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Influence of annealing and bulk hydrogenation on lifetime limiting defects in nitrogen doped floating zone silicon

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Figure

Fig. 1.(a) Injection dependence of the measured lifetime for nitrogen-lean n-type Cz silicon and FZ nitrogen-doped n-type silicon
Fig. 2.Low-injection PL image of the nitrogen-doped FZ silicon sample before annealing with (a) Al2O3:H passivation and (b) SiNX :H passivation

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