LATW
12
th
IEEE Latin-American Test Workshop
2011
LATW
12
thIEEE Latin-American Test Workshop
2011
SUNDAY, 27th MARCH
Registration
Test Technology Educational Program
Design for Yield & Reliability Yervant Zorian, Synopsys, USA
Lunch break
Test Technology Educational Program
The Art and Science of Delay Testing: Theory and Practice
Suriyaprakash Natarajan, Strategic CAD Laboratories at Intel Corporation, USA Arani Sinha, Advanced Micro Devices, USA
MONDAY, 28th MARCH
Registration Opening Session Keynote Address Coffee-break
Special Session 1: Low-Power and Thermal-Aware Design and Test
Enrico MACII, Politecnico di Torino, Italy
Letícia Maria BOLZANI POEHLS, PUCRS, Brazil
3D Thermal-Aware Floorplanner for Many-Core Single-Chip Systems
David CUESTA*, Jose RISCO-MARTIN*, Jose AYALA*(Speaker), David ATIENZA** * Universidad Complutense de Madrid, Spain
** EPFL, Switzerland 09:30 - 10:00: 10:00 - 13:00: Tutorial 1: Presenter: 13:00 - 14:30: 14:30 - 17:30: Tutorial 2: Presenters: 08:00 - 09:00: 09:00 - 09:20: 09:20 - 10:00: 10:00 - 10:20: 10:20 - 12:15: Organizer: Chair: Invited Talk: Speaker:
LATW
12
thIEEE Latin-American Test Workshop
2011
MONDAY, 28th MARCH
Low-Power and Thermal-Aware Design and Test: Behavioral-Level Thermal- and Aging-Estimation Flow Sven ROSINGER*, Malte METZDORF*, Domenik HELMS*, Wolfgang H. NEBEL**
* OFFIS - Institute for Information Technology Oldenburg, Germany ** University of Oldenburg Oldenburg, Germany
A New Built-In Current Sensor Scheme to Detect Dynamic Faults in Nano-Scale SRAMs Felipe LAVRATTI*, Andrea CALIMERA**, Letícia Maria BOLZANI POEHLS*, Fabian VARGAS*, Enrico MACII**
* Catholic University – PUCRS, Brazil ** Politecnico di Torino
András TIMAR, Marta RENCZ
Budapest University of Technology and Economics
NBTI-Aware Data Allocation Strategies for Scrathpad Based Embedded Systems Cesare FERRI*, Dimitra PAPAGIANNOPOULOU*, Andrea CALIMERA**, Ruth BAHAR* * Brown University, USA
** Politecnico di Torino, Italy
Lunch break
Special Session 2: Analog and Mixed-Signal Test and Diagnosis
Florence AZAIS, LIRMM, France
Signature Based Test, Validation and Tuning of Mixed-Signal/RF Systems Abhijit CHATERJEE
School of Electrical and Computer Engineering - Georgia Tech, USA Pablo PETRASHIN*, Carlos DUALIBE**
* Universidad Católica de Córdoba (UCC)
** Faculté Polytechnique - Université de Mons (UMons), Belgium
(CONT.): Papers: 12:15 - 14:00: 14:00 - 16:15: Organizer: Invited Talk: Speaker: Papers:
LATW
12
thIEEE Latin-American Test Workshop
2011
MONDAY, 28th MARCH
Test and Calibration of MEMS Convective Accelerometers with a Fully Electrical Setup Ahmed REKIK*,**, Florence AZAIS*, Norbert DUMAS*, Frédérick MAILLY*, Pascal NOUET* * LIRMM - CNRS/Univ. Montpellier 2, France
** ENIS - University of Sfax, Tunisia
Testing Linear and Non-Linear Analog Circuits Using Moment Generating Functions Suraj SINDIA*, Vishwani AGRAWAL*, Virendra SINGH**
* Auburn University, USA
** Indian Institute of Science, India Adaptive Alternate Analog Test Haralampos STRATIGOPOULOS TIMA Laboratory/CNRS, France
Investigating the Effects of Transient Faults in Programmable Capacitor Arrays
