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New Built In Self Test Boundary Scan Architectures for Digital Integrated Circuits in Industrial Applications

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Figure

Fig 1:  Block diagram of the boundary scan in the chip level.
Fig. 5: Basic Block diagram of the parallel BIST.
Fig. 6: Basic Block diagram of the serial BIST.
Fig. 11: Block diagram of the system (core) logic in the PET BIST.
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