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In Situ, Real-Time Characterization of Silicide Nanostructure Coarsening Dynamics by Photo-Electron Emission Microscopy

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Figure

Figure 2.8  Standardized spectrum of the Oriel Hg arc lamp.  The peak UV photon energy
Figure 2.9  Spectrum of the 257 nm line of the Innova 300 FReD Ar ion laser.  The
Figure 2.10  Images of DySi2 nanostructures on a Si(001) substrate obtained with the Ar
Figure 2.11  A schematic of a FEL wiggler array and optical resonator.26  The relativistic
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