Agilent Technologies
N5990A Test Automation
Software Platform
Notices
© Agilent Technologies, Inc. 2008
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Contents
1. INTRODUCTION
...
8
Test Automation Software Platform ... 8
2. SOFTWARE INSTALLATION AND UPDATE
...
9
Supported Operating Systems ... 9
Software Update ... 9
Software Installation ... 9
3. STARTING AND REGISTERING THE SOFTWARE
...
12
Starting Registered Software ... 12
Software Registration ... 12
4. TEST STATION SELECTION AND CONFIGURATION
...
14
5. CONFIGURING A DEVICE-UNDER-TEST (DUT)
...
18
6. SELECTING, MODIFYING, AND RUNNING TESTS
...
20
System Calibration ... 21
Test Selection ... 21
Changing Test Parameters (Expert Mode Only) ... 21
Running Tests ... 22
7. TEST RESULTS
...
23
Run-Time Data Display and Excel Worksheets/Workbook ... 23
Test Report Document ... 24
8. VIDEO TEST APPLICATIONS
...
25
HDMI ... 25
HEAC ... 36
MHL ... 40
9. MOBILE BUS TEST APPLICATIONS
...
61
MIPI D-PHY ... 61
MIPI M-PHY ... 67
10. COMPUTER BUS TEST APPLICATIONS
...
73
PCI Express ... 73
SATA ... 75
USB ... 78
11. TROUBLESHOOTING AND SUPPORT
...
83
ParBERT User Software ... 83
Log List and File ... 83
APPENDIX...85
1. DATA STRUCTURE AND BACKUP
...
86
Backup ... 87
2. REMOTE INTERFACE
...
88
Introduction ... 88
Interface Description ... 89
Using the Remote Interface ... 90
Results Format ... 92
3. CONTROLLING LOOP PARAMETERS AND LOOPING OVER SELECTED TESTS
...
94
4. MIPI D-PHY SEQUENCE AND DATA FILES
...
97
Introduction ... 97
Data File Format ... 97
Sequence File Format ... 98
Example Sequence ... 100
List of Figures
Figure 1: N5990A Software Setup Wizard example...10
Figure 2: N5990A software installation, selection of software components...11
Figure 3: Software license panel...12
Figure 4: License information panel...13
Figure 5: Test Station selection...14
Figure 6: Test Station configuration, instrument selection...15
Figure 7: Instrument Configuration Wizard...16
Figure 8: Main menu, prior to DUT configuration...18
Figure 9: Configure DUT panel...19
Figure 10: Test procedure selection tree, example application SATA...20
Figure 11: Test parameter selections, example PCI Express...22
Figure 12: Pop-up dialogue, example USB 3.0 calibration connection diagram...22
Figure 13: Test result MS Excel worksheet...23
Figure 14: Selecting test result worksheets...24
Figure 15: Test Report example...24
Figure 16: HDMI test station instrument configuration example...25
Figure 17: Oscilloscope Probe Setup dialog...27
Figure 18: Oscilloscope probe calibration panel...28
Figure 19: HDMI connection example...29
Figure 20: HDMI 3.4G test station configuration...31
Figure 21: HDMI 7G test setup...32
Figure 22: Example setup (Test 5-3) using TTCs...33
Figure 23: HDMI Sink test example...34
Figure 24: HDMI user dialog box...34
Figure 25: HDMI tests with Agilent N5998A and Quantum Data 882EA...35
Figure 26: HEAC test station instrument configuration example...36
Figure 27: HEAC Product (DUT) Configuration...37
Figure 28: HEAC test example...38
Figure 29: HEAC connection diagram example...39
Figure 30: MHL test station system configuration example...40
Figure 31: MHL test station instrument configuration example...41
Figure 32: MHL Product (DUT) Configuration...42
Figure 33: MHL calibration and test procedure example for ParBERT system...43
Figure 34: MHL connection diagram example for ParBERT system...44
Figure 35: MHL connection diagram example for AWG system...45
Figure 36: DisplayPort test station instrument configuration example...46
Figure 37: DisplayPort DUT configuration...48
Figure 38: DisplayPort setup for E4887A-007 (system calibration)...50
Figure 39: DisplayPort setup for E4887A-037 (system calibration)...52
Figure 40: J-BERT DisplayPort setup (system calibration)...54
Figure 41: Oscilloscope display during calibration...55
Figure 42: Calibration results...56
Figure 43: RJ measurement with EZJit+ ...56
Figure 44: SJ measurement...57
Figure 45: Connection diagram for data skew calibration...57
Figure 46: DisplayPort receiver test setup...58
Figure 47: Error counter dialog box...60
Figure 48: MIPI D-PHY physical layer test station instrument configuration example...61
Figure 49: MIPI D-PHY DUT configuration panel...62
Figure 50: MIPI D-PHY DUT configuration panel...65
Figure 51: MIPI D-PHY DUT connection diagram...66
Figure 53: MIPI M-PHY DUT configuration panel...68
Figure 54: MIPI M-PHY calibration procedure example...71
Figure 55: MIPI M-PHY DUT connection diagram...72
Figure 56: PCI Express Station Configuration...73
Figure 57: PCI Express DUT Configuration...74
Figure 58: PCI Express multi-lane test results...74
Figure 59: SATA test station configuration...75
Figure 60: SATA DUT configuration...76
Figure 61: SATA Frame Error property selection...77
Figure 62: USB test station configuration...78
Figure 63: USB 2.0 DUT configuration...79
Figure 64: USB 3.0 DUT configuration...80
Figure 65: USB 3.0 receiver test link training parameters...81
Figure 66: USB 3.0 transmitter test link training parameters...81
Figure 67: USB test automation main menu...82
Figure 68: N5990A Log List (lower half) and File (front)...83
Figure 69: Members of the ValiFrame Remote Class...89
Figure 70: Example of a station configuration file...91
Figure 71: Result String Format...93
Figure 72: Temperature and voltage sweeps using the N5990A sequencer ...94
1. Introduction
Test Automation Software Platform
The N5990A Test Automation Software Platfom “ValiFrame” is an open and flexible framework for automating tests such as electrical compliance tests for digital buses. N5990A supports a wide range of buses, e.g. PCI Express, USB, HDMI and MIPI.
The product runs on a standard PC that controls a wide range of test hardware. Typically, the hardware comprises instruments for stimulus and response tests such as pattern generators, bit errror ratio testers (BERTs), and oscilloscopes. Key elements of the software platform are a test sequencer, receiver test libraries, and interfaces to oscilloscope applications for transmitter tests. Additional options are available, e.g. User Programming.
N5990A is impemented in C# within the Microsoft .NET Framework. The software platform is specified in the data sheet 5989-5483EN, incl. the PC requirements. Application examples for PCI Express® and HDMI are given in the application notes 5500EN and 5989-4959EN.
