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Design and Test of New Robust QCA Sequential Circuits

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Figure

Figure 1.  The QCA (a): cell (b): inverter Gate (c): three-input majority Gate.
Figure 3. Proposed QCA DFF (a) layout (b) simulation results.
Figure 5. Proposed DFF with 2-D wave clocking (a) Layout (b) simulation results.
Figure 7. Layout of the proposed DFF for analysis of missing cell defects.
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