Tiago R. BALEN*, Guilherme S. CARDOSO*, Odair L. GONÇALEZ**, Marcelo S. LUBASZEWSKI* * Universidade Federal do Rio Grande do Sul – Porto Alegre, RS, Brazil
** Instituto de Estudos Avançados (IEAv) – São José dos Campos, SP, Brazil
Coffee-break
Session 1: Built-In Self-Test
Nicola NICOLICI, McMaster University, Canada
Vladimir PASCA, Lorena ANGHEL, Mounir BENABDENBI TIMA Laboratory, France
On-line BIST for Performance Failure Prediction under Aging Effects in Automotive Safety-Critical Applications
Ricardo OLIVEIRA*,**, Jorge SEMIAO*,***, Isabel TEIXEIRA*,**, MARCELINO BICHO DOS SANTOS*,**,
Paulo TEIXEIRA*,**
* INESC-ID, Lisboa, Portugal
** Instituto Superior Técnico, UTL, Lisboa, Portugal *** Universidade do Algarve, Faro, Portugal
(CONT.):
16:15 - 16:35: 16:35 - 17:35:
Chair: Papers:
LATW
12
thIEEE Latin-American Test Workshop
2011
MONDAY, 28th MARCH
On the Functional Test of MESI Controllers
Edgar Ernesto SANCHEZ SANCHEZ**, ***, E. SANCHEZ*, M. SONZA REORDA*, A. TONDA*, J. VELASCO MEDINA**
* Politecnico di Torino, Torino, Italy ** Universidad del Valle, Cali, Colombia
*** Universidad Pedagógica y Tecnológica de Colombia, Sogamoso, Colombia
Session 2: Design & Synthesis for Testability, Automatic Test Generation
Francisco RUSSI, Synopsys, USA Martin CHLOUPEK, Ondrej NOVAK
Czech Technical University, Prague, Czech Republic
Programmable Sensor for On-Line Checking of Signal Integrity in FPGA-Based Systems Subject to Aging Effects
Maria VALDES*, Judit FREIJEDO*, Maria MOURE*, JUAN J. RODRIGUEZ-ANDINA*, Jorge SEMIAO**, Fabian VARGAS***, Isabel Cacho TEIXEIRA****, João Paulo TEIXEIRA ****
* University of Vigo, Vigo, Spain
** Instituto Superior Engenharia - Universidade do Algarve *** Catholic University – PUCRS, Brazil
**** IST/TUL, INESC-ID, Portugal
Test Power Reduction via Deterministic Alignment of Stimulus and Response Bits Eman ALQURAISHI*, Sobeeh ALMUKHAIZIM*, Ozgur SINANOGLU**
* Kuwait University, Kuwait ** New York University, Abu Dhabi
Functional Test Generation for the Replacement Mechanisms of Embedded Cache Memories Edgar Ernesto SANCHEZ SANCHEZ*, Wilson PEREZ HOLGIN**, Matteo SONZA REORDA*, Alberto TONDA*, Jaime VELASCO-MEDINA**
* Politecnico Di Torino, Torino, Italy ** Univ. del Valle, Colombia
(CONT.):
17:35 - 18:55:
Chair: Papers:
LATW
12
thIEEE Latin-American Test Workshop
2011
TUESDAY, 29th MARCH
Session 3: Industrial Experience, Process Control and Measurements
César DUEÑAS, Freescale, Brazil
Testing in an Agile Product Development Environment: An Industry Experience Report Andreia DOS SANTOS
Instituto Nokia de Tecnologia, Manaus, Brazil
Sebastian SIEGL*, Kai-Steffen HIELSCHER*, Reinhard GERMAN*, Christian BERGER** * Universität Erlangen-Nürnberg, Erlangen, Germany
** Automotive Safety Technologies GmbH, Germany Modular and Adaptative test-Bed for Infrared Photodetectors Lester FARIA, Newton GOMES, Luis Felipe NOHRA, Fabio ALVES Instituto Tecnológico de Aeronáutica (ITA), São José dos Campos, Brazil
Session 4: Process Variation, Fault Modeling and Analysis
Vincent POUGET, IMS/CNRS, France