2. Software Installation and Update
The Test Automation Software Platform N5990A runs on a standard PC which controls the test instruments. The PC system requirements are given in the N5990A data sheet. If N5990A is already installed on the PC and it is not to be updated, proceed to the next chapter.
Supported Operating Systems
N5990A supports the following PC Operating Systems (OS)
• Windows® XP
• Windows® 7 (32 and 64 bit)
Software Update
If you want to upgrade to a new version of the Test Automation Software Platform but wish to keep your software settings, first see Appendix 1, Data Structure and Backup. Then please uninstall your present version of the Test Automation Software Platform from the PC and continue with the software installation.
Software Installation
The following software has to be installed — in this particular order — before installing the N5990A Test Automation Software Platform:
1 Windows® XP OS only: Microsoft Windows XP SP3 or higher
2 Microsoft Office 2003 or higher
3 Agilent IO Libraries Suite 16.1 or higher (IO_Libs_Suite folder)1)
4 Microsoft .NET Framework redistributable 2.0 (dotnetfx20.exe)2)
5 For applications supported by the Agilent 81250A ParBERT only:
ParBERT 81250 User Software 6.32 or higher. The ParBERT 81250 User Software (E4875A) can be installed at any time, following the instructions for that software.
1),2) A version of these software packages is included on the N5990A
CD. It is however recommended to check the Agilent web pages (www.agilent.com) for the latest version of the IO Libraries Suite.
Then execute the ValiFrame installer file and follow the instructions of the N5990A Setup Wizard, see Figure 1 and 2 as examples.
Figure 2: N5990A software installation, selection of software components
Currently, N5990A supports the following applications § HDMI § HEAC § MHL § DisplayPort § MIPI D-PHY § MIPI M-PHY § PCI Express™ § USB § SATA
N5990A primarily provides physical layer test automation. For HDMI and HEAC, protocol tests are available, too. For automated protocol tests of other standards, contact Agilent.
3. Starting and Registering the Software
Starting Registered Software
Double click on the ValiFrame icon on the desktop or start the Test Automation Software from the Start > Programs > BitifEye menu. If you have already registered your software, it will start
automatically. Proceed to the next chapter.
Software Registration
If you start the software without a valid license key, the following panel (Figure 3) will open. Follow the instructions to request the permanent license.
To obtain a valid license key, send an e-mail to
licensing@bitifeye.com with the following information:
• Customer name (such as company and department or university
and institute)
• 16 digit certificate number (XXXX-XXXX-XXXX-XXXX, supplied
with your N5990A CD)
• Site Code and MID from the startup license dialog or the Hardware Information from the Help > About > License Information dialog.
Your activation code will be provided within three (3) working days of the mail being received at the address indicated above.
To install the license(s) copy the received license file (*.vlf) to the controller PC. Start the ValiFrame License Installer (Start > All Programs > BitifEye> <Application>) and select the license file. Once ValiFrame is running you can review the license information by selecting Help > About from the menu. Click on “License
Information” to show the installed licenses (Figure 4).
4. Test Station Selection and Configuration
The set of test instruments used for a specific application is referred to in the following as "Test Station" or short "Station". The test station is controlled by a suitable PC and the N5990A Test Automation Software Platform.
Before starting the Test Automation Software Platform N5990A “ValiFrame”, first run the ValiFrame Station Configuration (Start > All Programs > BitifEye> <Application>).
The available Test Stations are listed in a selection box (see Figure 5 as an example). Multiple entries can e.g. be generated by User Programming (N5990A opt. 500). Select the station you want to use. N5990A opt. 001 is the interface to SQL databases (and
webbrowsers). In case this option was purchased, the connection to the database application server is established by unchecking the default "Database Offline" selection and entering the IP address of the server.
Proceed with Next or quit with Cancel.
Depending on the application, in the 2nd step test station building
blocks - either individual instruments or instrument combinations – may have to be selected, see Figure 6 for an expample.
Note
The user must ensure that all instruments selected for the test station are connected to the test station PC controller by remote control interfaces such as GPIB, LAN, USB or VXI.
After the instrument selection, all instruments connected to the test station PC controller are listed in the "Instrument Configuration Wizard" (Figure 7).
Note
When starting a specific test station configuration for the first time, all instruments are set to the “Offline” mode! In this mode the test automation software does not connect to any instrument.
This mode can e.g. be used for demonstrations or checks.
In order to control instruments for use with the test station, instrument connections need to be established by using specific hardware addresses as desribed below. Also, the "Mode" check box needs to be checked. The connection status of the specific instrument then will change from "Offline" to "Online".
It is recommended that you use the Agilent IO VISA Connection Expert to setup new connections or verify existing connections. Start the Connection Expert by right-clicking on the VISA icon in the task bar and selecting “Agilent Connection Expert”. Under “Instrument IO on this PC”, select “Refresh All”. For each instrument that you want to use, verify that an entry exists in the list in this column and that the icon for the instrument is green. You can verify the connection to instruments by using the Agilent Visa Assistant, which is available in the same menu.
Once all instruments to be used are listed properly, it is
recommended that you use this Connection Expert list to enter the instrument address strings in the “Test Station Configuration” window by copying and pasting instrument addresses as follows. Click on the “+” sign next to an instrument in the Connection Expert and its address will appear on a line below the instrument. Double click on this address and it will appear in a box to the right. Right click on this address and select “Copy”. Then highlight the same instrument in the Test Station Connection window, paste the Instrument Address and click “Apply Address”. Repeat this process for all instruments being used, except the ParBERT and standard specific applications running on the oscilloscope.
ParBERT is controlled with a connection to a firmware server that runs on a host PC. This connection is not set up via VISA. Instead, ParBERT uses a TCP/IP socket connection. In the Test Station
Configuration window, the ParBERT address field contains either the IP address of the host or the hostname. This is followed by a colon and the system name, such as “localhost:DSRA”. If you are running the N5990A Test Automation Software Platform and ParBERT from the same PC, the default addresses that were automatically loaded during the N5990A software installation will be correct. If a separate PC is used to run the ParBERT firmware server software, you need to change “localhost” to the IP address or name of that PC.
The applications running on the oscilloscope use a different technology to provide remote access to ValiFrame,called .NET Remoting. Communication is only possible using the LAN connection of the oscilloscope and for this reason you have to specify the IP address for these instrument types.
Once you have entered the correct addresses for all of the instruments that may be used, select the instruments that will be used by the Test Automation Software by checking the tick box next to “Offline” in the “Mode” column. Use the “Check Connections” button to test whether you entered valid instrument addresses. Once you click the “Configure” button, the changes you made will be implemented and the Test Station Configuration window will be closed.
5. Configuring a Device-Under-Test (DUT)
Start the software as explained in Chapter 3..
