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 V

 V

ersion 5.2 for Mac •

ersion 5.2 for Mac •

V

V

ersion 1.4 for

ersion 1.4 for

Windows

Windows

User’s Guide

User’s Guide

Crystal

Crystal

Diract

Diract

®

®

Interactive

Interactive

P

P

owder Diraction

owder Diraction

Software

Software

W

(2)

 T

 Table of Contents

able of Contents

Chapter

Chapter 1: 1: Getting Getting Started Started ... 11 Using this

Using this Guide Guide ... 11 Interface

Interface Reference Reference Convention Convention ... 22 System

System Requirements Requirements ... 22 Installation

Installation ... 22  What is Cr

 What is CrystalDiract? ystalDiract? ... 33 CrystalMaker Inte

CrystalMaker Integration gration ... 66 Chapter

Chapter 2: 2: CrysCrystalDiract talDiract Interface Interface ...7..7  Window Design ...

 Window Design ... 77 Displaying a Diraction

Displaying a Diraction Pattern Pattern ... 77 Scrolling and

Scrolling and Zooming Zooming ... 99 Measuring

Measuring a a Pattern...Pattern... 1010 Output

Output ... 1010 Help and

Help and Updates Updates ... 1010 Chapter

Chapter 3: 3: Simulating Simulating Diraction Diraction ... 1111 Calculating the

Calculating the Pattern Pattern ... 1111 Radiation

Radiation TType...ype... 1212 Diraction

Diraction Modes Modes ... 1212 Peak-Shape

Peak-Shape Functions Functions ... 1414 Peak

Peak Widths Widths ... 1515 Editing

Editing Structural Data Structural Data ... 1616 Interactive

Interactive Parameter Parameter Control Control ... 1717 Mixtures

Mixtures ... 1919 Viewing Diraction

Viewing Diraction Data Data ... 2020 Chapter

Chapter 4: 4: WWorking orking with with Patterns Patterns ... 2121  W

 Working with Observed Data...orking with Observed Data... 2121 Managing Multiple P

Managing Multiple Patterns atterns ... 2323 General Plot Settings

General Plot Settings... 2525 Individual P

Individual Pattern Settattern Settings ings ... 2626 Customizing your W

Customizing your Workspace orkspace ... 2828 Chapter

Chapter 5: 5: Printing Printing & & Saving Saving ... 2929 Saving Y

Saving Your Woour Work rk ... 2929 Saving

Saving Preferences Preferences ... 2929 Exporting

Exporting Data Data ... 2929 Printing

Printing ... 3030 Chapter

Chapter 6: 6: TToolbar oolbar Reference Reference ... 3131 Chapter

Chapter 7: 7: e e CrystalCrystalMaker Maker ®®Oce ...33Oce ...33

Introduction

Introduction to to CrystalMaker...CrystalMaker... 3333 Single-Crystal

Single-Crystal Diraction Diraction ... 3434 Index ...35 Index ...35

(3)

 T

 Table of Contents

able of Contents

Chapter

Chapter 1: 1: Getting Getting Started Started ... 11 Using this

Using this Guide Guide ... 11 Interface

Interface Reference Reference Convention Convention ... 22 System

System Requirements Requirements ... 22 Installation

Installation ... 22  What is Cr

 What is CrystalDiract? ystalDiract? ... 33 CrystalMaker Inte

CrystalMaker Integration gration ... 66 Chapter

Chapter 2: 2: CrysCrystalDiract talDiract Interface Interface ...7..7  Window Design ...

 Window Design ... 77 Displaying a Diraction

Displaying a Diraction Pattern Pattern ... 77 Scrolling and

Scrolling and Zooming Zooming ... 99 Measuring

Measuring a a Pattern...Pattern... 1010 Output

Output ... 1010 Help and

Help and Updates Updates ... 1010 Chapter

Chapter 3: 3: Simulating Simulating Diraction Diraction ... 1111 Calculating the

Calculating the Pattern Pattern ... 1111 Radiation

Radiation TType...ype... 1212 Diraction

Diraction Modes Modes ... 1212 Peak-Shape

Peak-Shape Functions Functions ... 1414 Peak

Peak Widths Widths ... 1515 Editing

Editing Structural Data Structural Data ... 1616 Interactive

Interactive Parameter Parameter Control Control ... 1717 Mixtures

Mixtures ... 1919 Viewing Diraction

Viewing Diraction Data Data ... 2020 Chapter

Chapter 4: 4: WWorking orking with with Patterns Patterns ... 2121  W

 Working with Observed Data...orking with Observed Data... 2121 Managing Multiple P

Managing Multiple Patterns atterns ... 2323 General Plot Settings

General Plot Settings... 2525 Individual P

Individual Pattern Settattern Settings ings ... 2626 Customizing your W

Customizing your Workspace orkspace ... 2828 Chapter

Chapter 5: 5: Printing Printing & & Saving Saving ... 2929 Saving Y

Saving Your Woour Work rk ... 2929 Saving

Saving Preferences Preferences ... 2929 Exporting

Exporting Data Data ... 2929 Printing

Printing ... 3030 Chapter

Chapter 6: 6: TToolbar oolbar Reference Reference ... 3131 Chapter

Chapter 7: 7: e e CrystalCrystalMaker Maker ®®Oce ...33Oce ...33

Introduction

Introduction to to CrystalMaker...CrystalMaker... 3333 Single-Crystal

Single-Crystal Diraction Diraction ... 3434 Index ...35 Index ...35

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1 1

Using this Guide

Using this Guide

 is User’s Guide should pr

 is User’s Guide should provide a very ovide a very  comprehensiv

comprehensive outline of the e outline of the major programmajor program

features. We don’t expect you to read it from features. We don’t expect you to read it from cover-to-cover, but would recommend the following key  to-cover, but would recommend the following key  sections:

sections:

••  A A  should browse  should browse Chapter 2:Chapter 2: CrystalDiract Interface 

CrystalDiract Interface .. Tis is designed to give you

Tis is designed to give you a quick orientation toa quick orientation to the program; the interface changes from version the program; the interface changes from version to version, and will certainly be dierent to other  to version, and will certainly be dierent to other   programs you may hav

 programs you may have used, so it’e used, so it’s important ts important too  get your bearings ea

 get your bearings earlier, rlier, rather trather than later! han later!  •

• I I         , , we we strongly strongly 

recommend that you complete the Tutorial, recommend that you complete the Tutorial,  which is available from CrystalDiract’s Help  which is available from CrystalDiract’s Help

menu. menu.

Te series of short, structural exercises is designed  Te series of short, structural exercises is designed  to illustrate some of the

to illustrate some of the most important programmost important program  features and should address most of t

 features and should address most of the queries that he queries that   you might have when using the

 you might have when using the software.software.  e User’s Guide d

 e User’s Guide describes the program interface,escribes the program interface, followed by sections

followed by sections on simulating diraction, how on simulating diraction, how  to put data

to put data intointo the program—then describingthe program—then describing display and manipulation, before nishing with display and manipulation, before nishing with how to get data

how to get data out out of the program: printing andof the program: printing and exporting data.

exporting data.

