Software Testing of NoTA DIP Implementation

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Software Testing of NoTA DIP

Implementation

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2009-09-23

•

Flander, Ardites and Symbio Group merged

and as a result Symbio was established

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Software Testing of NoTA DIP

Implementation

Ville Kankainen symbio.com 2009-10-01

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Agenda

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Device Interconnet Protocol (DIP) stack

•

Testing DIP implementation

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General

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Low level

•

High level

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Test applications

•

Conclusions

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Questions, feedback

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Device Interconnect Protocol

stack (DIP)

Tester Application Device A ref H_IN ref L_IN up L_IN down L_IN down ref L_IN up

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Device Interconnect Protocol

stack (DIP)

•

H_IN (High interconnect)

• Provides user API, to discover, to access and to communicate

between processes (Nodes)

Tester Application Tester Service Device A ref L_IN up L_IN down L_IN down ref L_IN up ref H_IN ref H_IN

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Device Interconnect Protocol

stack (DIP)

•

between processes (Nodes)

•

L_IN (Low interconnect)

• Up and Down parts

• L_INup is responsible of managing

connections Tester Application Device A ref H_IN ref L_IN up L_IN down L_IN down ref L_IN up

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Device Interconnect Protocol

stack (DIP)

•

between process (Nodes)

•

L_IN (Low interconnect)

• Up and Down parts

• L_INup is responsible of managing

connections

• L_INdown is responsible of

providing connections over target bearer technology Tester Application Tester Service Device A ref H_IN ref L_IN up L_IN down L_IN down ref H_IN ref L_IN up

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Testing DIP implementation

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Testing is divided into two parts

• System testing of L_INdown through L_INdown interface

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• System testing of L_INdown through L_INdown interface • System testing of DIP through

H_IF API interface

• (dependency on L_INdown) Tester Application Tester Service Device A ref H_IN ref L_IN up L_IN down L_IN down ref H_IN ref L_IN up

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Testing DIP implementation

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H_IF API interface

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Same test applications can be

utilitilized again

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H_IF API interface

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Same test applications can be

utilized again

•

Testing is modularized for easy

verification for each component

Tester Application Tester Service Device A ref H_IN ref L_IN up L_IN down L_IN down ref H_IN ref L_IN up

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•

Test is executed on L_INdown level

Testing of DIP

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Testing of DIP

(l_down_IF)

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Tests are run by LD_TESTER

• Scene discovery

• Address resolution

• Socket connection creation

• Socket features and speed

Device A

LD_TESTER client

L_IN down

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Testing of DIP

(l_down_IF)

•

• Scene discovery

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Made with C language to support

Device A

LD_TESTER client

L_IN down

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Testing of DIP

(l_down_IF)

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• Scene discovery

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Made with C language to support variety of platforms

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Requires two devices having the same L_INdown implemented on

Device A Device B LD_TESTER client L_IN down L_IN down LD_TESTER server

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Testing of DIP

(l_down_IF)

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L_IN down is now trusted to be

working and it can be used to verify rest of the stack

Device A

LD_TESTER client

L_IN down

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Testing of DIP

(H_IF 1/4) loopback

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Communication between local processes through H_IF

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Local communication is provided by

• Single process implementation

• Daemon implementation

• (Kernel – userspace implementation)

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Ensures that the target service can be tested on target hardware

• H_IN interface available during

Test A Tester Service Device A ref H_IN ref L_IN up L_IN down L_IN down ref H_IN ref L_IN up Test S

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Testing of DIP

(H_IF 2/4) two stacks, one process

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Two full stacks in one process

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Testing of full stacks in target hardware without implementing L_INdown

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Testing of NoTA approach in target hardware

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Done with the single process

Tester Application Process A ref H_IN ref L_IN up Single process L_IN down ref L_IN up

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Testing of DIP

(H_IF 3/4) two stacks, two devices

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Tests the integration of DIP

stacks in both devices

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Ensures compatibility between

devices

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Connected through target

L_INdown technology

Tester Application Tester Service Device A ref H_IN ref L_IN up L_IN down L_IN down ref H_IN ref L_IN up

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Testing of DIP

(H_IF 4/4) testing non-reference stack

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Non-reference stack is required for the most optimal way to use the platform

• Reference stack is using too much system resources (e.g. threads, memory)

• Reference stack has ”unnecessary” features and stack can be reduced for particular purpose

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Non-reference stack is verified against reference stack using reference testcases

• Reference stack is also verified against

Tester Application Device A ref H_IN ref L_IN up L_IN down L_IN down Vendor’s H_IN + L_INup

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Testing of DIP

(H_IF test applications)

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H_IN Reference test applications

• Service registeration

• Service discovery

• Service access

• Connection throughput and roundtrip

• Stress testing

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Service specific test application

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Model based test applications

Tester Application Tester Service Device A ref H_IN ref L_IN up L_IN down L_IN down Vendor’s H_IN + L_INup

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Testing of DIP

(H_IF) conclusions

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Stacks are verified within different combinations of network

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Different HW combinationscan be verified with reference and non-refetence stacks

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Test applications can be reused in all of the combinations

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Test applications to particular

Tester Application Device A ref H_IN ref L_IN up L_IN down L_IN down Vendor’s H_IN + L_INup

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Thank you!

Ville Kankainen [email protected] +358-40-0126999

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