N5990A will connect automatically to all instruments that are not set to Offline mode in the Test Station Configuration program. It is ready for use once all connections have been initialized successfully.
The main menu will appear as shown in Figure 8 for USB 3.0 examplarily.
Figure 8: Main menu, prior to DUT configuration
The next step is to configure the device-under-test (DUT) by clicking on the “Configure DUT” button in the tool bar (leftmost button) or by selecting “Configure DUT” from the File menu. The “Configure DUT” panel will appear (Figure 9).
Select all parameters to configure the DUT, e.g. the DUT type such as “Device” or “Host” as shown above. Enter all information which is relevant for the DUT and the tests which you want to run in the text fields. The selected DUT parameters and the information entered by the user will be shown in the measurement reports. It is also stored with the measurement data in case a connection to a SQL database exists. As this information will be used to retrieve data from the database, select unique identifiers and descriptions.
Note
In most applications you also have to select either Compliance or Expert Mode. In Compliance Mode the tests are run according to the specific test specification, such as e.g. HDMI 1.4b or PCI Express 3.0. In Expert Mode the DUT can be characterized to determine performance margins, for example. This mode is provided for advanced users. It may include additional tests. Also the tests might be implemented differently than in Compliance Mode.
6. Selecting, Modifying, and Running Tests
After the DUT has been configured, the procedure tree shown in Figure 10 (left window area) will appear. It contains the list of calibration and test procedures, typcially in the following groups:
• Calibration
• Receiver (HDMI: sink) tests
• Transmitter (HDMI: source) tests
Figure 10: Test procedure selection tree, example application SATA
Use the (Test Parameter) Properties and Log List buttons at the right side of the main menu to display additional information on the right side and bottom of the ValiFrame main window as shown in the Figure above.
System Calibration
It is necessary to calibrate the test system before you run the first test, in order to ensure that test results are consistent from run to run. Provided the equipment has achieved thermal stability before the calibration is started (typically after 30 min of warm-up), the thermal environment is stable, and no system elements have been exchanged, the calibration is very stable and may only have to be repeated once a week or even less frequently. The calibration interval depends on the degree of accuracy desired. If the station is not calibrated prior to a DUT test, the results of the previous calibration will be used for the current tests.
Test Selection
The receiver and transmitter test procedure groups shown above can be selected globally by clicking on the check box at the top of the group. Alternatively you can select individual test procedures by checking the specific selection boxes in front of the tests. Only the test procedures which are selected will be executed.
Changing Test Parameters (Expert Mode Only)
In Expert Mode the test parameters can be modified. First, select a specific calibration or test prodcedure in the ValiFrame procedure tree. If the test parameters are not displayed on the right side of the ValiFrame main window, press the Properties button as mentioned before. Typical test parameters which can be modified are e.g. the start and stop frequencies or step width.By varying such parameters systematically, the DUT can e.g. be characterized or its performance margins can be determined. The user-accessible parameters are displayed in a property list on the right side of the screen. Depending on the user selection on the left side of the top of the list, the list is either ordered alphabetically or in categories. The test parameters available can be changed individually (Figure 11). The test
parameters selected are listed in the MS Excel test results worksheets, see Figure 13.
Figure 11: Test parameter selections, example PCI Express
Running Tests
To run the selected tests, press the start button. The tests are run in the order shown in the test procedure selection tree. Some tests may require user interaction, such as changing cable connections or entering DUT parameters. The required action is prompted in pop-up dialogue boxes prior to the test execution, as shown in Figure 12.
7. Test Results
Run-Time Data Display and Excel Worksheets/Workbook
Most tests generate data output. While the program is running the data is displayed in a temporary MS Excel worksheet, which opens automatically for each individual test. An example is given in Figure 13. See the Appendix 1. for details about the file directories.
Figure 13: Test result MS Excel worksheet
The Excel worksheet is closed once the specific test is finished. As long as the Test Automation Software is running, each worksheet can be reopened. However, the individual worksheets will be lost when ValiFrame is closed, unless individual worksheets or a collection of them were saved by the user.
For user convenience, all individual worksheets are combined in a summary Excel workbook at the end of the test run. The workbook must be saved explicitly (File > Save Results as Workbook...), otherwise it will be lost!
Note
Once a test result worksheet has been closed, it can be opened by double clicking on the procedure name. The worksheet will reopen and can be saved from Excel directly. If a test or calibration procedure was run more than once, the list of results is visible below the particular procedure after expanding the tree below this procedure (see Figure 14).
Figure 14: Selecting test result worksheets
Tests which ran successfully are indicated by a green smiley icon. Tests which failed are indicated by a red face.
Test Report Document
After all tests have been run, a test report document can be
generated additionally for easy documentation and printing with the standard Print function of the File menu. In Figure 15, part of a test report is shown as an example.
8. Video Test Applications
HDMI
Supported Hardware Configurations
For HDMI ValiFrame N5990A supports the all configurations of the Aglent HDMI TMDS Signal Generator E4887A. For details, see the E4887A data sheet.
Configuring a HDMI Station
Start the HDMI Station Configuration as given in Chapter 4. The application specific Station Configuration then will be executed with its distinct panels, such as the Instrument Configuration panel example shown in Figure 16.
Figure 16: HDMI test station instrument configuration example
In the following, the configuration and setup of a HDMI test station which is based on an Agilent E4887A-007 TMDS Signal Generator (with a ParBERT 7 Gb/s system) is described as an example.
The first two entries are Signal Generators. The first signal generator provides the external input for the pixel clock generated in the ParBERT system. The second generator provides the external input for the independently clocked HDMI data lanes.
This unique architecture allows to generate, true, independent clock and data jitter by adding distinct jitter to the Signal Generator output signals. The jitter mix is generated by selecting jitter sources which are built into the Signal Generators.
The next instrument is a real-time oscilloscope. For HDMI, N5990A supports the Agilent DSO/DSA80000 and DSO/DSA90000 series. The next entry is for the HDMI Application (N5399) running on the oscilloscope. The HDMI oscilloscope application is shown as a separate instrument because it requires a separate data connection via LAN. The host name (or IP address) is hence the same as in the VISA connection string to the oscilloscope.
Two ParBERT entries are next. The first system is the HDMI pixel clock subsystem. It consists of a ParBERT clock group with a high-speed clock and a single 7 Gb/s generator. The second system is the HDMI data subsystem. It is a clock group, which comprises a high-speed clock and four 7 Gb/s generators. The addresses are
“localhost:DSRA” and “localhost:DSRB” if the ParBERT firmware is running on the same PC. Otherwise “localhost” has to be replaced by the IP address or the host name of the PC on which the ParBERT firmware is running.
The last instrument is a power supply. Currently, the Agilent E363x and E364x power supplies are supported.
