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(1)

FEATURES

LOW NOISE: 4.5nV/

Hz max at 1kHz

LOW OFFSET: 100

µ

V max

LOW DRIFT: 0.4

µ

V/

°

C

HIGH OPEN-LOOP GAIN: 117dB min

HIGH COMMON-MODE REJECTION: 100dB min

HIGH POWER-SUPPLY REJECTION: 94dB min

FITS OP-07, OP-05, AD510, AND AD517

SOCKETS

Ultra-Low Noise, Precision

OPERATIONAL AMPLIFIERS

APPLICATIONS

PRECISION INSTRUMENTATION

DATA ACQUISITION

TEST EQUIPMENT

PROFESSIONAL AUDIO EQUIPMENT

TRANSDUCER AMPLIFIERS

RADIATION HARD EQUIPMENT

OPA27

OPA37

OPA27

OPA27

SBOS135B – JANUARY 1984 – REVISED FEBRUARY 2005

DESCRIPTION

The OPA27 and OPA37 are ultra-low noise, high-precision

monolithic operational amplifiers.

Laser-trimmed thin-film resistors provide excellent long-term

voltage offset stability and allow superior voltage offset

compared to common zener-zap techniques.

A unique bias current cancellation circuit allows bias and

offset current specifications to be met over the full –55

°

C to

+125

°

C temperature range.

The OPA27 is internally compensated for unity-gain stability.

The decompensated OPA37 requires a closed-loop gain

5.

The Texas Instrument OPA27 and OPA37 are improved

replacements for the industry-standard OP-27 and OP-37.

PRODUCTION DATA information is current as of publication date. Copyright © 1984-2005, Texas Instruments Incorporated

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

All trademarks are the property of their respective owners.

Output +VCC –VCC +In –In Trim Trim 8 7 6 4 1 2 3

(2)

Top View

PIN CONFIGURATION

ABSOLUTE MAXIMUM RATINGS

(1)

Supply Voltage ...±22V Internal Power Dissipation (2) ... 500mW

Input Voltage ...±VCC

Output Short-Circuit Duration (3)... Indefinite

Differential Input Voltage (4) ...±0.7V

Differential Input Current (4) ...±25mA

Storage Temperature Range ... –55°C to +125°C Operating Temperature Range ... –40°C to +85°C Lead Temperature:

P (soldering, 10s) ... +300°C U (soldering, 3s) ... +260°C NOTES: (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. (2) Maximum package power dissipation versus ambient temperature. (2) To common with ±VCC = 15V. (4) The inputs are protected by

back-to-back diodes. Current limiting resistors are not used in order to achieve low noise. If differential input voltage exceeds ±0.7V, the input current should be limited to 25mA.

PACKAGE PACKAGE PRODUCT PACKAGE-LEAD θJA DRAWING MARKING

OPA27 DIP-8 100°C/W P OPA27GP OPA27 SO-8 160°C/W D OPA27U OPA37 DIP-8 100°C/W P OPA37GP OPA37 SO-8 160°C/W D OPA37U NOTE: (1) For the most current package and ordering information, see the Package Option Addendum located at the end of this document, or see the TI website at www.ti.com.

PACKAGE/ORDERING INFORMATION

(1)

ELECTROSTATIC

DISCHARGE SENSITIVITY

This integrated circuit can be damaged by ESD. Texas

Instru-ments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling

and installation procedures can cause damage.

ESD damage can range from subtle performance degradation

to complete device failure. Precision integrated circuits may be

more susceptible to damage because very small parametric

changes could cause the device not to meet its published

specifications.

1 2 3 4 5 6 7 8 Offset Trim +VCC –In +In –VCC Output NC NC = No Connection Offset Trim

(3)

ELECTRICAL CHARACTERISTICS

At VCC = ±15V and TA = +25°C, unless otherwise noted.

OPA27 OPA37

PARAMETER CONDITIONS MIN TYP MAX UNITS

INPUT NOISE(6) Voltage, fO = 10Hz 3.8 8.0 nV/√Hz fO = 30Hz 3.3 5.6 nV/√Hz fO = 1kHz 3.2 4.5 nV/√Hz fB = 0.1Hz to 10Hz 0.09 0.25 µVPP Current,(1) f O = 10Hz 1.7 pA/√Hz fO = 30Hz 1.0 pA/√Hz fO = 1kHz 0.4 0.6 pA/√Hz OFFSET VOLTAGE(2)

Input Offset Voltage ±25 ±100 µV

Average Drift(3) T

A MIN to TA MAX ±0.4 ±1.8 (6) µV/°C

Long Term Stability(4) 0.4 2.0 µV/mo

Supply Rejection ±VCC = 4 to 18V 94 120 dB

±VCC = 4 to 18V ±1 ±20 µV/V

BIAS CURRENT

Input Bias Current ±15 ±80 nA

OFFSET CURRENT

Input Offset Current 10 75 nA

IMPEDANCE

Common-Mode 2 || 2.5 GΩ || pF

VOLTAGE RANGE

Common-Mode Input Range ±11 ±12.3 V

Common-Mode Rejection VIN = ±11VDC 100 122 dB

OPEN-LOOP VOLTAGE GAIN, DC RL≥ 2kΩ 117 124 dB

RL≥ 1kΩ 124 dB

FREQUENCY RESPONSE

Gain-Bandwidth Product(5) OPA27 5(6) 8 MHz

OPA37 45(6) 63 MHz Slew Rate(5) V O = ±10V, RL = 2kΩ OPA27, G = +1 1.7(6) 1.9 V/µs OPA37, G = +5 11(6) 11.9 V/µs

Settling Time, 0.01% OPA27, G = +1 25 µs

OPA37, G = +5 25 µs

RATED OUTPUT

Voltage Output RL≥ 2kΩ ±12 ±13.8 V

RL≥ 600Ω ±10 ±12.8 V

Output Resistance DC, Open Loop 70 Ω

Short Circuit Current RL = 0Ω 25 60(6) mA

POWER SUPPLY

Rated Voltage ±15 VDC

Voltage Range,

Derated Performance ±4 ±22 VDC

Current, Quiescent IO = 0mADC 3.3 5.7 mA

TEMPERATURE RANGE

Specification –40 +85 °C

Operating –40 +85 °C

NOTES: (1) Measured with industry-standard noise test circuit (Figures 1 and 2). Due to errors introduced by this method, these current noise specifications should be used for comparison purposes only. (2) Offset voltage specification are measured with automatic test equipment after approximately 0.5 seconds from power turn-on. (3) Unnulled or nulled with 8kΩ to 20kΩ potentiometer. (4) Long-term voltage offset vs time trend line does not include warm-up drift. (5) Typical specification only on plastic package units. Slew rate varies on all units due to differing test methods. Minimum specification applies to open-loop test. (6) This parameter specified by design.

(4)

OPA27 OPA37

PARAMETER CONDITIONS MIN TYP MAX UNITS

INPUT VOLTAGE(1)

Input Offset Voltage ±48 ±220(3) µV

Average Drift(2) T

A MIN to TA MAX ±0.4 ±1.8(3) µV/°C

Supply Rejection ±VCC = 4.5 to 18V

±VCC = 4.5 to 18V 90 (3) 122 dB

BIAS CURRENT

Input Bias Current ±21 ±150(3) nA

OFFSET CURRENT

Input Offset Current 20 135(3) nA

VOLTAGE RANGE

Common-Mode Input Range ±10.5(3) ±11.8 V

Common-Mode Rejection VIN = ±11VDC 96(3) 122 dB

OPEN-LOOP GAIN, DC

Open-Loop Voltage Gain RL≥ 2kΩ 113(3) 120 dB

RATED OUTPUT

Voltage Output RL = 2kΩ ±11.0(3) ±13.4 V

Short Circuit Current VO = 0VDC 25 mA

TEMPERATURE RANGE

Specification –40 +85 °C

NOTES: (1) Offset voltage specification are measured with automatic test equipment after approximately 0.5s from power turn-on. (2) Unnulled or nulled with 8kΩ to 20kΩ potentiometer. (3) This parameter specified by design.

