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Techniques for Low Power and Area Optimized VLSI Testing using Novel Scan Flip Flop

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Figure

Fig 1: Block diagram of Scan flop
Fig 2:  Block diagram of DET scan flip-flop
Fig :5 Switch level circuit of  the proposed scan flip-flop(excluding the clock driver circuit)
Table 2. Analysis of power dissipation using proposed scan flip-flop with and without gating technique

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