Note
When selecting a power supply, the power supply type is selected in a second step.
Next start the N5990A Test Automation and configure the DUT by following the instructions given in chapter 5..
N5990A provides automated HDMI system calibration, compliance tests, and characterization. HDMI system calibration is required for sink and source tests with an ocilloscope or TMDS (transition-minimized differential signaling) Signal Generator. For HDMI protocol tests, no system calibration is required.
System Calibration
Oscilloscope Calibration
Before you can start to use the setup, you have to make sure that the oscilloscope is calibrated. This section describes the required steps to calibrate all important parts of the oscilloscope.
Probe Head Calibration: Start by connecting all the probes and probe heads to the individual channels of the oscilloscope. Once you have connected them, you should not change the channel they are
connected to, because the oscilloscope saves the calibration data for the channels, not the individual probes. To calibrate the probe go to the channel setup by clicking on one of the channel numbers on the upper part of the oscilloscope user interface (UI). Click on the probe button to open the probe setup dialog (Figure 17).
Figure 17: Oscilloscope Probe Setup dialog
First make sure that the correct probe head is selected (N5380A SMA). Do all these steps for all channels where you have connected probes. The next steps are the attenuation and skew calibration of the probes. Click on the Calibrate Probe button and open the Probe Calibration dialog (Figure 18).
Click on the Start Attn/Offset Calibration or Start Skew Calibration to start the calibrations. During the calibrations you need to have a shorting cap on the DC connector of the SMA probe head and the positive connector connected to the AUX Out BNC port on the front panel of the scope. You will need a SMA-to-BNC connector for this. Once you have established the connection you can run the calibration (see Figure 16). The oscilloscope software will indicate any wrong connections.
The next calibration is the DC offset calibration of the SMA probe heads. First you will need to start the HDMI application on the oscilloscope, and there you will find a button “probe offset
calibration”. Click on this button and follow the instructions in the Wizard. There should be nothing connected to the probe head except the 3.3V DC signal to the DC connector of the SMA probe head.
TMDS Signal Generator Calibration
Skip this step if only source tests are to be conducted.
For the calibration of the HDMI TMDS signal generator, a calibrated
oscilloscope (see Section A, above) is needed. Figure 19 Shows the necessary connections.
Figure 19: HDMI connection example
The HDMI pixel clock runs at a 10th of the data rate. This is achieved by generating a 1111100000 pattern with the generator of the
ParBERT pixel clock subsystem (leftmost generator). The second clock group comprises four generators. Three of them are used to generate the D0, D1, and D2 data. The 4th generator is used for the receiver skew test.
The signal generators provide the external clock for the two ParBERT subsystems, including jitter injection by I/Q (quadrature amplitude ) modulation. The clock output of each signal generator has to be connected to the clock input of the ParBERT clock module within one subsystem. To synchronize the signal generator frequencies, the 10 MHz reference output of one generator has to be connected to the 10 MHz reference input of the other with a BNC cable. To ensure the phase stability of the injected jitter across the clock and the data path, the Event 1 output of the signal generator connected to the pixel clock subsystem has to be connected to the Pattern Trigger input of the signal generator connected to the data subsystem.
At the output connectors of the ParBERT 7 Gb/s generators, Bias Tees, available as accessory kits from BitifEye Digital Test Solutions (www.bitifeye.com), need to be connected. The Bias Tees provide a voltage offset needed to achieve the HDMI 3.3 V high-level voltage. Matched-pair SMA cables have to be used for the normal and complement output lanes and connected to the Bias Tees.
For the jitter calibration the oscilloscope is needed. The TPA-P (test point adapter with plug) is connected to the ParBERT as described above. Then a fixture with a receptacle (TPA-R) is connected to the TPA-P, see Figure 19. The SMA outputs of the TPA-R are connected to differential probes. The probes have to be terminated with 3.3 V.
TMDS Signal Generator Setup
For the hardware configuration details, see the E4887A data sheet. For the proper hardware setup, follow the instructions of the “TMDS Signal Generator Setup Guide”.
The 7G setup consists of the ParBERT mainframe, two signal generators (ESG E4438C), two power supplies, and an oscilloscope, as shown in Figure 17.
1. Connect the upper ESG to the ParBERT Clk Input port of the left ParBERT clock group.
2. Connect the lower ESG to the ParBERT Clk Input port of the right ParBERT clock group.
3. Connect the 10 MHz Output port of the upper ESG to the 10 MHz Input port of the lower ESG.
4. Connect the Event1 port of the upper ESG to the Patt Trig In port of the lower ESG.
5. Connect the LAN or GPIB (general purpose interface bus) cables to the controller PC and the two ESGs.
6. Connect the Trig Out port of the right clock group to the Start In port of the left clock group.
7. Connect the FireWire cable between the PC and the ParBERT. 8. Connect the 9 BiasTees to the Out normal and complement ports
of the ParBERT generator modules. The complement Out port of the rightmost generator will remain empty.
9. Connect the DC connection of the Bias Tees to the programmable power supplies.
10. Connect SMA cables to the Bias Tees and on the other side to the HDMI fixture.
11. The order of the generator ports from left to right is Clk, Data0, Data1, Data2, Skew.
The 3G setup consists of the ParBERT mainframe, two function generators, one power supply, and the oscilloscope. The connections for this setup should be made as follows.
Figure 20: HDMI 3.4G test station configuration
1. Connect the FireWire cable between the PC and the ParBERT. 2. Connect the GPIB-to-USB converter to your PC and the GPIB
cables to the two function generators.
3. Connect SMA cables to the ParBERT outputs and on the other side to the HDMI fixture.
4. The order of the generator ports can be seen in Figure 20. The generator unused in this particular setup (top right) is the skew module.
Deskewing the ParBERT System
Matched SMA cable pairs are required for the ParBERT normal and complement output lanes to connect the data channels to the DUT as the ParBERT cannot compensate skew between its normal and complement outputs.
Before starting a measurement, the complete system must be deskewed. This process is integrated in the calibration procedures. Follow the instructions of the deskew procedure and deskew the three data channels.
Running Tests with a HDMI TMDS Signal Generator
An HDMI TMDS Signal Generator is used to run the electrical high-speed sink tests. It is also used for some of the HDMI protocol tests. For details, refer to the N5990A data sheet.
Some tests require specific instrument connections. For these tests, the Test Automation Software will display the necessary connections graphically before the tests are run; see Figure 21 for an example.
For a measurement of the DUT, the TPA-P connected to the ParBERT as described above is directly connected to the DUT.