Searching for

Searching for TTopicsopics

 W

 We have tried to provide a coe have tried to provide a comprehensive yemprehensive yett logically-structured guide. If you need to logically-structured guide. If you need to ndnd specic information, here are some s

specic information, here are some suggestions:uggestions: 1.

1. is is guide guide includes includes aa able of Contents able of Contents (at the(at the beginning) and an

beginning) and an Index  Index (at the end).(at the end). 2.

2. If you If you are viewing the are viewing the guide electronicaguide electronically, lly, youyou can click on the

can click on the Contents Contents oror Index  Index page entriespage entries to go directly to the

to go directly to the corresponding pages.corresponding pages. 3.

3. If you If you need to need to search for a search for a keyword keyword or phrase,or phrase,  you should be able to use the

 you should be able to use theSearchSearch commandcommand

in a PDF viewer such as Adobe (Acrobat) in a PDF viewer such as Adobe (Acrobat) Reader or Apple Preview.

Reader or Apple Preview.

A Note a

A Note about the Demonstration Versionbout the Demonstration Version This User’s Guide is designed for the

This User’s Guide is designed for the Full-Feature versionFull-Feature version of CrystalDiffract. If you are using the free,

of CrystalDiffract. If you are using the free, DemonstrationDemonstration Version

Version, som, some features e features may not be may not be available:available: •

• The Demonstration The Demonstration VVersion is designed to giversion is designed to give you ae you a favour 

favour of the full program, using a range of of the full program, using a range of examplesexamples structures. However, you cannot save les, record structures. However, you cannot save les, record program settings, or specify preferences.

program settings, or specify preferences. •

• The Demonstration The Demonstration version version does not does not let you let you importimport observed data les (although you can read such data if  observed data les (although you can read such data if  they have been saved in a diffraction

they have been saved in a diffraction experiment).experiment). If you

If you are using are using the Demonstratthe Demonstrat ion ion VVersion, wersion, we e stronglystrongly recommend that you explore the

recommend that you explore the saved diffractionsaved diffraction experiments provided:

experiments provided: these demonstrate a these demonstrate a range of range of  features that are possible with the full version of the features that are possible with the full version of the program.

program.

Chapter 1: Getting Started

Chapter 1: Getting Started

 W

 W

elcome to CrystalDiract:

elcome to CrystalDiract:

a program design

a program design

ed to make pow

ed to make pow

der diraction intu

der diraction intu

itive,

itive,

interactive, and perhaps even fun! We hope you nd this program useful and entertaining.

interactive, and perhaps even fun! We hope you nd this program useful and entertaining.

 is part of the Us

 is part of the Us

er’s Guide

er’s Guide

is designed to give

is designed to give

a quick overview of what the program is,

a quick overview of what the program is,

its scope, plus information on how to install the program, followed by tips on using the rest

its scope, plus information on how to install the program, followed by tips on using the rest

of this User’s Guide.

of this User’s Guide.

Chapter 1: Getting Started Chapter 1: Getting Started

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2

2 Chapter 1: Getting StartedChapter 1: Getting Started

Interface

Interface

Refer

Refer

ence Convention

ence Convention

In the following chapters we refer to elements of  In the following chapters we refer to elements of  the program’

the program’s interface (such s interface (such as button names,as button names, menu commands and keys on your keyboard) using menu commands and keys on your keyboard) using aa typewriter fonttypewriter font..

 Y

 You will also encounter many rou will also encounter many references to menueferences to menu commands written in an abbreviated manner, such commands written in an abbreviated manner, such as “

as “Edit > CopyEdit > Copy”, which means “from the”, which means “from the EditEdit

menu choose the

menu choose the CopyCopy command”.command”.

Mac & PC Shortcut Keys

Mac & PC Shortcut Keys

Mac and Windows operating systems use

Mac and Windows operating systems use dierentdierent key combinations for menu

key combinations for menu shortcuts (“acceleratorshortcuts (“accelerator keys”). In this guide we make repeated reference to keys”). In this guide we make repeated reference to

command

command andand optionoption keys, which are included onkeys, which are included on

the standard Mac keyboard Windows users should the standard Mac keyboard Windows users should use the following translation:

use the following translation:  Mac

 Mac Windows Windows 

c

coommmmaanndd ccoonnttrrooll o

oppttiioonn aalltt

System

System

Requir

Requir

ements

ements

 T

 To run CrystalDiract on a Mac, o run CrystalDiract on a Mac, you will requireyou will require Mac OS X 10.4 “Tiger” , 10.5 “Leopard”, 10.6 Mac OS X 10.4 “Tiger” , 10.5 “Leopard”, 10.6 “Snow Leopard”, or 10.7 “Lion”.

“Snow Leopard”, or 10.7 “Lion”.  T

 To run CrystalDiract on a PC, yo run CrystalDiract on a PC, you will requireou will require Microsoft Windows XP (Ser

Microsoft Windows XP (Service Pack 2), vice Pack 2), Vista orVista or  Windows 7.

 Windows 7. e program will not run on earliere program will not run on earlier  versions of Windows,

 versions of Windows, such as NT or 2000.such as NT or 2000.

Installation

Installation

Mac and Windows versions have

Mac and Windows versions have dierentdierent installation procedures:

installation procedures:

•• MacMac installation is a simple matter of dragging-installation is a simple matter of

dragging-and-dropping the CrystalDiract application and-dropping the CrystalDiract application from the CD-ROM, to your hard disc (e.g., to from the CD-ROM, to your hard disc (e.g., to  your

 your Applications  Applications folder).folder). As a

As a modern Mac application, CrystalDiract modern Mac application, CrystalDiract  includes all its essential resources (including online  includes all its essential resources (including online  help and this

help and this User’User’s Guide), neatly packaged withins Guide), neatly packaged within the application “bundle”.

the application “bundle”.

We would also recommend that you copy the We would also recommend that you copy the  Examples Files 

 Examples Files to your hard disc—possibly toto your hard disc—possibly to  your own

 your own Documents Documents folder.folder.

•• WindowsWindowsusers will need to run the installerusers will need to run the installer

program.

program. is gives the is gives the option of installingoption of installing the essential

the essential program les (application, onlineprogram les (application, online help, user’s guide), plus supporting resources help, user’s guide), plus supporting resources (examples les).

(examples les).

Licensing your Installation

Licensing your Installation

 e rst time you launch CrystalDiract you are  e rst time you launch CrystalDiract you are

prompted to personalize your copy of the program. prompted to personalize your copy of the program.  is process also creates a pre

 is process also creates a preferences le.ferences le.

Registering Your Licence

Registering Your Licence

It is very important that

It is very important that your licence is registeredyour licence is registered  with us,

 with us, as we can only provide teas we can only provide technical supportchnical support (and upgrades) to registered users.

(and upgrades) to registered users.  Y

 You can register when you install the software,ou can register when you install the software, by clicking the

by clicking the RegisterRegister button in the reminderbutton in the reminder

dialog that appears following your install

dialog that appears following your installation.ation.  Alternatively

 Alternatively, , you can register lateryou can register later, , by choosing theby choosing the

Help > Register CrystalDiffract

Help > Register CrystalDiffract command.command.