Resistive Bridge Defect Detectability Considering Process Variation and Technology Scaling Hector VILLACORTA*, Victor Hugo CHAMPAC*, Sebastian BOTA**, Jaume SEGURA** * INAOE, Mexico
** Universitat de les Illes Balears, Spain
Modeling the Effect of Process Variations on the Timing Response of Nanometer Digital Circuits Judit FREIJEDO*, Jorge SEMIAO**, Juan J. RODRIGUEZ-ANDINA*, Fabian VARGAS***, Isabel TEIXEIRA****, Paulo TEIXEIRA****
* University of Vigo, Vigo, Spain ** Universidade do Algarve, Portugal *** Catholic University – PUCRS, Brazil **** IST / INESC-ID, Portugal
08:15 - 09:15: Chair: Papers: 09:15 - 10:15: Chair: Papers:
LATW
12
thIEEE Latin-American Test Workshop
2011
TUESDAY, 29th MARCH
Error-Resilient Design of Branch Predictors for Effective Yield Improvement Sobeeh ALMUKHAIZIM*, Ozgur SINANOGLU**
* Kuwait University, Kuwait ** New York University, Abu Dhabi
Coffee-break
Special Session 3: Design of ICs for Electromagnetic Robustness
Sonia BEN DHIA, INSA / Toulouse, France
VLSI Internal Testing: a Solution to Survive CAD Less Situation for High-Reliability Devices Philippe PERDU
CNES – Toulouse, France
Prediction of Long-Term Immunity of Integrated Circuits
Alexandre BOYER, Sonia BEN DHIA, Binhong LI, Bertrand VRIGNON INSA, Toulouse, France
IC Immunity Modeling Process Validation Using On-Chip Measurements
Sonia BEN DHIA*, Alexandre BOYER*, Bertrand VRIGNON*, Mikael DEOBARRO** * INSA, Toulouse, France
** Freescale Semiconductor Inc, France
Shielding Effectiveness Analysis for the Automotive Industry and the Application of Composite Materials Lucas TRAVASSOS, Yan MEDEIROS, Josiane DANTAS VIANA, Zora IONARA GAMA DOS SANTOS SENAI CIMATEC, Salvador, Bahia
First studies of the impact of dose radiation on the electromagnetic susceptibility of bipolar transistors Sylvie JARRIX, Laurent DUSSEAU, Nathalie CHATRY, Christian CHATRY, Patrick HOFFMANN, Adrien DORIDANT
Université Montpellier 2, France
(CONT.): 10:15 - 10:35: 10:35 - 13:10: Organizer: Invited Talk: Speaker: Papers:
LATW
12
thIEEE Latin-American Test Workshop
2011
TUESDAY, 29th MARCH
Impact of RF-Based Fault Injection in Pierce Type Crystal Oscillators under EMC Standard Tests in Microcontrollers
Ricardo MALTIONE, Alfredo OLMOS, Andre BOAS, Eduardo DA SILVA, Jose SILVA * Freescale Semiconductor Inc, Campinas, Brazil
** CTI, Campinas, Brazil Interference
Juliano BENFICA*, Letícia Maria BOLZANI POEHLS*, Fabian VARGAS*, José LIPOVETZKY**, Ariel LUTENBERG**, Sebastián E. GARCÍA**, Edmundo GATTI***, Fernando HERNANDEZ****
* Catholic University – PUCRS, Brazil
** University of Buenos Aires – UBA, Buenos Aires, Argentina
*** Instituto Nacional de Tecnología Industrial – INTI, Buenos Aires, Argentina **** Universidad ORT, Montevideo, Uruguay
Lunch break
Special Session 4: Radiation Effects on ICs
Fréderic SAIGNÉ / Frédéric WROBEL, Univ. of Montpellier II, France Radiation Effects at Ground Level
Antoine TOUBOUL
Université Montpellier 2, France
Analysis of SEU parameters for the study of SRAM cells reliability under radiation Karine CASTELLANI-COULIÉ, Jean Michel PORTAL, Gilles MICOLAU, Hassen AZIZA IM2NP/UMR CNRS 6242 - Université Aix-Marseille, France