The connection between the Trigger Output of the ParBERT data subsystem and the Start Input of the ParBERT pixel clock subsystem is important for tests that require bit synchronization. This
connection sets the bit shift between the clock and data subsystem. If bit synchronization is needed, the Test Automation Software
Platform sets the pixel clock group into started mode, then starts the data subsystem, which in turn provides a pattern trigger to start the clock subsystem. The clock subsystem will shift to halted mode until the next trigger is sent.
For the HDMI tests 5-3 and 8-7, Transition Time Converters (TTCs) are needed to meet the transition time requirements of the HDMI specification of 75 ps up to 0.4 UI (unit interval). The TTCs are used at the end of the SMA cables to reduce the lever to the ParBERT output connectors, as shown in Figure 22. Finally, the TTCs have to be connected either directly to a TPA-P or first to an ISI (intersymbol interference ) cable emulator and then to the TPA-P. The necessary TTCs are available from BitifEye, too.
The HDMI tests are run as described earlier in this guide, see Figure 23 as an example.
The HDMI pixel error detection cannot be fully automated. It requires a user who visually detects pixel errors and communicates this to the software via pop-up dialogs, as shown in Figure 24.
Figure 24: HDMI user dialog box
ValiFrame changes parameters such as jitter frequencies and
amplitudes systematically and asks the user whether pixel errors are detected.
Running Tests with an Agilent N5998A and Quantum Data 882EA
These instruments are used to run HDMI protocol tests as well as EDID, CEC and HDCP tests (Quantum Data 882EA). For details, refer to the N5990A data sheet. N5990A currently supports HDMI sink protocol tests.
Note that running these tests requires an additional N5990A option (350), see the data sheet. If this option is available, use the HDMI test station and DUT configurations explained above to prepare for these tests too.
HEAC
HDMI Ethernet Channel (HEC) and Audio Return Channel (ARC) tests are referred to as "HEAC" in the following. HEAC testing is not included in the ValiFrame HDMI test option. HEAC testing (N5990A-351) must be ordered separately.
Supported Hardware Configurations
For HEAC ValiFrame N5990A supports hardware configurations based on the Aglent 81150A Pulse Arbitrary Waveform Generators.
Configuring a HEAC Station
Follow the instructions given in Chapters 4. A test station instrument configuration panel example is given in Figure 26.
Figure 26: HEAC test station instrument configuration example
Configuring a HEAC DUT/Product
The HEAC DUT configuration panel is shown in Figure 27. The user needs to select the DUT type, e.g. "Sink" or "Source". Other selections e.g. comprise the DUT's IP address.
Users can enter descriptions and comments along with their names. Time stamps are shown.
As for all other applications, the user selects between “Compliance Mode” and “Expert Mode” in this panel, too. The latter is for user-defined characterization, margin tests, and debugging.
Running Calibrations and Tests
Select, configure (in Expert Mode), and run the MHL tests as for any other application:
Once calibration or test procedures are started in Compliance or Expert Mode, connection diagrams such as the one depicted in Figure 29 may be displayed. The user must ensure that all required
connections are established. The test automation will proceed only after confirmation by the user.
MHL
Supported Hardware Configurations
ValiFrame N5990A supports automated MHL compliance tests and characterization with the following hardware configurations:
• Agilent 7 Gbps HDMI TMDS signal generator (E4887A-007)
with a ParBERT 7Gbps system.
• Agilent MHL M8190A Arbitrary Waveform Generator system.
Configuring a MHL Station
Follow the instructions given in Chapters 4. Configuring a MHL Station is different at step 2 of the station configuration, depending on which signal generator is selected. Select the system
configuration:
• “ParBERT System” when using a ParBERT 7 Gbps system
• “AWG System” when using a M8190A Arbitrary Waveform
Generator system. In this case, select whether external amplifiers and attenuators are used (check box). The effective amplification needs to be calculated from the amplification and attenuation applied. The value of the effective amplification needs to be selected from the drop-down list. 5 dB is the minimum amplification required. A test station configuration example is given in Figure 30, an
instrument configuration panel example for a E4887A system is given in Figure 31.
Figure 31: MHL test station instrument configuration example
Configuring a MHL DUT/Product
The MHL DUT configuration panel is shown in Figure 32. The user needs to select the DUT type, e.g. "Sink" or "Dongle". Other selections comprise the "Video Modes" and "Color Spaces".
Users can enter descriptions and comments along with their names. Time stamps are shown. Choosing “Keep Signals After Test” will keep the output signals of the receiver test system as they were when the last test was finished.
As for all other applications, the user selects between “Compliance Mode” and “Expert Mode” in this panel, too. The latter is for user-defined characterization, margin tests, and debugging.
Running Calibrations and Tests
Select, configure (in Expert Mode), and run the MHL tests as for any other application: Once calibration or test procedures are started in Compliance or Expert Mode, connection diagrams such as the one depicted in Figure 34 for the ParBERT system or Figure 35 (AWG System) may be displayed. The user must ensure that all required connections are established. The test automation will proceed only after confirmation by the user.
Figure 34: MHL connection diagram example for ParBERT system
1169A MHL+ MHL-N5380A Common-Mode E2678 Blocking Caps Bias-Tees Dummy Load VIDC PPD MHL-TPA-R-WOSI PPD VTerm MHL-TPA-AT 300ps/150ps TTCs Combiners 900ps TTCs MHL-TPA-P-WOSI
Figure 36: DisplayPort test station instrument configuration example
DisplayPort
DisplayPort Stressed Signal Generator Configurations
ValiFrame N5990A supports automated DisplayPort compliance tests and characterization with the following hardware configurations:
• E4887A-007 7 Gb/s HDMI TMDS Signal Generator with 81150A
• E4887A-037 3.4 / 7 Gb/s HDMI TMDS Signal Generator with 81150A (DisplayPort 1.1 only)
• J-BERT N4903A or B
For the proper hardware setup, follow the instructions given by the N5990A software.
Configuring a DisplayPort Station
Follow the instructions given in Chapters 4. A test station instrument configuration panel example is given in Figure 36.
In the following, the configuration and setup of a DisplayPort test station based on E4887A-007 (with a ParBERT 7 Gb/s system) is described.
The first instrument shown in the window above is a signal generator. It provides the external input for the clock input of the E4887A ParBERT system.
The next instrument is a real-time oscilloscope. For DisplayPort, N5990A currently supports the Agilent DSO80000 and 90000 series.
The next entry is for the DisplayPort Application (U7232) running on the oscilloscope. The DisplayPort oscilloscope application is shown as a separate instrument, because it requires a separate data
connection via LAN. The host name (or IP address) is hence the same as in the VISA connection string to the oscilloscope. A connection via USB or GPIB is not possible.