Multi-User Licence Registration

Multi-User Licence Registration

We only require one registration per licence. So, if you We only require one registration per licence. So, if you have a multi-user licence, such as a Research Group, have a multi-user licence, such as a Research Group, Classroom or Site L

Classroom or Site L icence, only the ofcial “keeper”icence, only the ofcial “keeper” of the licence

of the licence needs to register needs to register with us. Owith us. Once we havence we have received that registration, the other users are entitled to received that registration, the other users are entitled to receive technical support, within the terms of the

receive technical support, within the terms of the specicspecic licence.

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3

What is CrystalDiffract?

CrystalDiract is a program for understanding diraction properties of crystals: specically, where a

powdered crystal sample (comprising millions of tiny crystallites ) is exposed to a radiation beam, resulting in patterns of 

scattered intensity, which can be recorded as lines on a lm, or as intensity peaks by a detector. CrystalDiract diers from its sister program, SingleCrystal, which is designed to simulate

diraction patterns from a one, single crystal, when exposed to x-rays, neutrons or electrons.

CrystalDiract can simulate the key powder diraction techniques used today, including

traditional single (or dual-) wavelength X-ray and neutron scattering, plus newer white radiation (energy-dispersive) and time-of-ight techniques. CrystalDiract lets you manipulate diraction patterns in real time, changing sample and instrumental parameters such as peak widths,  wavelength, particle size and strain. You can

measure intensities and distances on screen, compare patterns from dierent materials in the same window, and simulate multi-phase mixtures. For the experimental scientist, CrystalDiract lets you load observed data, for easy comparison  with simulated data: an ideal way to characterize

materials or interpret the results of synthesis experiments.

Finally, CrystalDiract lets you print your

diraction patterns, or export them in a range of  data formats.

Crystalline Materials

 e starting point for simulating a diraction pattern is a crystal structure: the unique

arrangement of atoms inside a basic building brick, or “unit cell” of material. Crystals typically contain billions of unit cells, neatly stacked in a three-dimensional lattice.

 A crystal structure is derived f rom a basic unit that is tiled  in three dimensions to form an extended crystal lattice. It is the very regularity of such structures that allows diraction in the rst place. e precisely-oriented planes of atoms, repeated almost ad 

innitum, provide miniature diraction gratings for  X-ray or neutron radiation.

 A tiny section through the crystal lattice of sodium chloride  (“halite”, or “rock salt”). Here we see a regular arrangement  of chlorine ions (green) and sodium ions (yellow).

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4

N(hkl)

θ θ θ θ θ t      t

(hkl)

d

1

1

2

2

Consider a crystal with a set of planes, (hkl), shown here in blue. The interplanar spacing is denoted by d, and the plane normal is N(hkl). If a beam of monochromatic radiation (wavelength l), shown here in red, strikes these planes at a glancing angle, q, then constructive interference between adjacent wavelets➀ andoccurs when their path difference (t + t) is equal to an integral number of wavelengths.

Thus, n l = 2 t where: t = d sin q hence, n l = 2 d sin q (the Bragg Equation).

Derivation of the Bragg Equation

Why use Powder Diffraction?

Powder diraction has a number of advantages over single-crystal techniques. Sometimes it is dicult to nd (or grow) good quality single crystals, whereas powders are much easier to manage. Single-crystal diraction (using X-rays or neutrons) is quite an arduous process, requiring precise orientation of the sample (or, in the case of  electron microscopy, specially-prepared, thin crystal akes). Data collection tends to be very slow, as individual scattered beams are measured (although new, area detectors, are making this faster).

 With powder diraction, one has the advantage of speed and convenience. A powdered sample has multiple “crystallites” and, assuming these are randomly distributed, at least one crystal will be oriented correctly to cause diraction. Data collection times tend to be faster, since only a “one-dimensional” pattern is being collected.

 e most-important powder diraction techniques—which can be simulated by  CrystalDiract—are described below.

Monochromatic Radiation

In most laboratory sources, X-rays are generated by  ring a beam of electrons at a metal target—usually  copper (Cu) or molybdenum (Mo). A characteristic  X-ray spectrum is emitted, which is ltered, so that

only the strongest, Cu K a peak emerges (this is actually a doublet, comprising K a1and K a2peaks, although sometimes the weaker, K a2peak is also ltered out). is monochromatic radiation is then directed at the specimen.

One typically moves the beam, relative to the sample, scanning through a range of angles,q.  ere is a reciprocal relationship betweenq, and

inter-planar distances in the crystal (“d-spacings”),  which give rise to diraction peaks. is is

summarized in the famous Bragg Equation:

l= 2d sin q

 which provides the condition for coherent

scattering of the radiation (wavelengthl), directed at an angle q(the Bragg Angle) with respect to the d-spacing of a set of planes in the crystal.

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5

By measuring scattered intensity as a function of  scattering angle, one is in eect measuring the scattering strengths of dierent sets of planes (with dierent d-spacings) inside the crystal. Ultimately, this scattering strength is controlled by the

arrangements of atoms in dierent directions in the crystals—and hence one can learn something about the crystal structure from its diraction properties.

White Radiation

Many diraction experiments are carried out at synchrotron sources. Here, charged particles are accelerated to relativistic speeds, and emit x-rays as they travel around a curved beam path. So-called “White Radiation”, comprising a broad spread of wavelengths, can be generated; this is useful in diraction experiments because it allows rapid measurements, without the need to mechanically  scan a detector over a range of angles. An energy-dispersive detector records the scattered intensities as a function of energy (and hence wavelength).

Time-of-Flight Diffraction

Some diraction experiments use pulses of  neutrons with a range of energies. ese travel at dierent speeds, depending on the energy of the neutrons, and are directed down a long “beam line” towards a powder sample.

Diraction is recorded by neutron detectors arranged around the sample, at a xed two-theta angle (2q). e number of pulses is recorded as a function of the time-of-ight of the

neutrons (which is typically in the range of a few  milliseconds to several hundred milliseconds).  As for energy-dispersive diraction, an extended

diraction pattern can be recorded at a xed Bragg angle because the sample is subjected to neutrons of dierent energies, and hence wavelengths.

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6

CrystalDiract works with CrystalMaker (left) letting you visualize crystal structures and simulate their diraction  properties—in various experimental modes—in comparison with other patterns and observed data.

CrystalMaker Integration

If you would like to be able to build  your own crystals which you can load

into CrystalDiract, you will require CrystalMaker®: an award-winning program for building, displaying, manipulating and animating all kinds of crystal and molecular structures.

CrystalMaker provides seamless display of data les from major databases and supports a wide  variety of le formats. Just drag-and-drop a text le

into CrystalMaker for automatic format detection and structure display.

CrystalMaker lets you display a structure then,  with a single menu command, see its diraction

pattern appear in CrystalDiract.

Further information about CrystalMaker is given at the end of this guide, or you can  visit crystalmaker.com and download a free

Demonstration Version.

Although CrystalDiffract allows you to edit some a spects of a cr ystal’s structure (e.g., lattice parameters and

site occupancies), it does not allow you to edit atomic coordinates or to build new structures.

