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What Causes to Tune a Condition of Exactly Identical Fault-Masks Behaviors in an LFSR based BIST Methodology

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Figure

Table 1: Summary Of Simulated Circuits. Cn: Circuit Number; Cs: Circuit Specification; Nfi: Number Of Faults Injected; Npi: Number Of Possible Feedback Connections Corresponding To Primitive Polynomials
Table 2: Circuit Cn-1; Figure 2

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