Two ParBERT entries are next. The first system is the DisplayPort data subsystem. It consists of a ParBERT clock group with a high-speed clock and a single 7 Gb/s generator. The second system is the DisplayPort clock subsystem. It is a clock group, which comprises a high-speed clock and at least one 7 Gb/s generator. The addresses are “localhost:DSRA” and “localhost:DSRB” if the ParBERT firmware is running on the same PC. Otherwise, the localhost entry has to be replaced by the IP address or the host name of the PC on which the ParBERT firmware is running.
The Pulse Function Arbitrary Generator (81150A) is used to generate noise (random jitter) and sinusoidal jitter with a frequency higher than 25 MHz.
The last instrument, the Aux Channel Controller – available as Agilent W2642A DisplayPort Test Controller (DPTC) - is necessary to access the DisplayPort Auxiliary Channel. It reads the error counter and sets the device into the proper test modes. The IP address of this instrument needs to be entered.
The E4887A-037-based configuration shows the same instruments. The J-BERT-based setup shows fewer instruments: you will see only the DSO, the U7232 DisplayPort application, the Aux Controller, and the J-BERT.
In addition to the test instruments, suitable test point adapters (TPAs, also known as test fixtures) are required. For DisplayPort source and sink testing, an Agilent W2641A or B plug test fixure (TPA-P) is needed. For sink testing, a receptacle test fixture (TPA-R) is required additionally, for the calibration of the receiver test system. A receptacle test fixture is available from BitifEye Digital Test Solutions GmbH (www.bitifeye.com).
Configuring a DUT/Product
After the Test Automation Software is started, the DUT needs to be configured (see Chapter 5). For DisplayPort, the following selections are available (see Figure 37):
User-selectable parameters:
• Type of device (sink, source, cable).
• Spec. Version – the spec version you want to test against.
• Expert Mode / Compliance Mode – In Compliance Mode, only the
pure compliance tests as defined in the Compliance Test
Specification are available. Test parameters cannot be modified. Expert Mode provides additional test procedures such as a constant parameter stress test. It also allows experienced users to change test parameters for in-depth margin testing,
characterization, or trouble shooting. Figure 37: DisplayPort DUT configuration
For the sink tests additional selections are available in the lower part of the panel:
• Use Reverse PRBS7 pattern – check this option to gnerate a reverse PRBS7 pattern. This pattern was used in some early DisplayPort silicon implementations.
• Use dummy AUX Channel Controller – check this box if no AUX
channel controller (DPTC) is available. Instead, vendor-specific tools then need to be used to enable test modes, read out the error register, etc.
• Error Counter doesn’t support reset on read – the DisplayPort specification requires that the error counter is reset upon every read request, however some chips do not support this feature. Check this box in this case.
• Tethered Cable Device – Check this option if you are testing a so-called tethered cable device. This is a device with a permanently joined cable. The cable hence cannot be removed from the device and will be part of the test setup.In order to compensate the influence of the cable, different ISI jitter traces are used and the output signal amplitude of the adjacent lanes is higher.
• Power Dividers used for adjacent lanes (ParBERT only) – Activate if you want to use a setup with only two ParBERT generators
• Skip Link Training – This allows you to skip the link training and start with the error counter test phase immediately. This is useful for internal devices that do not require link training.
• The Sink Capabilities group box allows you to further specify the tested sink device. You can decide if HBR (high bit rate) is supported and for spec. version 1.0 you can disable SSC (spread spectrum clock) support.
System Calibration
Before you can start using the DisplayPort test system for sink and source tests, the oscilloscope needs to be calibrated.
Oscilloscope Calibration
For the oscilloscope calibration, see the HDMI section above and follow the instructions given there.
Stressed Signal Generator Calibration
Skip this section if only DisplayPort transmitter/source tests are to be conducted.
For DisplayPort receiver/sink tests, the Stressed Signal Generator must be calibrated. For that calibration, a calibrated oscilloscope is required (see just above).
Instrument Setup
E4887A
This section lists the connections required for the E4887A ParBERT 7G and 7G/3.4G configurations in conjunction with the 81150A jitter source. The setup consists of the ParBERT mainframe, a signal generator (ESG), and an 81150A jitter source. The required connections are shown in Figure 38 and listed below:
1. Connect the ESG to the ParBERT Clk Input port of the left ParBERT clock group.
2. Connect the 81150A source to the ParBERT Delay Control Input of the
left ParBERT clock group.
3. Connect the LAN cables to the controller PC, the ESG, the 81150A source, and the oscilloscope.
4. Connect the FireWire cable between the PC and the ParBERT.
5. Connect the Blocking Capacitors and TTCs to the normal and
complement output ports of the ParBERT generator modules.
6. Connect the cables and test fixtures.
The setup for the E4887A-037 configuration is slightly different, as can be seen in Figure 39.
J-BERT
In addition to a J-BERT, an oscilloscope is required (see Figure 40). 1. Connect the LAN cables from the controller PC to the J-BERT and
oscilloscope.
2. Connect the Clk Out of the J-BERT to channel 4 of the oscilloscope.
3. Connect the J-BERT Data Out with blocking capacitors and TTCs to the test fixtures.
4. For the adjacent lanes connect blocking capacitors, attenuators, TTCs, and power dividers to the Trigger Out and the fixtures.
Figure 40: J-BERT DisplayPort setup (system calibration)
Aux Data Data Trigger / Ref Clk Clk Blocking Capacitor DSO + -DisplayPort Fixture T3/R 0 T2/R 1 T1/R 2 T0/R 3 Power Divider Power Divider T 3+/R 0-T0-/R 3+ T 0+/R 3-T2-/R 1+ T 3-/R 0+ T 2+/R 1-50Ω Termination 150ps TTCs 150ps TTCs 150ps TTCs 50Ω Termination
Deskewing the ParBERT system
As part of the calibration of the TMDS signal generator, the ParBERT system must be deskewed. This process is part of the calibration procedures. Follow the instructions for the deskewing procedure above and deskew the data channels used.
For the deskewing procedure, matched SMA cable pairs are required for the connections to the ParBERT normal and complement output ports.
Running Calibrations
The DisplayPort tests are run exactly as described earlier in this guide. The DisplayPort station includes the following calibrations. Swing Calibration High Bit Rate / Reduced Bit Rate (HBR/RBR) Connect the outputs of the ParBERT clock generator or J-BERT through the appropriate ISI generator via two DisplayPort fixtures to Channel 1 of the oscilloscope. Terminate the probe head of the oscilloscope with a short circuit. Connect a clean clock signal of the first generator module of the ParBERT or J-BERT data generator to Channel 4 of the oscilloscope.
This calibration measures the eye height at a level of 50% of the eye (see Figure 41).
Figure 41: Oscilloscope display during calibration
The calibration starts with a high voltage level, measures the height, and decreases the voltage level to calibrate the complete range (Figure 42).
Figure 42: Calibration results
Random Jitter Calibration HBR/RBR
The connections are the same as described in the previous calibration except that the ISI generator is removed.