ELECTRICAL CHARACTERISTICS

(5)

TYPICAL PERFORMANCE CURVES

At TA = +25°C, ±VCC = ±15VDC, unless otherwise noted.

INPUT OFFSET VOLTAGE WARM-UP DRIFT

Time From Power Turn-On (min) 0 +10 +5 0 –5 –10

Offset Voltage Change (

µ

V)

1 2 3 4 5 6

INPUT VOLTAGE NOISE vs NOISE BANDWIDTH (0.1Hz to Indicated Frequency) Noise Bandwidth (Hz) 100 1k 10k 100k 10 1 0.1 0.01 Voltage Noise ( µ Vrms) R = 0S Ω

TOTAL INPUT VOLTAGE NOISE SPECTRAL DENSITY vs SOURCE RESISTANCE Source Resistance ( )Ω 100 1k 10k 100 80 60 10 8 6 40 20 4 2 1 Voltage Noise (nV/ √ Hz) -+ R1 R1 R = 2 RSOURCE x 1

Resistor Noise Only 1kHz

10Hz

VOLTAGE NOISE SPECTRAL DENSITY vs SUPPLY VOLTAGE 5 4 3 2 1 0 Supply Voltage (V )CC ±5 ±10 ±15 ±20 Voltage Noise (nV/ √ Hz) 1kHz 10Hz Voltage Noise (nV/ √ Hz)

VOLTAGE NOISE SPECTRAL DENSITY vs TEMPERATURE 5 4 3 2 1 –75 –50 –25 0 +25 +50 +75 +100 +125 Ambient Temperature (°C) 10Hz 1kHz

INPUT CURRENT NOISE SPECTRAL DENSITY

Current Noise (pA/

√ Hz) 10 8 6 4 2 1 0.8 0.6 0.4 0.2 0.1 10 100 1k 10k

This industry-standard equation is inaccurate and these figures should be used for comparison purposes only!

Current Noise Test Circuit

In =√(eno)2 – (130nV)2 1M 100Ωx DUT 100kΩ 500kΩ 500kΩ 10kΩ eno Frequency (Hz) Warning:

(6)

TYPICAL PERFORMANCE CURVES

(Cont.)

At TA = +25°C, ±VCC = ±15VDC, unless otherwise noted.

INPUT VOLTAGE NOISE SPECTRAL DENSITY

1 10 100 1k Frequency (Hz) Voltage Noise (nV/ √ Hz) 10 8 6 4 2 0

OPEN-LOOP FREQUENCY RESPONSE

Frequency (Hz) 10 100 1k 10k 100k 1M 10M 100M 140 120 100 80 60 40 20 0 Voltage Gain (dB) OPA27 OPA37

BIAS AND OFFSET CURRENT vs TEMPERATURE

Ambient Temperature (°C) –75 –50 –25 0 +25 +50

Bias

Offset

+75 +100 +125

Absolute Bias Current (nA)

20

15

10

5

0

Absolute Offset Current (nA)

20

15

10

5

0

OPA27 CLOSED-LOOP VOLTAGE GAIN AND PHASE SHIFT vs FREQUENCY (G = 100)

Frequency (Hz)

10 100 1k 10k 100k 1M 10M 100M

Voltage Gain (dB)

Phase Shift (degrees)

50 40 30 20 10 0 –10 –20 0 –45 –90 –135 –180 –225 ∅ Gain

OPA37 CLOSED-LOOP VOLTAGE GAIN AND PHASE SHIFT vs FREQUENCY (G = 100)

Frequency (Hz)

10 100 1k 10k 100k 1M 10M 100M

Voltage Gain (dB)

Phase Shift (degrees)

50 40 30 20 10 0 –10 –20 0 –45 –90 –135 –180 –225 Ø Gain G = 5

COMMON-MODE REJECTION vs FREQUENCY 140 120 100 80 60 40 20 0 Common-Mode Rejection (dB) Frequency (Hz) 1 10 100 1k 10k 100k 1M 10M OPA37 OPA27

(7)

TYPICAL PERFORMANCE CURVES

(Cont.)

