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Reflection mode scanning near field optical microscopy: Influence of sample type, tip shape, and polarization of light

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FIG. 2. Optical approach curves in reflection: �axis with objective of NA�a� measured with mirrorsumming over all reflected angles from 30° to 90°; �b� measured at 30° to tip�0.2; �c� illustration of tip and tip image used incalculation �d� calculated signal for sum over 30°–90° �solid line� and at 30°dotted line, scale expanded by 5 for clarity�.
FIG. 4. Illustration of effect of topography on light emitted from aperture.
Figure 7 shows shear force and R-SNOM images of an-beam etched chromium test pattern of height 80 nm fabri-
FIG. 9. �on glass for polarization of light ata� Shear force and �b�, �c� and �d� R-SNOM images of Cr grating �b� 45°, �c� 10°, and �d� 70° to lines
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