We believe that the best way to edit these structures is via a CrystalMaker: this allows you to actually see the structure, so you can check that the coordinates and/or symmetry settings are reasonable, before you proceed to generate diffraction patterns.

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7

Chapter 2: CrystalDiffract Interface

 is chapter provides a basic introduction to CrystalDiract’s user interface, including how 

to load a diraction pattern and manipulate it.

Window Design

CrystalDiract has a single-window program interface with a toolbar, and a Graphics pane for plotting your diraction patterns. Additional panes are available for displaying lists of Patterns or

Parameters.

Toolbar  At the top of each window is a toolbar  with buttons/icons for measuring and manipulating

diraction patterns (see Chapter 7: oolbar Reference  for a description of the individual controls).

Mac users can toggle the toolbar on or o by  clicking the lozenge-shaped button, on the right-hand side of the window’s titlebar.

Graphics Pane  At the centre of the window 

is the Graphics pane, where diraction patterns are plotted. Below this is a scrollbar for moving through the x -axis range, and an Info Bar which displays cursor- or status information.

Parameters List  is is a list of

experimental-and sample parameters, grouped into folder-like categories. You can edit parameters interactively, using a slider control, and observe how the diraction pattern changes.

Patterns List Each window can display a list

of diraction patterns. You can drag text les, CrystalMaker binary les and folders into this list.  e corresponding patterns can be displayed in the

Graphics pane by clicking checkboxes.

Displayed patterns can be selected by clicking on their Patterns List entries. Selection allows you to edit individual patterns, and move them relative to the rest of the display.

 You can resize the Patterns List by clicking-and-dragging the drawer edge (Mac) or the pane divider (Windows).

Displaying a Diffraction Pattern

CrystalDiract can read from three kinds of  les: text les, crystal structure les, and saved diraction session les.

To load a le in a new window:

Do one of the following:

• Drag-and-drop a le onto the CrystalDiract application icon;

• Launch CrystalDiract, then drag-and-drop a le into the window that appears.

• In CrystalDiract, chooseFile > Open then

use the le dialog to specify the le(s) to be opened.

• Drag-and-drop a le into the Patterns List, then click the new entry’s checkbox;

To open a le in an existing window:

Do one of the following:

• Choose:File > Open in Same Window.

• Drag-and-drop your le(s) into the window. Data will be added in the form of one or more new diraction patterns.

Crystal Files

 You can simulate a diraction pattern for a crystalline material, by supplying a CrystalMaker “crystal” le (le type

CMDF, extension.cmdf or .crystal).

CrystalDiract will use structural data from the le to generate a diraction pattern.

Please note that Demonstration Mode restricts you to reading only the latest CrystalMaker binary le format. However, the full-feature version can read from older les.

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8

Te CrystalDiract-for-Windows interface, showing diraction patterns in “Film” mode 

Toolbar Parameters List Graphics Pane Patterns Drawer Info Bar Parameters Palette Patterns List

Te CrystalDiract-for-Mac program interface, showing calculated and observed diraction patterns 

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9

Text Files

 You can load an observed diraction pattern, as a plain text le (le type

TEXT, extension.txt or .dat). e

le should contain an xy listing of   your diraction points (where the y   value is the intensity), with one point per line.

Session Files

 e third type of le that

CrystalDiract can read is its own “session le” format (letypeCRDF,

extension.crdf or .crystaldiffract).

 A session le is a saved diraction experiment,  which represents a complete record of your work in

a particular window, with one or more diraction patterns, including structural data (for simulated patterns) and intensities.

Sharing Data With CrystalMaker 

 You can also provide crystal structure data directly from within CrystalMaker, via that program’s Transform > Powder Diffraction

submenu. Simply view and edit your structure in CrystalMaker; choose the relevant menu

command, and then observe the diraction pattern in CrystalDiract.

Use CrystalMaker to visualize (and verify!) the structure  before you proceed to simulate its diraction properties.

Scrolling and Zooming

 You can use the horizontal scroll bar to quickly  scroll through a diraction pattern. For ner control, choose the Hand tool from the toolbar then click and drag the pattern.

 You can adjust the range of x-axis values by using the Zoom tool to zoom in or out around a clicked point. To enter an explicit range, use the Plot > Plot Limits command.

Arrow Hand Zoom Distance

CrystalDiract’s tool buttons 

Scaling Commands

 e Toolbar includes a number of scaling tools that can be used to adjust the x - and y -axis ranges. You can adjust the x - and y -axis scales, and auto-scale the y (intensity) axis, or both the x - and y -axes (the latter option attempts to t the entire diraction pattern range inside the Graphics pane).

x-scale y-scale

auto-scale y

auto-scale x & y

CrystalDiract’s axis scaling tools 

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Measuring a Pattern

 e Arrow tool allows you to measure points on the simulated diraction pattern. Choose this tool from the Toolbar, then click in the Graphics pane so that a vertical cursor appears. Information about the current point is displayed in the Info Bar at the bottom of the window.

Using the Arrow tool to measure a diraction peak  You can move the vertical cursor by clicking and

dragging it with the Arrow tool (note that when the Arrow tool is placed over the vertical cursor, the mouse pointer changes to a double arrow ( ) to indicate that dragging is possible).

Indexing a Pattern

 You can display peak labels for a selected diraction pattern using the Pattern menu.

Labels can contain any combination of Miller Indices, d-spacings, x-values, and so on. e Peak Threshold setting denes a minimum intensity 

 value, below which no labels will be displayed is is useful for complex diraction patterns which may have many low-intensity peaks.

Output

CrystalDiract provides a range of data output options, via the File > Export submenu. ese

include exporting a complete diraction pattern, at user-dened resolution; a diraction data report (Miller indices, d-spacings, intensities, multiplicities, etc.), or a table of Structure Factors.  You can also save a diraction experiment as a

self-contained “Session File”, you can print, and you can record your favourite settings in a Preferences le.

Printing 

 e full version of CrystalDiract lets you print high-resolution diraction patterns, which are scaled to t your chosen page size.

Saving Preferences

CrystalDiract uses default settings for the window  size, diraction mode, plot styles, etc. Although  you can edit these for individual windows, the

default settings are used whenever a new window is created, or when you start up the program.

 You can view and edit the current program settings using a tabbed preferences dialog. To display this, choose thePreferences menu command. When

 you have nished making your changes, click the dialog’s Save button; your settings will then be

available for any new windows, and are saved in a preferences le, ready for your next session.

• To restore the program’s “Factory” settings, click the dialog’s Restore Factory Settings

button.

• To apply any saved preferences to the current  window, use the Apply Preferences menu

command.

Help and Updates

Most controls have tool tips associated with them. For detailed help, choose theHelp >

CrystalDiffract Help command. Help les are

displayed in a Help Viewer application (Mac) or  window (Windows). We also include a number of 

support topics on our website, and links to these are included on the program’s Help menu.

Checking for Updates

 We regularly provide free, incremental program updates. ese include new features, interface enhancements and occasional bug xes. You can check whether an update is available using the

Help > Check for Update command.

 ere is also an option to let the program check  for updates automatically (Help > Check for Updates Automatically); the program will check 

at weekly intervals, and alert you if a newer version of the software is available. You can then download this from our website.

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Chapter 3: Simulating Diffraction

 e Diract menu lets you alter aspects of a “virtual” diraction experiment, such as the

radiation type, the experiment type (angle- or energy-dispersive), and various instrumental

parameters.

Calculating the Pattern

CrystalDiract calculates diraction patterns using the types, and positions, of atoms in a unit cell of  a crystal. e program assumes an ideal structure (although you can specify an isotropic strain). Site occupancy data and atomic displacement parameters are used to determine the amount of  scattering from each site. CrystalDiract uses atomic scattering factors (x-ray diraction) or neutron scattering lengths for the atoms in your structure.

Editing Scattering Factor Data

CrystalDiract uses a table of atomic scattering factors and neutron scattering lengths, saved as a text le called “ ASF.dat”.

CrystalDiract-for-Mac saves the ASF.dat le

inside the application bundle. To view the contents of the application package, control-click on the CrystalDiract program icon and choose the Show Package Contents command from the popup

menu that appears.

Locating the package contents 

CrystalDiract-for-Windows has the ASF.datle

saved in the Application Data folder.

 You can edit the ASF.datdata le if you wish to

modify or add new data. e format is very simple. Each data line should contain:

• a two-character element symbol (which CrystalDiract will match with element symbols in your structure);

• nine numbers correspond to the atomic scattering factor coecients a 1 b12 b23b34b4c listed in the International Tables for Crystallography;

• one number, corresponding to the coherent nuclear scattering length for that element.  e data le can also contain comments: these

should be prefaced by an exclamation mark “!”.

Note: the ASF.dat le must be a text-only le with le type TEXT. If you edit the le in a word processor, you should ensure that it is saved in a text-only format.

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Simulation Preferences

 To speed up the simulation of diraction data (e.g., for massive structures such as proteins),  you can suppress all reexions below a minimum

d-spacing. You can also limit the maximum number of reexions (so that only those with the highest d-spacings are used).

To set your simulation preferences:

1 Choose:CrystalDiffract > Preferences

(Mac), or Edit > Preferences (Windows).

2 Navigate to the Prole tab.

2 In the Generate Reexions group, set the Minimum d-spacing eld, enable theLimit number to option and enter a maximum number

of reexions.

3 Click theSave button to store your new settings.

 ese will apply to any new windows.

Te Prole pane of the Preferences dialog 

Tip: If you have edited your Preferences and wish to apply the changes to an existing window, choose the

 Apply Preferences command, available from the CrystalDiffract menu (Mac) or the Edit menu (Windows).

Radiation Type

 You can use the Diffract menu to switch between

 x-ray or neutron diraction. e diraction pattern is recalculated, using x-ray scattering factors or neutron scattering lengths that are stored with the program.

Diffraction Modes

CrystalDiract can simulate a number of  experimental types, which cover the main techniques for powder diraction:

 Angle-Dispersive Diffraction

 Traditional laboratory diractometers operate using constant radiation wavelength, with

diraction measured as a function of Bragg Angle (theta,q). is is called angle-dispersive diraction. CrystalDiract allows you to simulate

angle-dispersive diraction, plotting diracted intensity  as a function of: 2q, d-spacing, or reciprocal

d-spacing.

 You can specify the wavelength using the

Diffract > Wavelength command.

Te Wavelength sheet showing CuK a1and K a 2 radiation  e Wavelength sheet lets you specify 

monochromatic (single-wavelength), or dual- wavelength radiation. Traditional laboratory x-ray 

tubes typically maximise intensity by emitting dual  wavelengths, e.g., Cu K a1and K a2lines.

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Energy-Dispersive (EDS) Diffraction

 A relatively-new type of diraction involves using ‘white’ radiation that has a spread of wavelengths.  e Bragg equation relates wavelength (l) to the

d-spacing of a set of lattice planes, and the Bragg  Angle (q

):-l= 2d sin q

If lcan be varied, then diraction from a range of  d-spacings can be recorded at the same q angle. It is therefore not necessary to mechanically scan a detector through a range of q/2q angles. However, in order to resolve diraction from dierent

d-spacings, the stationary detector must be able to discriminate between scattered radiation of  dierent wavelengths.

Since the wavelength of radiation is related to its energy, an energy-dispersive detector can be used to record an extended diraction pattern as a function of energy. You can specify a 2q value for this experiment, using the Diffract > Energy

command.

Time-of-Flight Diffraction

Some neutron diraction experiments use yet another kind of diraction: a neutron spallation source creates pulses of neutrons with a range of  energies. ese travel at dierent speeds, depending on the energy of the neutrons, and are directed down a long “beam line” towards a powder sample. Diraction is recorded by neutron detectors

arranged around the sample, at a xed two-theta angle (2q). e number of pulses is recorded as a function of the time-of-ight, t , of the

neutrons (which is typically in the range of a few  milliseconds to several hundred milliseconds).  As for energy-dispersive diraction, an extended

diraction pattern can be recorded at a xed Bragg angle because the sample is subjected to neutrons of dierent energies, and hence wavelengths.  We can analyse the time-of-ight process by 

combining De Broglie’s hypothesis,

l= h / mn vn

Te ISIS neutron spallation source at the Rutherford-Appleton Laboratory, near Oxford, England. Neutrons are directed  along beam lines, arranged radially, around the target (the cur ved light-blue chamber in the centre of the photo). ime-of- ight diraction is used at one such beam line, the High-Resolution Powder Diractometer (HRPD).

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(where h is Planck’s constant, mn is the neutron mass and vn is its velocity)

 with Bragg’s Law, thus:

l= h / mn vn = 2 d sinq

Now, given a primary ightpath (the distance from the moderator to the sample) of L1and a secondary ight path (sample to detector) of L2, and corresponding times of ight t 1 and t 2, we have:

vn= (L1 + L2) / (t 1+ t 2) = L / t 

 where L is the total ight path and t is the total time-of-ight. thus,

h t / mn L = 2 d sinq

hence:

t = 2 d L (mn/h) sinq

 us, we have a linear relationship between the total time-of-ight, t , and the overall ight path, L. is is why the highest-resolution neutron diractometers have the longest ight paths (e.g., ~100m at the HRPD instrument in the Rutherford-Appleton Laboratory).

CrystalDiract lets you specify the overall ight path, L, as well as the two theta value for the diraction experiment, using the

Diffract > Time-of-Flight command.

Peak-Shape Functions

In an ideal diraction experiment, the shape of a diraction peak would be determined solely by the sample, reecting its mean particle size, particle shape and structural state (including strain). In practise, for most samples the shape of  diraction peaks is mainly determined by the diraction technique and geometry. For example, neutron diraction experiments tend to result in peaks with a Gaussian shape, whilst synchrotron diraction may result in a Pseudo-Voigt peak  shape.

CrystalDiract’s Diract menu lets you choose between dierent shape functions:

• Delta Function • Lorentzian • Gaussian • Pseudo-Voigt

 e Delta Function is simply a “spike” of zero  width. is provides a very quick way of showing

the positions of many peaks in a complex pattern.  e Lz function has a distinctive splayed

appearance: peaks having very wide tails, like the mouth of a trumpet.

 e G function is shaped like the prole of a church bell, with a more rounded appearance

Gaussian (top) and Lorentzian (bottom) proles for the  same diraction peak. Notice the lower peak maximum for  the Lorentzian prole, with its intensity distribution spread  over a wide range of x values.

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than the Lorentzian function, and with less extensive “tails”.

Finally, the P-V function is a mix

between the Gaussian and Lorentzian functions. It is characterized by a mixing parameter, E , which determines the Lorentzian character of the nal

function:-Result = E × Lorentzian + (1 – E ) × Gaussian  You can edit the E parameter using theDiffract

> Eta command, and entering a new value in the

sheet or dialog that appears.

Peak Widths

 e limited resolution of a diraction experiment may result in diraction peaks that are substantially  broadened. For most practical experiments,

this “instrumental broadening” is the major

contribution to the widths of observed diraction peaks.

CrystalDiract lets you specify the amount of  instrument broadening, in terms of the full width at half-maximum for a diraction peak. (e units depend on the current choice of x -axis: two-theta, d-spacing, reciprocal-d, energy in keV, or time-of-ight in milliseconds.)

Particle Size Broadening 

 e width of a diraction peak also depends on crystal size. is is a reciprocal relationship, so for large crystals there is very little peak broadening, but for very small crystals (fractions of a micron in diameter), diraction peaks can become noticeably  broadened.

In a powder sample, we normally refer to a mean particle size, and this can be simulated using the

Diffract > Particle Size command.

Strain Broadening 

 A strained crystal can be thought of as containing regions with slightly dierent unit cell dimensions. In fact, there is likely to be a continuous spread of unit cell dimensions throughout the sample, resulting in a diraction pattern with a slightly  “blurred” appearance.

 e amount of strain in the sample can be summarized by a “percent strain”. is is the standard deviation for the variation of cell

parameters in the sample (in an ideal crystal there  would be one unique cell parameter, whereas

in a strained crystal there might be a normal

distribution of cell parameter values, characterized by a standard deviation, ranging from zero for the ideal crystal to a few percent for a very-highly  strained crystal).

Use theDiffract > Percent Strain command

to specify a value for the strain.

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Editing Structural Data

CrystalDiract lets you edit aspects of a selected  pattern’s underlying crystal’s structure, so you can determine how this aects diraction. You can edit lattice parameters and site occupancies—and also omit sites from the diraction calculation.

Edit Crystal Sheet

Choose the Edit > Crystal command to display 

the Edit Crystal window. Lattice parameters are shown at the top, with a scrolling list beneath, showing all sites in the crystal’s asymmetric unit. Each site row has a checkbox, which denes  whether or not that site will be included in the

intensity calculation. You could, for instance, decide to “turn o ” certain sites, so as to determine their inuence on the nal diraction pattern.

 You can edit site occupancies by typing a formula into theSite Occupancy eld. You can enter up

to three element symbols and their corresponding occupancies. e total occupancy must not exceed 1.0. For example, you might enter something like:

Si 0.7 Al 0.3

or: Ca 0.56 Mg 0.41 Al 0.03

 e remaining elds cannot be edited. ey show  the atom’s fractional coordinates (xyz) and, if  available, the atomic displacement parameter data (anisotropic values and isotropic values).

 To view the atomic displacement parameters,  you may need to resize the sheet, by clicking

and dragging its size box. Alternatively, use the horizontal scrollbar to show the atomic displacement parameter elds, as the example opposite shows.

 You can sort your data by clicking on a column header. Click again to reverse the sort order. You can also move columns, by clicking-and-dragging their column headers.

 When you have nished your editing session, click  the OK button to replot the diraction pattern.

Tip: You can visualize atomic displacement parameters a s “thermal ellipsoids”, using recent versions of CrystalMaker.

Te Edit Crystal sheet can be resized horizontally and vertically, in order to show a range of sites and their atomic  displacement parameter data (Uij and Uiso)

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Interactive Parameter Control

 e Edit Crystal window lets you change multiple site occupancies and/or cell parameters, with the diraction pattern subsequently recalculated. A more interactive way of editing the structure is to use the Parameters List to gradually change one structural variable (e.g., unit cell angle) whilst the diraction pattern is replotted in real time.

 To show the Parameters List, click the Toolbar’s

Parameters button:

 Alternatively, choose:Window > Show

Parameters List; or (with the Graphics pane

focussed) press the p key on your keyboard.

Parameter Groups

 e Parameters List contains a series of 

hierarchical entries, each with its own disclosure triangle, and representing dierent aspect of the diraction experiment:

 Angle Dispersive

 is lets you interactively change the wavelength for a traditional, angle-dispersive (monochromatic radiation) experiments.

Energy Dispersive

If you have chosen an energy-dispersive simulation mode, then you can interactively change the

two-theta angle for your sample/detector geometry.

Time-of-Flight

For neutron diraction, in the time-of-ight simulation mode, you can interactively change the two-theta angle (for the sample/detector geometry) and the overall neutron ight path length.

Instrument

 is group lets you change aspects related to  your simulated diraction apparatus: the peak   width (instrumental peak broadening), the “Eta”

parameter—which controls the peak shape, if a “pseudo-Voigt” prole has been chosen—and the zero correction.

If you are working with observed data, then you can also adjust the relative scaling (Scale Factor) between observed and calculated datasets. For example, if you have an observed dataset whose intensity range is from zero to 1000, and your calculated pattern has intensities from zero to 1, then you would want to scale your observed pattern by a factor of 0.001.

Using the Parameters List  to simulate an orthorhombic  distortion (red pattern) in a   previously-tetragonal crystal 

(blue pattern).

Te distortion (a ≠ b) has  caused peak splitting (e.g., 400 and 040).

Clicking and dragging the  slider thumb continually  changes the highlighted  variable (the b cell edge  length) and replots the  diraction pattern in real  time.

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Background

CrystalDiract lets you apply a basic background function to your calculated patterns. is function has the form: A + Bx + C/x. e individual

parameters, A, B and C, can be adjusted interactively.

Sample

 e full-feature version of CrystalDiract lets you simulate the eect of Particle Size and (isotropic) strain.

Mixture

If you have a multi-phase mixture (of calculated patterns), you can adjust their relative proportions using the Mixture group (this is discussed more in the next section).

Unit Cell

 You can interactively edit the unit cell parameters (edge lengths, a, b, c; angles a,b,g) for a selected  calculated pattern, using this group.

Please note that CrystalDiract does not perform an energy minimizations of the structure; one is simply  “deforming” the unit cell, whilst keeping atoms in their  existing sites, as dened by their fractional coordinates.  Nevertheless, this is a useful range of settings when

assessing the eect of a phase transition on the  diraction properties.

Site Occupancies

If a calculated pattern is selected, then you can interactively adjust the occupancies of its individual sites, using this group. If a particular site is

disordered (e.g., has a mixed occupancy such as  Al0.5Si0.5) then the individual occupants are listed

on separate lines.

Please note that, as with the Unit Cell adjustments, CrystalDiract does not optimize the structure 

 following any of these adjustments. However, it does let   you assess the chemical contribution to peak intensities.

Using the Parameters List

 You can open (expand) a hierarchical entry by  clicking it, or its disclosure triangle. Individual Parameter entries can then be selected with the mouse, which causes a slider bar and a text edit eld to appear below the list, allowing you to edit that item’s value. (When editing the text, press the

Enteror Return keys to replot the structure.)

Local and Global Parameters

Some Parameter entries are shown on a pink  background. ese are local parameters, which relate to the currently-selected pattern, or patterns. Examples include unit cell parameters and site occupancies.

Parameter entries shown on a grey background are global parameters, which aect all patterns, regardless of selection status. Examples include  wavelength and peak width.

Possible Applications

 e Parameters List is designed to be educational as well as functional. Here are some possible uses: • Simulating    (e.g.,

cubic→tetragonal→ orthorhombic) by  changing cell parameters and watching how  diraction peaks split.

• Simulating the eect of  

 by changing the unit cell volume (isotropic expansion/compression is assumed). • Visualizing the inuence of one 

 on the nal diraction pattern, by  dragging its site occupancy slider from 1 to 0. • Changing the    x by 

 varying the proportions of individual phases, perhaps to match an observed diraction pattern—and hence to determine its approximate composition.

• Understanding how mean  z and/or   aects the diraction pattern. • Fine-tuning a calculated diraction pattern to

  v , e.g., by changing Peak Width, Eta value, Zero Error, etc.

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Mixtures

CrystalDiract allows you to simulate mixtures  with unlimited numbers of components, simply 

using the existing patterns in your diraction

 window. You can “create” the mixture by turning on mixture mode. To do this, use the Plot > Mixture

command, or click the Toolbar’s Mix button.

oolbar Mix (left) and Unmix (right) buttons 

In Mixture mode, all calculated diraction patterns are combined into a single, calculated mixture. Similarly, any observed diraction patterns are combined into a single, “observed mixture”.

Editing Mixtures

 You can edit the relative phase proportions for calculated mixtures, using the Mixture settings in

the Parameters List. All calculated patterns are listed, and you can adjust the volume fractions for each component; as you do this, the volume fractions for the remaining components are automatically updated, to ensure that the overall sum of components is xed, at 1.

 Editing the volume fraction of Silicon in a simulated  three-phase mixture 

 To remove phases from a mixture, turn o the corresponding checkboxes in the Structures list.

Tip: The Structures list’s Actionsmenu has an

Equalize Phase Proportions command, which allows you to reset all volume fractions to equal values, with their sum total equal to 1.

 When in Mixture mode, you can continue to edit structural data for individually-selected diraction patterns, just as you might do in “Separates” mode.

Mixture Plot Settings

In Mixture mode, you can edit the plot settings, including line style, width, colour and so on— provided that at least one pattern in your mixture is selected .

If both a calculated and observed mixture are

displayed in the same window, you should carefully  check that the appropriate pattern is selected (e.g., a calculated pattern, for the calculated mixture) to ensure that the plot settings are applied to the correct mixture.

 You can choose to apply labels to diraction peaks in the mixture, in the same way that labels are applied for individual patterns. Select the patterns that you wish to label (e.g., by clicking on their entries in the Strucures list), then choose the

Pattern > Show Labels command. All peak 

labels are colour-coded by component.

Undoing a Mixture

 You can “unmix” a mixture, and restore the display  to separate diraction patterns, using thePlot > Separate command, or by clicking the Toolbar’s Unmixbutton.

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Viewing Diffraction Data

 You can quickly view a tabulated listing of 

diraction data, using the Edit > Diffraction Data command:

Te Edit Diraction Data window

 e resulting window lets you sort data, according to your chosen parameter (e.g., d-spacing or

intensity). You can opt to save the sorted listing as a text le, by clicking the Save button.

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Chapter 4: Working with Patterns

CrystalDiract allows you to mix multiple simulated diraction patterns in the same

 window. You can combine these with real, experimentally-observed data: useful for

characterizing samples, synthesis results, checking for impurities, and even basic phase

identication. You can control how individual patterns are plotted using the Plot and

Pattern menus, with choice of plot type, styles, colours, line widths, markers, labels, etc.

Working with Observed Data

 e full-feature version of CrystalDiract lets you load one or more text les in any window. ese could contain real, observed data, and you can display these will simulated (calculated) diraction patterns for easy characterization.

Loading Observed Data

Observed datasets should be saved in plain-text les. e rst line of the le should contain a title (this is ignored by CrystalDiract). Subsequent lines should contain pairs of xy values—with one datapoint per line, for example:

Title line plus xy data… 10.00 23.45

10.10 23.44 10.20 22.95 10.30 24.56 10.40 27.87

Note: If you are using the Mac version, it is important to check that the data le is a Mac le, with letype “TEXT”.

To open a le in a new window:

• Choose theFile > Open command

To add les to an existing window:

Do one of the following:

• Choose:File > Open in Same Window, or:

• Drag the les into the Graphics pane, or

• Drag the les into the Patterns List, then turn on their checkboxes.

 Applying Plot Styles

 You adjust the plot styles for observed diraction patterns, in exactly the same way as for calculated patterns: rst select the patterns you wish to change, then choose the relevant commands from the Pattern menu.

Observed & Calculated Data Compared

 When you append an observed data le to a  window that already contains calculated data,

CrystalDiract changes the relative scale setting for the observed data in order to best match the two patterns.

 You can manually control the relative scaling for a selected observed pattern, using the two y-scaling buttons on the toolbar:

Te oolbar’s Relative Scale buttons 

It is possible to reposition a selected pattern (calculated or observed), by introducing x and/ or y osets. You can use the Shift arrows on the toolbar to do this. Any osets can be reset to zero by clicking the small round button at the centre of  the arrows:

Te oolbar’s Shift controls 

 You can also use the Arrow tool to click and drag a diraction pattern, when plotted in Graph mode.

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22

Observed and calculated time-of-ight neutron diraction patterns (top graph). Te observed data are plotted as crosses, with calculated data plotted using a smooth line. Te lower graph shows the residual func tion (observed minus calculated)

Displaying the Residual Function

 When working with observed and calculated data  you have the option of displaying a separate graph

or lm showing the dierence (observed minus calculated) between the two datasets: the “residual” function. is is controlled via the Plot > Show Residual or Plot > Hide Residual commands.

 e legend for the residual graph/lm also displays the sum-of-squares dierence between the

calculated and simulated data:

error =

Σ

(obs - calc)2

 is value corresponds only to the currently-displayed plot range. It can be a useful reference  when attempting to ne-tune the calculated data in

order to match the observed data.

 ePlot > Data Style submenu allows you to

choose how the observed data are plotted (e.g., crosses, squares, lines between points, etc.).

Identifying an Unknown Substance

Being able to compare an observed diraction pattern with one or more calculated patterns for known substances can be very useful when trying to identify an unknown substance. You can load the observed diraction pattern, then add a sequence of  CrystalMaker binary les (File > Open in Same Window), until a good match is found.

 A more convenient way of comparing phases is to use the Patterns List, which is described next.

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23

Managing Multiple Patterns

 e Patterns List lets you keep track of your observed and calculated diraction patterns. New  patterns are automatically added to this list when  you load them from crystal les, observed data

les—or when you open a previously-saved session.  You can use the Patterns List to select individual

patterns, show or hide them (in the Graphics pane), rename them, duplicate them, or simply to browse individual patterns from a large list.

To Display the Patterns List:

Do one of the following:

• Click the Patterns icon in the Toolbar, or • Press the s key on your keyboard, or

• Choose the menu command:Window > Show Patterns List.

 e Patterns list may be displayed as either a slide-out drawer (Mac), or as a window pane (Windows).

Using the Patterns List

 e Patterns List can hold as many patterns as you like: you can drag les and folders—perhaps your entire CrystalMaker Structures Library—into the list. Individual patterns can be selected, and the list supports standard editing conventions, such as multiple selections (shift- and command-clicking).

To plot one or more patterns:

Do one of the following:

• Check or uncheck the pattern’s checkbox. • Select one or more pattern(s) to be plotted

or hidden, then choose the Plot or Hide

commands from the Patterns List Actions

menu.

To rename a pattern:

1 Select the pattern in the list.

2 Press the Return orEnter keys on your

keyboard (or click on the selected name).

3  When you have nished editing, pressReturn

or Enter to nish, or click outside the selected row.

(To cancel an edit, press the Escape key.)

To delete one or more patterns: 1 Select the relevant entries in the list. 2 Press the Delete key on your keyboard.

To change the colour of a plotted pattern:

• Click on the pattern’s colour swatch (on the right-hand side of the Pattern List) and choose a new colour from the popup menu. For more colour choices, choose the Other... command from the bottom of the menu.

Comparing Diffraction Patterns

 e Patterns list really comes into its own when comparing an observed diraction pattern with a number of calculated patterns. Having decided on a number of possible candidates to match the observed data, drag and drop their CrystalMaker binary les into the Patterns list. You can then quickly compare each diraction pattern with the observed data by turning its checkbox on or o.

To display only one pattern at a time:

• Hold down the option/alt key and click a pattern’s checkbox.

Any plotted patterns will be hidden, and only   your clicked pattern plotted. Plot Settings

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24

Working with multiple patterns in the same window, using the Patterns List. Here, one item’s name is being edited.

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25

General Plot Settings

 ePlot menu lets you change the general way in

 which all diraction patterns are displayed. You can also customize aspects of the Graphics pane display, including the plot range, gridlines and colours, and so on. For specic adjustments to individual diaction patterns, use the Pattern menu.

Film or Graph

 You can choose to plot your diraction pattern as a graph of intensity versus x -value, or you can opt to display a greyscale representation which resembles a traditional photographic x-ray lm.

Film mode is particularly useful when comparing multiple diraction patterns: these are then stacked, making it easy to compare positions and intensities of diraction lines.

Comparing calculated and observed data in Film mode. Te central diraction pattern corresponds to observed data   for a mixture of analcime and silicon; the “ideal ” calculated   patterns for Silicon and Analcime are displayed above and 

below.

Stacked Graphs

In Graph mode you can use the Plot > Stack

command to stack multiple diraction patterns  without danger of overlap. You can undo the

stacking by choosing: Plot > Collapse.

Stacked graphs showing how the diraction pattern of a  crystal changes with temperature, and the progress of a  displacive phase transition.

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26

Overlaying Peak Positions

For a complex diraction pattern there may be many overlapping peaks. e Plot > Overlay Peak Positions submenu allows you to identify 

the positions of individual diraction peaks.  You can superimpose a series of peak markers

showing the peak centres, and their relative intensities. Alternatively, you can overlay the actual proles of individual peaks, in a choice of  plot styles: solid lines, dashed lines or a “solid ll” prole.

 Analysing a simulated mixture, by overlaying the peak  positions for individual phases 

Overlaying peak positions using a solid prole is particularly useful for indicating dierent phases in a multi-component mixture, as illustrated above.

Tweaks

 You can display gridlines in the diraction window: thin lines marking the major x- and y-axis values; the colour of the gridlines is set using thePlot > Grid Colour command. You can also show or hide

a legend, which acts as a key for the observed and calculated data, and for mixtures, the legend lists all phases and their proportions.

Individual Pattern Settings

 e Pattern menu provides a series of commands

 which act upon any currently selected diraction patterns. You can change plot colours, graph attributes, such as line styles and widths, marker sizes—and control the labelling of diraction patterns.

Labelling Peaks

 e Pattern menu gives you various options for

labelling the peaks of selected diraction patterns. Labels can contain any combination of:

• Phase name

• Miller Indices (hkl) • D-spacings

• x-axis values

 Alternatively, you can opt for “blank” labels, where only arrows are plotted.

Strong peaks labelled with Miller Indices. Individual peak  proles are shown by the dotted lines. Notice that only the 

strongest peaks are labelled in this example.

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27 To turn labels on:

1 Select the pattern(s) you wish to label. 2 Choose:Pattern > Show Labels.

To specify the label type:

1 Select the pattern(s) whose labels you wish to

modify.

2 Choose one or more settings from the Pattern > Label Style submenu.

(Note: e label text, and peak arrow, are drawn in the same colour as the host diraction pattern.)

Controlling the Extent of Labelling 

In order to prevent the diraction pattern from becoming too cluttered, you can suppress annotation for weak peaks. e Pattern > Label Threshold submenu lets you specify the minimum

relative intensity for which annotation should be used.

Graph Settings

In Graph mode, you have extensive control over the appearance of all diraction patterns. You can edit individual patterns by selecting them (individually, or collectively), and then applying settings from the Pattern menu.

 Examples of dierent plot and marker styles. From bottom: solid; translucent; thick solid line; thin dashed line; lines  with dots; crosses.

Plot Style Data can be plotted using lines

between points (with a choice of smooth or dashed lines), or as individual markers (with a choice of  marker styles, such as dots, squares and crosses)— or you can choose a combination of lines and markers.

Marker Size  You can specify an explicit marker

size, in pixels, or opt for an Auto setting, in which CrystalDiract scales the marker size depending on the plot size and resolution.

Line Width  You can specify an explicit line

 width (in pixels), or opt for an Auto setting.

Plot Colour  You can apply dierent colours to

dierent diraction patterns.

Tip: You can also edit plot colours using the Patterns List. Popup menus adjacent to each (plotted) entry let you quickly choose one of a number of preset colours.

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28

Customizing your Workspace

CrystalDiract lets you open as many windows as memory permits.

On the Mac version, you can arrange multiple  windows neatly on screen: either stacked on on

top of each other, with small osets between

adjacent windows, or tiled down the screen—using the Window menu’sStackand Tile commands,

respectively.

Synchronizing Windows (Mac)

 When comparing dierent structures in dierent  windows you can use theWindow> Synchronize

command to adjust every window’s settings to match those of the current (uppermost) window. For example, the radiation type, x -axis range,  y -scale, peak widths and so on, are all reset to your

current settings.

Cloning Windows (Mac)

 You can “clone” a window, in order to preserve the original data, and give you free rein to experiment  with new settings—maybe editing the structure

and then wishing to compare the new diraction pattern with the old diraction pattern. Ensure that the window to be cloned is the frontmost diraction window, then choose the Window > Clone Window command.

References

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