At TA = +25°C, ±VCC = ±15VDC, unless otherwise noted.

POWER SUPPLY REJECTION vs FREQUENCY 140 120 100 80 60 40 20 0

Power Supply Rejection (dB)

Frequency (Hz)

1 10 100 1k 10k 100k 1M 10M OPA27

–VCC

+VCC

OPEN-LOOP VOLTAGE GAIN vs SUPPLY VOLTAGE 130 125 120 115 Voltage Gain (dB) ±5 Supply Voltage (V )CC ±10 ±15 ±20 ±25 R = 2kL Ω R = 600L Ω

OPEN-LOOP VOLTAGE GAIN vs TEMPERATURE

Voltage Gain (dB) 135 130 125 120 115 Ambient Temperature (°C) –75 –50 –25 0 +25 +50 +75 +100 +125 RL = 2kΩ

SUPPLY CURRENT vs SUPPLY VOLTAGE 6 5 4 3 2 1 0

Supply Current (mA)

0 Supply Voltage (V )CC ±5 ±10 ±15 ±20 +25°C +125°C –55°C

COMMON-MODE INPUT VOLTAGE RANGE vs SUPPLY VOLTAGE +15 +10 +5 0 –5 –10 –15 Common-Mode Range (V) 0 Supply Voltage (V )CC ±5 ±10 ±15 ±20 T = +25A °C T = +125A °C T = –55A °C T = +25A °C T = +125A °C T = –55A °C

OPA27 SMALL SIGNAL TRANSIENT RESPONSE

Time (µs) +60 +40 +20 0 –20 –40 –60 Output Voltage (mV) 0 1 2 A = +1 C = 15pF VCL L 0.5 1.5 2.5

(8)

TYPICAL PERFORMANCE CURVES

(Cont.)

At TA = +25°C, ±VCC = ±15VDC, unless otherwise noted.

OPA37 SMALL SIGNAL TRANSIENT RESPONSE

Time (µs) +60 +40 +20 0 –20 –40 –60 Output Voltage (mV) 0.2 0.4 0.6 A = +5 C = 25pF V L 0 0.8 1.0 1.2

OPA27 LARGE SIGNAL TRANSIENT RESPONSE

Time (µs) +6 +4 +2 0 –2 –4 –6 Output Voltage (V) 2 4 6 0 8 10 12 A = +1VCL

OPA37 LARGE SIGNAL TRANSIENT RESPONSE

Time (µs) +15 +10 +5 0 –5 –10 –15 Output Voltage (V) 1 2 3 0 4 5 6 A = +5V

(9)

APPLICATIONS INFORMATION

OFFSET VOLTAGE ADJUSTMENT

The OPA27 and OPA37 offset voltages are laser-trimmed

and require no further trim for most applications. Offset

voltage drift will not be degraded when the input offset is

nulled with a 10k

trim potentiometer. Other potentiometer

values from 1k

to 1M

can be used, but V

OS

drift will be

degraded by an additional 0.1

µ

V/

°

C to 0.2

µ

V/

°

C. Nulling

large system offsets by use of the offset trim adjust will

degrade drift performance by approximately 3.3

µ

V/

°

C per

millivolt of offset. Large system offsets can be nulled without

drift degradation by input summing.

The conventional offset voltage trim circuit is shown in Figure

3. For trimming very small offsets, the higher resolution

circuit shown in Figure 4 is recommended.

The OPA27 and OPA37 can replace 741-type operational

amplifiers by removing or modifying the trim circuit.

THERMOELECTRIC POTENTIALS

The OPA27 and OPA37 are laser-trimmed to microvolt-level

input offset voltages, and for very-low input offset voltage

drift.

Careful layout and circuit design techniques are necessary to

prevent offset and drift errors from external thermoelectric

potentials. Dissimilar metal junctions can generate small

EMFs if care is not taken to eliminate either their sources

(lead-to-PC, wiring, etc.) or their temperature difference (see

Figure 11).

Short, direct mounting of the OPA27 and OPA37 with close

spacing of the input pins is highly recommended. Poor layout

can result in circuit drifts and offsets which are an order of

magnitude greater than the operational amplifier alone.

FIGURE 1. 0.1Hz to 10Hz Noise Test Circuit.

FIGURE 2. Low Frequency Noise.

DUT OPA111 100kΩ 2kΩ 4.7µF Voltage Gain Total = 50,000 10Ω

NOTE: All capacitor values are for nonpolarized capacitors only. 0.1µF Scope x1 RIN = 1MΩ 100kΩ 24.3kΩ 4.3kΩ 110kΩ 0.1µF 22µF 2.2µF 0.1Hz TO 10Hz NOISE 1s/div 40nv/div

(10)

COMPENSATION

Although internally compensated for unity-gain stability, the

OPA27 may require a small capacitor in parallel with a

feedback resistor (R

F

) which is greater than 2k

. This

ca-pacitor will compensate the pole generated by R

F

and C

IN

and eliminate peaking or oscillation.

INPUT PROTECTION

Back-to-back diodes are used for input protection on the

OPA27 and OPA37. Exceeding a few hundred millivolts

differ-ential input signal will cause current to flow, and without

external current limiting resistors, the input will be destroyed.

Accidental static discharge, as well as high current, can

dam-age the amplifier’s input circuit. Although the unit may still be

functional, important parameters such as input offset voltage,

drift, and noise may be permanently damaged, as will any

precision operational amplifier subjected to this abuse.

Transient conditions can cause feedthrough due to the amplifier’s

finite slew rate. When using the OPA27 as a unity-gain buffer

(follower) a feedback resistor of 1k

is recommended, as

shown in Figure 6.

NOISE: BIPOLAR VERSUS FET

Low-noise circuit design requires careful analysis of all noise

sources. External noise sources can dominate in many

cases, so consider the effect of source resistance on overall

operational amplifier noise performance. At low source

im-pedances, the lower voltage noise of a bipolar operational

amplifier is superior, but at higher impedances the high

current noise of a bipolar amplifier becomes a serious

liabil-ity. Above about 15k

, the OPA111 low-noise FET

opera-tional amplifier is recommended for lower total noise than the

OPA27, as shown in Figure 5.

FIGURE 3. Offset Voltage Trim.

FIGURE 6. Pulsed Operation.

FIGURE 7. Low-Noise RIAA Preamplifier.

FIGURE 4. High Resolution Offset Voltage Trim.

1 2

3 4

6

±4mV Typical Trim Range NOTE: (1) 10kΩ to 1MΩ Trim Potentiometer (10kΩ Recommended). +VCC –VCC OPA27/37 7 8 (1) 1 2 3 4 6

±280µV Typical Trim Range

NOTE: (1) 1kΩ Trim Potentiometer. +VCC –VCC OPA27/37 7 8 4.7kΩ 4.7kΩ (1) 100 1k 10k 100k 1M 10M 1k 100 10 1

Voltage Noise Spectral Density, E

O Typical at 1kHz (nV/ √ Hz) OPA111 + Resistor OPA27 + Resistor Source Resistance, RS (Ω) EO RS EO = √en2 + (inRS)2 + 4kTRS FO = 1kHz Resistor Noise Only

OPA27 + Resistor

OPA111 + Resistor

Resistor Noise Only

OPA27 Output 1.9V/µs RF ≈ 1kΩ Input – + OPA37 Output 97.6kΩ G ≈ 40dB at 1kHz. Metal film resistors. Film capacitors. RL and CL per cartridge

manufacturer’s recommendations. 100Ω 2 3 6 0.03µF 0.01µF 7.87kΩ 1µF 20kΩ RL Moving Magnet Cartridge CL OPA27 Output Input 1kΩ 1kΩ 2 3 6

(11)

FIGURE 11. Low Frequency Noise Comparison.

