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Effect of Pd Addition in ENIG Surface Finish on Drop Reliability of Sn Ag Cu Solder Joint

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Figure

Fig. 1Schematic of ENIG (a) and ENEPIG (b) board in the drop testsamples.
Fig. 2Drop test equipment (a) and acceleration condition (b).
Fig. 3Cross-sectional SEM images of the solder joints after as-reflow and thermal aging: ENIG (a), (c), (e) and ENEPIG (b), (d), (f).
Fig. 6Top view SEM images of IMCs after preferential etching: as-reflow (a), (b) and after thermal aging at 1,000 h (c), (d).
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