IMT Technopôle de Château – Gombert, Marseille, France
Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench Luigi DILILLO, Paolo RECH, Jean-Marc GALLIERE, Patrick GIRARD, Frédéric WROBEL,
Frédéric SAIGNE
LIRMM, Université Montpellier 2, France
(CONT.): 13:10 - 14:30: 14:30 - 16:45: Organizers: Invited Talk: Speaker: Papers:
LATW
12
thIEEE Latin-American Test Workshop
2011
TUESDAY, 29th MARCH
Jimmy TARRILLO, Eduardo CHIELLE, Raul CHIPANA, Fernanda de LIMA KASTENSMIDT Instituto de Informática – Universidade Federal do Rio Grande do Sul (UFRGS), Brazil Robustness with respect to SEUs of a self-converging algorithm
Raoul VELAZCO, Gilles FOUCARD, Fabrice PANCHER, Wassim MANSOUR, Greicy MARQUÉS-COSTA, Devan SOHIER, Alain BUI
TIMA Laboratory – UJF - INPG, France
G. MICOLAU, H. AZIZA, K. CASTELLANI-COULIÉ, J-M. PORTAL Université Aix-Marseille
Coffee-break Embedded Tutorial 1
Ignacio ARRUENGO, Instituto Nacional de Técnica Aeroespacial INTA, Spain
Session 5: Fault-Tolerance in HW/SW
Carlos LISBOA, UFRGS, Brazil
Adaptive Approach to Tolerate Multiple Faulty Links in Network-on-Chip
Anelise KOLOGESKI, Caroline CONCATTO, Luigi CARRO, Fernanda de LIMA KASTENSMIDT Instituto de Informática – Universidade Federal do Rio Grande do Sul (UFRGS), Brazil
Reliability Enhancement via Sleep Transistors
Frank SILL TORRES*, Claas CORNELIUS**, Dirk TIMMERMANN** * Federal University of Minas Gerais, Belo Horizonte, Brazil
** University of Rostock, Germany
(CONT.): 16:45 – 17:05: 17:05 - 17:40: Tutorial: Speaker: 17:40 - 19:00: Chair: Papers:
LATW
12
thIEEE Latin-American Test Workshop
2011
TUESDAY, 29th MARCH
A Fault Tolerant Service Discovery Protocol for Emergency Search and Rescue Missions Janine KNIESS*,**, Orlando LOQUES**, Celio ALBUQUERQUE**
* Santa Catarina State University (UDESC), Joinville, Brazil ** Fluminense Federal University (UFF), Rio de Janeiro, Brazil
Rodrigo POSSAMAI BASTOS, Giorgio DI NATALE, Marie-Lise FLOTTES, Bruno ROUZEYRE LIRMM - Université Montpellier II, Montpellier, France
WEDNESDAY, 30th MARCH
Embedded Tutorial 2
Advanced Test Methods for SRAMs
Alberto Bosio*, Luigi Dilillo*, Patrick Girard, S. Pravossoudovitch, A. Virazel LIRMM - Université Mont
* presenters
Session 6: Fault Injection and Simulation
Raoul VELAZCO, TIMA Laboratory, France Methodology and Platform for Fault Co-Emulation Jorge CORSO*, Francisco RAMIREZ**
* Freescale Semiconductors, Brazil ** Universidade de Sao Paulo, Brazil
Communication Fault Injection for Multi-Protocol Java Applications Testing Cristina MENEGOTTO, Taisy WEBER
Instituto de Informática, Universidade Federal do Rio Grande do Sul (UFRGS), Brazil
(CONT.): 08:15 - 08:50: Tutorial: Speaker: 08:50 - 09:50: Chair: Papers:
LATW
12
thIEEE Latin-American Test Workshop
2011
WEDNESDAY, 30th MARCH
Using an FPGA-Based Fault Injection Technique to Evaluate Software Robustness under SEEs: A Case Study
Marta PORTELA-GARCIA*, Almudena LINDOSO*, Luis ENTRENA*, Mario GARCIA VALDERAS*, Celia LOPEZ-ONGIL*, Bernardo PIANTA**, Letícia BOLZANI POEHLS**, Fabian VARGAS**
* Carlos III University of Madrid, Spain ** Catholic University – PUCRS, Brazil
Coffee-break Embedded Tutorial 3