FIGURE 10. NAB Tape Head Preamplifier.

FIGURE 9. High Slew Rate Unity-Gain Inverting Amplifier.

OPA37 Output Input 1kΩ 1kΩ 2 3 6 500pF 250Ω OPA37 Output 316kΩ 4.99kΩ G ≈ 50dB at 1kHz.

Metal film resistors. Film capacitors. RL and CL per head

manufacturer’s recommendations. 100Ω 2 3 6 0.01µF 1µF 20kΩ RL

Magnetic Tape Head

CL 10kΩ 0.5µV 0.5µV 0.5µV 0.5µV 5µV A. 741 noise with circuit well-shielded from air

currents and RFI. (Note scale change.)

B. OP-07AH with circuit well-shielded from air currents and RFI.

C. OPA27AJ with circuit well-shielded from air currents and RFI. (Represents ultimate OPA27 performance potential.)

D. OPA27 with circuit unshielded and exposed to normal lab bench-top air currents. (External thermoelectric potentials far exceed OPA27 noise.)

E. OPA27 with heat sink and shield which protects input leads from air currents. Conditions same as (D). Offset G =1k 10Hz Low-Pass Filter Chart Recorder 10mV/mm 5mm/s DUT Total Gain = 106 10Ω

(12)

FIGURE 12. Low Noise Instrumentation Amplifier.

FIGURE 13. Hydrophone Preamplifier.

FIGURE 14. Long-Wavelength Infrared Detector Amplifier.

Output OPA37 2 3 6 OPA37 3 2 6 6 1 5 3 2 INA105 Differential Amplifier

Input Stage Gain = 1 + 2RF/RG

+In –In RG 101Ω RF 5kΩ RF 5kΩ Gain = 100 Bandwidth ≈ 500kHz

For Gain = 1000, use INA106 differential amplifier.

25kΩ 25kΩ 25kΩ 25kΩ OPA37 Output 1kΩ 2kΩ EDO 6166

Transducer Frequency Response

≈ 1kHz to 50kHz 2 3 6 1MΩ 200Ω 500pF 0.1µF Output

NOTE: Use metal film resistors and plastic film capacitor. Circuit must be well shielded to achieve low noise. Responsivity ≈ 2.5 x 104V/W Output Noise ≈ 30µVrms, 0.1Hz to 10Hz Dexter 1M Thermopile Detector 100Ω 100kΩ OPA27 2 3 6 0.1µF Output 4.99kΩ D2 D1 DG188 TTL In S1 S2 9.76kΩ 500Ω Balance Trim OPA27 2 3 1 8 6 20pF 10kΩ 1kΩ 4.75kΩ Offset Trim 4.75kΩ +V Input TTL INPUT “1” “0” GAIN +1 –1

(13)

FIGURE 16. Ultra-Low Noise “N”-Stage Parallel Amplifier.

2kΩ Gain = –1010V/V VOS≈ 2µV Drift ≈ 0.07µV/°C en≈ 1nV/√Hz at 10Hz 0.9nV/√Hz at 100Hz 0.87nV/√Hz at 1kHz Full Power Bandwidth ≈ 180kHz Gain Bandwidth ≈ 500MHz Equivalent Noise Resistance ≈ 50Ω

Signal-to-Noise Ratio ∝ √N since amplifier noise is uncorrelated. 2kΩ 6 2 3 20Ω 6 2 3 6 2 3 2kΩ 6 2 3 6 2 3 OPA37 OPA37 OPA37 OPA37 OPA37 6 Output 2 3 OPA37 N = 10 Each OPA37 2kΩ 2kΩ 2kΩ 2kΩ 2kΩ 20Ω 2kΩ 20Ω 2kΩ 20Ω 2kΩ 20Ω Input

(14)

FIGURE 18. High Slew Rate Unity-Gain Buffer.

FIGURE 17. Unity-Gain Buffer.