The random jitter (RJ) calibration is measured using EZJit+ (Figure 43). It starts with 0 mUI amplitude and increases it to calibrate a complete range.
Figure 43: RJ measurement with EZJit+
High-Speed Sinusoidal Jitter Calibration
The connections are the same as described in the previous calibration.
Sinusoidal jitter (SJ) is measured with EZJit+, too (Figure 44). N5990A calibrates the sinusoidal jitter through the Delay Control Input over a range of different amplitudes. This calibration is only needed for ParBERT.
Figure 44: SJ measurement
Data Skew Calibration (Expert Mode) (ParBERT Only) For this calibration no oscilloscope is needed. After an
autocalibration, connect the lane indicated by the software with the Delay Control Input (Figure 45).
Figure 45: Connection diagram for data skew calibration
First, the auto calibration is done internally. Afterwards, the single modules are calibrated with their cables to avoid a skew caused by them during the testing phase.
Total Jitter Calibration RBR/HBR
This calibration calibrates the base jitter of the setup to determine the required SJ amplitude to achieve the required total jitter (TJ) level.
Running Tests
Some tests require specific instrument connections. For these tests, the Test Automation Software displays the necessary connections graphically before starting the test execution.
For measurements on a DUT, the DisplayPort fixture has to be connected to the Stressed Signal Generator and the DUT as shown in Figure 46.
For fully automated testing, a DPTC/Aux Channel Controller is needed and the Aux Channel DUT control and register access must be enabled on the DUT. If these conditions are not met, see below.
The DisplayPort station includes the following tests:
Jitter Tolerance Test HBR/RBR 2 MHz / 10 MHz / 20 MHz / 100 MHz This is the only compliance test. It uses a specific amount of RJ and ISI depending on the data rate. It tests with several different sinusoidal jitter frequencies and checks whether the DUT sustains a bit error ratio (BER) of 10–9. All these tests are also available with SSC enabled.
Jitter Tolerance Characterization HBR/RBR (Expert Mode)
This test uses a specified frequency range. It splits a specified SJ frequency range into a specified number of frequency steps and searches for the SJ amplitude for each frequency where the specified BER can no longer be sustained.
Sensitivity Test HBR/RBR (Expert Mode)
This test starts with a specified swing amplitude and decreases it until the device can no longer sustain a specified BER.
Variable Parameter Test HBR/RBR (Expert Mode)
The variable parameter test allows you to adjust all relevant parameters and test against these conditions.
Intra Pair Skew Test HBR/RBR (Expert Mode, ParBERT with Three Generators Only)
The Intra Pair Skew Test uses two ParBERT generators to create skew between the normal and complement of a data lane. The skew is increased up to 1 UI or until the device fails. Afterwards, the skew is increased in the reverse direction.
As for all other applications, Compliance and Expert Mode tests are provided. The Expert Mode tests provide control over the test
parameters. Some tests, such as the Variable Parameter Test, are only available in Expert Mode.
As mentioned above, for full test automation, DUT control via the AUX channel must be enabled. Ifa device does not yet fully support this, use the dummy AUX channel controller in conjunction with vendor-specific tools. Use these tools for the necessary DUT setup and control and to read the bit errors. In this case, the Test Automation Software shows the dialog given in Figure 47. Enter the bit error count provided by the vendor tool.
Figure 47: Error counter dialog box
9. Mobile Bus Test Applications
MIPI D-PHY
Supported Hardware Configurations
ValiFrame N5990A supports hardware configurations based on the 81250A ParBERT. For details, contact Agilent.
Configuring a MIPI D-PHY Station
Follow the instructions given in Chapters 4. A test station instrument configuration panel example is given in Figure 48.
Configuring the MIPI D-PHY DUT
The DUT configuration panel is shown in Figure 49. The user selects the DUT type, i.e., Receiver or Transmitter, and the Spec version (currently 0.65, 0.90 or Custom). The High Speed (HS) and Low Power (LP) frequencies can be selected, too.
Users can enter descriptions and comments along with their names. Time stamps are shown. Choosing “Keep Signals After Test” will keep the output signals of the receiver test subsystem as they were when the last test was finished.
As for all other applications, the user selects between “Compliance Mode” and “Expert Mode” in this panel, too. The latter is for user-defined characterization, margin tests, and debugging.
User-Selectable Parameters
• LSB First: Least significant bits and bytes are sent first according to the MIPI DSI (Display Serial Interface) and CSI (Camera Serial Interface) specifications.
• Sync Word: Sets the Sync Word. For LSB first it should be 0xB8, for MSB first it should be 0x1D or binary 00011101. Some devices may not follow the MIPI D-PHY specification and may need different sync words for detecting the start of the HS pattern.
• Modify Default Timing: Opens a new window that allows the MIPI D-PHY global timing parameters to be set. These values are used for all tests that do not explicitly change these settings. Pattern and Frame Selection
• Compliance Pattern: Predefined test patterns as outlined in the MIPI D-PHY Compliance Test Suite are used for High Speed (HS), Low Power (LP), and Ultra Low Power (ULP) tests.
• Frame (Sequence): User definable sequence files can be used for the tests. Please refer to Appendix B for information on the data file format.
• Frame, continuous Clock: Like Frame (Sequence), but with the clock running continuously in all speed modes.
BER Reader: Getting Pass/Fail or Bit Error Ratio (BER) Information from the DUT
The Test Automation Software controls ParBERT to conduct the tests as specified in the MIPI D-PHY Conformance Test Suite (CTS). It uses the test numbers given in the CTS.
For automated receiver testing, it is necessary to determine whether the DUT received the data properly. This can be achieved by reading pass/fail information from the device. Ideally, the Bit Error Ratio (BER) is measured and read. N5990A ValiFrame supports three different implementations:
1. Using an Agilent 16800 or 16900 series Logic Analyzer connected to the PPI (PHY Protocol Interface) of the DUT. The Test
Automation Software then controls the Logic Analyzer and reads out two trigger counters. One counter contains the number of frames or data bursts transmitted, the other counter the number of bit or frame errors. This method can only be used if the device supports the optional PPI.
2. Using an offline BER reader, generating pop-up dialogs requesting the user to reset and initialize the device and enter whether the device is working properly. This method is
applicable to devices that allow a visual check, e.g. a DSI device connected to a display. Alternatively, proprietary interfaces for reading the pass/fail information may be used. Using an offline BER reader will result in a semi-automated test as at each test point the user has to enter the pass/fail information.
3. Using the ValiFrame CustomBER reader interface. This allows fully automated tests even if the device does not support PPI. This method requires the implementation of a class supporting the IBerReader software interface by the user, providing access to the DUT’s pass/fail information. For example, if the DUT supports internal error counter registers they can be read by an I2C tool or similar, accessible via MS .NET code. The definition of the IBerReader interface is given in Appendix C. Example code is available from BitifEye.
