Comprehensive SoC Power Grid verification using
VoltageStorm
Agenda
•
Introduction
•
Static and Dynamic IR drop analysis using
VoltageStorm
•
SoC Hierarchical Analysis Methodology
•Results and Observations
•
Conclusions
•Q&A
Introduction
• Low power supply voltage causing IR drop problems in SoC
designs
• Increasing demand to handle analog blocks in SoC
– Have their own dedicated supplies
– Must account for block boundary voltages
– IR drop/ground bounce from top-level power routing
– Some analog blocks share digital power supplies
• Integration with VoltageStorm
– Base SoC power integrity product – Hierarchical, cell-based approach
Static and Dynamic IR drop
analysis using VoltageStorm
•
VoltageStorm supports both static and dynamic
Static IR drop analysis using
VoltageStorm
•Static IR drop analysis verifies robustness of power rail by
showing static IR drop, open circuits, missing vias and high current densities
•Static IR drop analysis is based upon average power
calculated by powermeter
•Average power calculation is based upon three methods
–
Full-chip VCD
–
Accura based switching probability propagation
method
Dynamic IR drop analysis using
VoltageStorm
• Dynamic IR drop analysis is used for analyzing the effect of
transient IR drop
• Helps in optimizing number of decoupling capacitors to reduce
leakage in 90nm and sub-90nm designs
• Based upon instance based dynamic current consumption
calculated by powermeter
• Powermeter uses two methods to calculate dynamic current
consumption
– Vector-based
– Uses gate or transistor level simulation to generate dynamic
power/current waveform
– Most accurate solution if “right” vectors are provided by user
– Vectorless
– Uses timing window information to generate dynamic power/current
waveform
SoC Hierarchical Analysis
Methodology
• VoltageStorm uses power grid views for enabling hierarchical
solution
• A power grid is used to model power rail and power
distribution information of each instance in design.
• For SoC design, different type of power grids will include – standard cell views
– digital blocks
– IP/Memory blocks
Types of Power Grid Views
• VoltageStorm uses four types of
power grid views for hierarchical static analysis
– Detailed – Reduced – Abstract – Port
• For hierarchical dynamic
analysis, three additional types of power grid views are used
– Detailed Dynamic – Reduced Dynamic – Port
Static Power Grid Views
Detailed Reduced Abstract Port
Dynamic Power Grid Views
Power Grid Views for Standard
Cells
• For standard cells port views are sufficient. However for dynamic
analysis detailed views are created for CRC modeling of standard cell.
• CRC modeling
– R on
– Device C
– Load C (Pin capacitance)
out device Ron x out VDD Cell x Loading C from SPEF/DSPF
Power Grid Views for
Memory/Hard IP
• For Memory and hard IP, detailed views
are created for verifying that these blocks do not suffer from IR drop within the
instance
• Two methods are used
– Libgen detailed view creation.
– Most common method
– Transistor level VoltageStorm Flow
– Used for detailed dynamic PGV creation – Device recognition and spice netlist
generation
– RC extraction
– Spice-like simulation on spice netlist for
current tap generation
– Analysis on power grid
– Generate detailed/reduced power grid view
from analysis results
VST LibGen Vectors LEF GDS Detailed Dynamic PGV
Power Grid Views for Digital
Blocks
•For creating power grid views of digital blocks, static or
dynamic IR drop analysis is run at block level first. Here are the steps
– Calculate instance based average static/dynamic current. – Run R or RC extraction on block level power grid.
– Merge the static or dynamic current with the extracted
power grid.
– Run static/dynamic analysis.
Power Grid Views for Analog/
Mixed-Signal Blocks (VAVO)
•Analog VoltageStorm (VAVO) accurately characterize power
consumption and power distribution inside analog and mixed signal blocks
– Power integrity verification
– IR drop (power and ground rails) – Power rail Electromigration
– Integrated with Virtuoso ADE environment – Flow supported by existing Cadence products
– Assura LVS – Assura RCX
VAVO FLOW DIAGRAM
Schematic Layout
Assura LVS
Assura RCX (RC extraction) Create simulation netlist
from config view including Assura extracted cellview
Testbench schematic
Assura extracted cellview
Create Simulation files
Run Spectre or UltraSim
Simulation Details in VAVO
VDD Top-levels of interconnect M1 M6 M5 M4 Analog Circuit Voltage measures areautomatically added to extracted netlist V V V V V V V V V V V V V V V V V V V V V V
VoltageStorm
Comprehensive SoC Power Grid Verification
Small Digital Design
Mixed-Signal & Analog Design
Power Grid Views
(static & dynamic)
VoltageStorm PE (activity propagation, static, cell-based) VoltageStorm VST (dynamic, transistor) UltraSim
VoltageStorm PE
VoltageStorm VAVO (dynamic, transistor) Spectre UltraSim VoltageStorm DG (vectorless & VCD, dynamic, cell-based) CeltIC NDC Full Chip Static & DynamicCeltIC NDC Large Digital Design Large Digital Design Virtuoso Platform Encounter Platform
Results and Observations
•
The power grid views generated by VAVO for the
analog block are more accurate because of the
following reasons:
–
Device recognition is more accurate because Assura
LVS is used to extract analog devices.
–
RCX is more accurate in extracting parasitics for
non-manhattan geometry.
–
Tap current in VAVO is calculated from actual
Spice-like simulation.
Conclusions
•
Here are conclusions from this methodology
–VoltageStorm can analyze and characterize all
types of blocks such as digital blocks, memories,
hard IPs and analog/mixed signal blocks accurately
at SoC level.
–