Software-Based Self-Test of Embedded Microprocessors Paolo Bernardi*, Michelangelo Grosso, Ernesto Sánchez
Dipartimento di Automatica e Informatica, Politecnico di Torino, Italy * presenter
Special Session 5: Design and Test of Reliable Software for Embedded Systems
Cristine GUSMÃO, UFPE, Brazil
Comparing Different Test Structures in a Company Cidinha GOUVEIA
GOTEST Consultoria e Treinamento em Tecnologia LTDA, Brazil An Approach for Clustering Test Data
Alexandre LENZ, Aurora POZO, Silvia VERGILIO Federal University of Parana (UFPR), Brazil
Evaluating Test Reuse of a Software Product Line Strategies
Wesley ASSUNÇÃO, Daniela TRINDADE, Thelma COLANZI, Silvia VERGILIO Federal University of Parana (UFPR), Brazil
Jose Rodrigo AZAMBUJA, Angelo LAPOLLI, Mauricio SCARPATO, Fernanda de LIMA KASTENSMIDT Instituto de Informática – Universidade Federal do Rio Grande do Sul (UFRGS), Brazil
(CONT.): 9:50 - 10:10: 10:10 – 10:45: 10:45 - 12:20: Organizer: Invited Talk: Speaker: Papers:
LATW
12
thIEEE Latin-American Test Workshop
2011
WEDNESDAY, 30th MARCH
Lunch break
Elmar Uwe Kurt MELCHER, UFCG, Brazil
Claudionor N. Coelho Jr.*, Antonio Otavio Fernandes** * VP of Engineering, Jasper Design Automation / UFMG ** Computer Science Department / UFMG
Mikhail CHUPILKO, Alexander KAMKIN
Institute for System Programming of RAS, Moscow, Russia
Samuel PAGLIARINI, Paulo HAACKE, Fernanda de LIMA KASTENSMIDT
Instituto de Informática – Universidade Federal do Rio Grande do Sul (UFRGS), Brazil Formally Verifying an RTOS Scheduling Monitor IP Core in Embedded Systems
Carlos CASTRO MARQUEZ*, Jiang Chau WANG*, Marius STRUM*, Fabian VARGAS** * School of Engineering – University of Sao Paulo, Brazil
** Catholic University – PUCRS, Brazil Djones LETTNIN, WOLFGANG ROSENSTIEL University of Tübingen, Tübingen – Germany
Jorge TONFAT, Gustavo NEUBERGER, Ricardo REIS
Instituto de Informática – Universidade Federal do Rio Grande do Sul (UFRGS), Brazil
Coffee-break (CONT.): 12:20 - 13:50: 13:50 - 16:05: Organizer: Invited Talk: Speakers: Papers: 16:05 - 16:15:
LATW
12
thIEEE Latin-American Test Workshop
2011
WEDNESDAY, 30th MARCH
Session 7: HDL-Based IC Design and Fault Modeling
Mutation Analysis for SystemC Designs at TLM
Valerio GUARNIERI*, Nicola BOMBIERI*, Graziano PRAVADELLI*, Franco FUMMI*, Hanno HANTSON**, Jaan RAIK**, Maksim JENIHHIN**, Raimund UBAR**
* Department of Computer Science - University of Verona, Verona, Italy
** Department of Computer Engineering - Tallinn University of Technology, Tallinn, Estonia
SystemC-AMS High-Level Modeling of Linear Analog Blocks with Power Consumption Information Laurent BOUSQUET, Fabio CENNI, Emmanuel SIMEU
TIMA-Laboratory, Grenoble, France
A cache based algorithm to predict HDL modules faults
Jose Augusto NACIF*,**, Thiago S. F. SILVA*, Luiz Filipe M. VIEIRA*, Alex Borges VIEIRA***, Antônio O. FERNANDES*, Claudionor N. COELHO Jr.*
*Universidade Federal de Minas Gerais, Belo Horizonte, Brazil **Universidade Federal de Viçosa, Florestal, Brazil
***Universidade Federal de Juiz de Fora, Juiz de Fora, Brazil
Closing Remarks (CONT.): 16:15 - 17:25: Chair: Papers: 17:25 - 17:40: