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Factors affecting electroplated semiconductor material properties: The case study of deposition temperature on cadmium telluride

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Figure

Figure 1. Figure 1. Typical two-electrode electrodeposition configuration.Typical two-electrode electrodeposition configuration
Figure 2.Typical cyclic voltammogram of an aqueous electrolyte at 85  ◦C containing 1.5 MCd(NO3)2·4H2O and 0.0002 M TeO2 in 400 mL of DI water.
Figure 3. XRD patterns of CdTe thin-films electroplated at di(AD) and (fferent temperatures under (a) as-depositedb) cadmium chloride treated (CCT) conditions.
Table 1. Summary of the X-ray diffraction analysis for cubic (111) CdTe diffraction for AD andCCT-CdTe layers.
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