Using PPI
PPI access is fully supported by the Agilent Logic Analyzers (LAs) mentioned above. On the Logic Analyzer a server needs to be
installed, which controls the generator to reset and initialize the DUT and run the analyzer to compare the received pattern with the expected pattern. At the start of each test a predefined setup (Logic Analyzer ala-file) is loaded, depending on the lane under test (clock, D1–D4) and the test mode (low power (LP), ultra low power (ULP), or high speed (HS)). The setup files depend on the DUT and need to be available on the LA. The folder is set in the Configure DUT dialog and the default path is "c:\MIPI".
Using the IBerReader Interface
For some receiver DUTs proprietary tools exist for reading internal checksum error counters, burst counters, or other indicators. These indicators make it possible to determine whether the receiver was able to receive the data properly. The integration of such proprietary tools into the Test Automation Software can be achieved with the software interface in Appendix C. The interface acts as a wrapper for such tools.The definition is given in C# .NET.
From the name IberReader, Bit-Error-Ratio (BER) can be inferred, however, the concept is more general and applies to Frame Error reading, too.
Calibrating the Receiver Test System
Figure 50 shows the results of a successful calibration of a MIPI receiver test system in Expert Mode. The user-selectable parameters for the HS Receiver Vcmrx Tolerance test are shown on the right as an
example.
For details of the MIPI Calibration Procedures, please refer to the "N5990A MIPI Calibration and Test Procedure Description" Guide.
Running Tests
Once tests are started in Compliance or Expert Mode, connection diagrams such as the one depicted in Figure 51 may be displayed. The user must ensure that all required connections are established. The test automation will proceed only after confirmation by the user. For details of the MIPI Calibration Procedures, please refer to the "N5990A MIPI Calibration and Test Procedure Description" Guide.
MIPI M-PHY
Supported Hardware Configurations
ValiFrame N5990A supports hardware configurations based on the Agilent 81250A ParBERT and J-BERT N4903B. For details, contact Agilent.
Configuring a MIPI M-PHY Station
Follow the instructions given in Chapters 4. A test station instrument configuration panel example is given in Figure 52.
Configuring the MIPI M-PHY DUT
The DUT configuration panel is shown in Figure 53. The user selects the DUT type, i.e. Receiver or Transmitter, and the Spec version (e.g. 0.65, 0.90, or Custom). The HS and LP frequencies can be selected, too.
Users can enter descriptions and comments along with their names. Time stamps are shown. Choosing “Keep Signals After Test” will keep the output signals of the receiver test subsystem as they were when the last test was finished.
As for all other applications, the user selects between “Compliance Mode” and “Expert Mode” in this panel, too. The latter is for user-defined characterization, margin tests, and debugging.
User-Selectable Parameters
• LSB First: Least significant bits and bytes are sent first according to the MIPI DSI and CSI specifications.
• Sync Word: Sets the Sync Word. For LSB first it should be 0xB8, for MSB first it should be 0x1D or binary 00011101. Some devices may not follow the MIPI D-PHY specification and may need different sync words for detecting the start of the HS pattern.
• Modify Default Timing: Opens a new window that allows the MIPI D-PHY global timing parameters to be set. These values are used for all tests that do not explicitly change these settings. Pattern and Frame Selection
• Compliance Pattern: Predefined test patterns as outlined in the MIPI D-PHY Compliance Test Suite are used for High Speed (HS), Low Power (LP), and Ultra Low Power (ULP) tests.
• Frame (Sequence): User-definable sequence files can be used for the tests. Please refer to Appendix B for information on the data file format.
• Frame, continuous Clock: Like Frame (Sequence), but with the clock running continuously in all speed modes.
BER Reader: Getting Pass/Fail or Bit Error Ratio (BER) Information from the DUT
The Test Automation Software controls ParBERT to conduct the tests as specified in the MIPI D-PHY Conformance Test Suite (CTS). It uses the test numbers given in the CTS.
For automated receiver testing, it is necessary to determine whether the DUT received the data properly. This can be achieved by reading pass/fail information from the device. Ideally, the Bit Error Ratio (BER) is measured and read. N5990A ValiFrame supports three different implementations:
1. Using an Agilent 16800 or 16900 series Logic Analyzer connected to the PPI (PHY Protocol Interface) of the DUT. The Test
Automation Software then controls the Logic Analyzer and reads out two trigger counters. One counter contains the number of frames or data bursts transmitted, the other counter the number of bit or frame errors. This method can only be used if the device supports the optional PPI.
2. Using an offline BER reader, which generates pop-up dialogs requesting the user to reset and initialize the device and enter whether the device is working properly. This method is
applicable to devices that allow a visual check, e.g. a DSI device connected to a display. Alternatively, proprietary interfaces for reading the pass/fail information may be used. Using an offline BER reader will result in a semi-automated test as at each test point the user has to enter the pass/fail information.
3. Using the ValiFrame CustomBER reader interface. This allows fully automated tests even if the device does not support PPI. This method requires the implementation of a class supporting the IBerReader software interface by the user, providing access to the DUT's pass/fail information. For example, if the DUT supports internal error counter registers they can be read by an I2C tool or similar, accessible via MS .NET code. The definition of the IBerReader interface is given in Appendix C. Example code is available from BitifEye.
Using PPI
PPI access is fully supported by the Agilent Logic Analyzers (LAs) mentioned above. On the Logic Analyzer a server needs to be
installed, which controls the generator to reset and initialize the DUT and run the analyzer to compare the received pattern with the expected pattern. At the start of each test a predefined setup (Logic Analyzer ala-file) is loaded, which depends on the lane under test (clock, D1–D4) and the test mode (LP, ULP, or HS). The setup files depend on the DUT and need to be available on the LA. The folder is set in the Configure DUT dialog and the default path is "c:\MIPI". Using the IBerReader Interface
For some receiver DUTs proprietary tools exist for reading internal checksum error counters, burst counters, or other indicators. These indicators make it possible to determine whether the receiver was able to receive the data properly. The integration of such proprietary tools into the Test Automation Software can be achieved with the software interface in Appendix C. The interface acts as a wrapper for such tools.The definition is given in C# .NET.
From the name IberReader, Bit-Error-Ratio (BER) can be inferred, however, the concept is more general and applies to Frame Error reading, too.
Calibrating the Receiver Test System
An expample for a calibration procedure in Expert Mode is given in. The user-selectable parameters on the right.
Running Tests
Once tests are started in Compliance or Expert Mode, connection diagrams such as the one depicted in Figure 55 may be displayed. The user must ensure that all required connections are established. The test automation will proceed only after confirmation by the user. Figure 54: MIPI M-PHY calibration procedure example
