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LabVIEW based cost effective simultaneous data acquisition system: measurement of C V of the ferrite thin films

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Figure

Fig.1. Comparison of diode and dielectric varicapcharacteristics. Fig.1. Comparison of diode and dielectric varicapcharacteristics
Fig.2. c) Ferrite thin films (DUT) equivalent and I to V converter c) Ferrite thin films (DUT) equivalent and I to V converter
Fig. 3. (b) Algorithm of Simultaneous ADC co(b) Algorithm of Simultaneous ADC control and Sweep voltage control   ntrol and Sweep voltage control
Fig. 5 a) shows the results obtained from measurement of standard capacitor and their respective Vo COS REF, which gives 99.84% linearity in case of measurement of capacitance

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