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Mechanical characterization of nanostructured thin films at different scales

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Figure

Fig. 1. The biaxial tensile machine with a gripped cruciform specimen. The W/Cu thin film can be seen at the centre of the sofimide substrate
Fig. 2.  Schematic representation of the cruciform substrate.
Fig. 6. W X-ray strain as a function of sin²ψ for φ=0°.
Fig. 7. X-ray reflectometry curves measured  for W/Cu multilayers during in situ deformation
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