - Université Montpellier II, Montpellier, France

WEDNESDAY, 30th MARCH

Embedded Tutorial 2

Advanced Test Methods for SRAMs

Alberto Bosio*, Luigi Dilillo*, Patrick Girard, S. Pravossoudovitch, A. Virazel LIRMM - Université Mont

* presenters

Session 6: Fault Injection and Simulation

Raoul VELAZCO, TIMA Laboratory, France Methodology and Platform for Fault Co-Emulation Jorge CORSO*, Francisco RAMIREZ**

* Freescale Semiconductors, Brazil ** Universidade de Sao Paulo, Brazil

Communication Fault Injection for Multi-Protocol Java Applications Testing Cristina MENEGOTTO, Taisy WEBER

Instituto de Informática, Universidade Federal do Rio Grande do Sul (UFRGS), Brazil

(CONT.): 08:15 - 08:50: Tutorial: Speaker: 08:50 - 09:50: Chair: Papers:

(11)

LATW

12

th

IEEE Latin-American Test Workshop

2011

WEDNESDAY, 30th MARCH

Using an FPGA-Based Fault Injection Technique to Evaluate Software Robustness under SEEs: A Case Study

Marta PORTELA-GARCIA*, Almudena LINDOSO*, Luis ENTRENA*, Mario GARCIA VALDERAS*, Celia LOPEZ-ONGIL*, Bernardo PIANTA**, Letícia BOLZANI POEHLS**, Fabian VARGAS**

* Carlos III University of Madrid, Spain ** Catholic University – PUCRS, Brazil

Coffee-break Embedded Tutorial 3

Software-Based Self-Test of Embedded Microprocessors Paolo Bernardi*, Michelangelo Grosso, Ernesto Sánchez

Dipartimento di Automatica e Informatica, Politecnico di Torino, Italy * presenter

Special Session 5: Design and Test of Reliable Software for Embedded Systems

Cristine GUSMÃO, UFPE, Brazil

Comparing Different Test Structures in a Company Cidinha GOUVEIA

GOTEST Consultoria e Treinamento em Tecnologia LTDA, Brazil An Approach for Clustering Test Data

Alexandre LENZ, Aurora POZO, Silvia VERGILIO Federal University of Parana (UFPR), Brazil

Evaluating Test Reuse of a Software Product Line Strategies

Wesley ASSUNÇÃO, Daniela TRINDADE, Thelma COLANZI, Silvia VERGILIO Federal University of Parana (UFPR), Brazil

Jose Rodrigo AZAMBUJA, Angelo LAPOLLI, Mauricio SCARPATO, Fernanda de LIMA KASTENSMIDT Instituto de Informática – Universidade Federal do Rio Grande do Sul (UFRGS), Brazil

(CONT.): 9:50 - 10:10: 10:10 – 10:45: 10:45 - 12:20: Organizer: Invited Talk: Speaker: Papers:

(12)

LATW

12

th

IEEE Latin-American Test Workshop

2011

WEDNESDAY, 30th MARCH

Lunch break

Elmar Uwe Kurt MELCHER, UFCG, Brazil

Claudionor N. Coelho Jr.*, Antonio Otavio Fernandes** * VP of Engineering, Jasper Design Automation / UFMG ** Computer Science Department / UFMG

Mikhail CHUPILKO, Alexander KAMKIN

Institute for System Programming of RAS, Moscow, Russia

Samuel PAGLIARINI, Paulo HAACKE, Fernanda de LIMA KASTENSMIDT

Instituto de Informática – Universidade Federal do Rio Grande do Sul (UFRGS), Brazil Formally Verifying an RTOS Scheduling Monitor IP Core in Embedded Systems

Carlos CASTRO MARQUEZ*, Jiang Chau WANG*, Marius STRUM*, Fabian VARGAS** * School of Engineering – University of Sao Paulo, Brazil

** Catholic University – PUCRS, Brazil Djones LETTNIN, WOLFGANG ROSENSTIEL University of Tübingen, Tübingen – Germany

Jorge TONFAT, Gustavo NEUBERGER, Ricardo REIS

Instituto de Informática – Universidade Federal do Rio Grande do Sul (UFRGS), Brazil

Coffee-break (CONT.): 12:20 - 13:50: 13:50 - 16:05: Organizer: Invited Talk: Speakers: Papers: 16:05 - 16:15:

(13)

LATW

12

th

IEEE Latin-American Test Workshop

2011

WEDNESDAY, 30th MARCH

Session 7: HDL-Based IC Design and Fault Modeling

Mutation Analysis for SystemC Designs at TLM

Valerio GUARNIERI*, Nicola BOMBIERI*, Graziano PRAVADELLI*, Franco FUMMI*, Hanno HANTSON**, Jaan RAIK**, Maksim JENIHHIN**, Raimund UBAR**

* Department of Computer Science - University of Verona, Verona, Italy

** Department of Computer Engineering - Tallinn University of Technology, Tallinn, Estonia

SystemC-AMS High-Level Modeling of Linear Analog Blocks with Power Consumption Information Laurent BOUSQUET, Fabio CENNI, Emmanuel SIMEU

TIMA-Laboratory, Grenoble, France

A cache based algorithm to predict HDL modules faults

Jose Augusto NACIF*,**, Thiago S. F. SILVA*, Luiz Filipe M. VIEIRA*, Alex Borges VIEIRA***, Antônio O. FERNANDES*, Claudionor N. COELHO Jr.*

*Universidade Federal de Minas Gerais, Belo Horizonte, Brazil **Universidade Federal de Viçosa, Florestal, Brazil

***Universidade Federal de Juiz de Fora, Juiz de Fora, Brazil

Closing Remarks (CONT.): 16:15 - 17:25: Chair: Papers: 17:25 - 17:40:

References

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