FIGURE 20. Balanced Pyroelectric Infrared Detector.

FIGURE 19. RF Detector and Video Amplifier.

OPA27 Output Input 1kΩ 2 3 6 5V 5µs RS = 50Ω +10V 0V Output –10V OPA37 Output Input 1kΩ 2 3 6 500pF 250Ω 5V 5µs RS = 50Ω +10V 0V Output –10V OPA37 Video Output 20kΩ 200Ω VIRTEC V1000 Planar Tunnel Diode 2 3 6 0.01µF 50Ω Input 200Ω RFC 500pF OPA27 Output 10kΩ 100Ω 100µF/20V Tantalum 2 3 6 + + 1 3 2 10kΩ 10kΩ 10µF/20V Siemens LHI 948 +15V OPA27 Output 0 + – 4.8V 1kΩ 2 3 Airpax Magnetic Pickup fOUT∝ RPM • N

Where N = Number of Gear Teeth 6

(15)

PACKAGING INFORMATION

Orderable Device

Status

(1)

Package

Type

Package

Drawing

Pins Package

Qty

Eco Plan

(2)

Lead/Ball Finish

MSL Peak Temp

(3)

OPA27GP

ACTIVE

PDIP

P

8

50

TBD

Call TI

Level-NA-NA-NA

OPA27GU

ACTIVE

SOIC

D

8

100

TBD

CU NIPDAU

Level-2-220C-1 YEAR

OPA27GU/2K5

ACTIVE

SOIC

D

8

2500

TBD

CU NIPDAU

Level-2-220C-1 YEAR

OPA37GP

ACTIVE

PDIP

P

8

50

TBD

Call TI

Level-NA-NA-NA

OPA37GU

ACTIVE

SOIC

D

8

100

TBD

CU NIPDAU

Level-2-220C-1 YEAR

OPA37GU/2K5

ACTIVE

SOIC

D

8

2500

TBD

CU NIPDAU

Level-2-220C-1 YEAR

(1)

The marketing status values are defined as follows:

ACTIVE: Product device recommended for new designs.

LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.

NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in

a new design.

PREVIEW: Device has been announced but is not in production. Samples may or may not be available.

OBSOLETE: TI has discontinued the production of the device.

(2)

Eco

Plan

-

The

planned

eco-friendly

classification:

Pb-Free

(RoHS)

or

Green

(RoHS

&

no

Sb/Br)

-

please

check

http://www.ti.com/productcontent

for the latest availability information and additional product content details.

TBD: The Pb-Free/Green conversion plan has not been defined.

Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements

for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered

at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.

Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame

retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)

(3)

MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder

temperature.

Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is

provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the

accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take

reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on

incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited

information may not be available for release.

In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI

to Customer on an annual basis.

PACKAGE OPTION ADDENDUM

www.ti.com

6-May-2005

(16)

MECHANICAL DATA

MPDI001A – JANUARY 1995 – REVISED JUNE 1999

P (R-PDIP-T8)

PLASTIC DUAL-IN-LINE

8

4

0.015 (0,38)

Gage Plane

0.325 (8,26)

0.300 (7,62)

0.010 (0,25) NOM

MAX

0.430 (10,92)

4040082/D 05/98

0.200 (5,08) MAX

0.125 (3,18) MIN

5

0.355 (9,02)

0.020 (0,51) MIN

0.070 (1,78) MAX

0.240 (6,10)

0.260 (6,60)

0.400 (10,60)

1

0.015 (0,38)

0.021 (0,53)

Seating Plane

M

0.010 (0,25)

0.100 (2,54)

NOTES: A. All linear dimensions are in inches (millimeters).

B. This drawing is subject to change without notice.

C. Falls within JEDEC MS-001

(17)
(18)

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Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications,

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Figure

FIGURE 1. 0.1Hz to 10Hz Noise Test Circuit.
FIGURE 6. Pulsed Operation.
FIGURE 11. Low Frequency Noise Comparison.
FIGURE 12. Low Noise Instrumentation Amplifier.
+3

References

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