atomic force microscopy analysis
Atomic force microscopy analysis of nanoparticles in non ideal conditions
... using atomic force microscopy or other scanning probe microscopy ...for atomic force microscopy analysis of nanoparticles under non-ideal ...
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Investigation by Atomic Force Microscopy of the Structure of Ty3 Retrotransposon Particles
... Cryoelectron microscopy (cEM) of two-dimensional (2D) arrays of HIV-1 (24, 49), MLV (23, 55, 90, 91), and RSV (37, 54) CA and X-ray crystal structure analysis of MLV CA (60) indicate that CA subunits form ...
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Liquid-Liquid Interfacial Imaging Using Atomic Force Microscopy
... The interface time response is also a key issue. Indeed, one of the intrinsic paradigm of any AFM technique is the fact that the cantilever-base to sample distance can be varied almost instantaneously by a proportional ...
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ENCAPSULATION OF CURCUMIN IN SILVER NANOPARTICLE FOR ENHANCEMENT OF ANTICANCER DRUG DELIVERY
... potential, Atomic Force Microscopy (AFM), Differential Scanning Colorimetric analysis (DSC), X- ray Diffraction (XRD) and Fourier Transform Infrared Spectroscopy (FTIR), Drug Release, ...
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Force and compliance measurements on living cells using atomic force microscopy (AFM)
... Obtaining the right values for the cantilever spring constant and slope is critical for correct data analysis. Our calibration procedure is described in the protocol section below. It is best to perform the ...
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Conductive probe atomic force microscopy characterization of silicon nanowire
... Reliable and understandable electrical measurements through CP-AFM setup require a well-characterized conductive tip. Depending on the experimental condi- tions, the AFM conductive tip should be the most suita- ble in ...
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Atomic force microscopy probing in the measurement of cell mechanics
... As analysis based on the Hertz theory has been traditionally applied on thin films of gelatin, polyacrylamide, and similar materials, which actually satisfy several key assumptions of the theory (eg, thick films ...
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Imaging and kinetics of the bimolecular complex formed by the tumor suppressor p53 with ubiquitin ligase COP1 as studied by atomic force microscopy and surface plasmon resonance
... concentrations of p53 solution (1.5–20 nM) in running buffer were fluxed over the sensor chip surface for 160 s by using a flow rate of 30 μ L/min, followed by a 160 s dissociation with running buffer and a final ...
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Application of Atomic Force Microscopy in Formulation Engineering438-452
... Atomic force microscopy (AFM), an analytical technique based on probing a surface or interface with a microcantilever, has become widely used in formulation engineering applications such as consumer ...
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Characterization of Kapton polymer containing an inorganic additive
... Results 39 Film Thickness 39 Infrared Analysis 39 Gravimetric Method 41 Profilometry 42 Scanning Optical Electron Microscopy 43 Microscopy 62 Atomic Force 71 Oxygen Plasma Resistance 77 [r] ...
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Forensic Application of Atomic Force Microscopy for Age Determination of Bloodstains
... AFM specifications: Sapphire calibrated silicon tips (Micromash) with spring constants and sensitivities of 45.5 N/m and 16.64 nm/V, 55.8 N/m and 15.30 nm/V, 55.1 and 14.58 nm/V for respectively day 4, day 5, 6 and day ...
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Quantitative electrical characterisation of organic semiconductors by atomic force microscopy
... to force and indentation ...the force, and of the indentation. The zero point of the force can be found by fitting the non contact region of the force curve with a linear fit, as when the tip ...
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Investigations of Zeolite Growth by Atomic Force Microscopy (AFM)
... there are too many very small amorphous particles on the crystal surface, which made surface scanning particularly difficult. Therefore, only 7day samples with suitable crystal faces are able to give good AFM images ...
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Chemical Bath Deposition of SnS Thin Films: AFM, EDAX and UV-Visible Characterization
... recording atomic force microscopy (AFM) images with a Q-Scope 250 in contact mode with a commercial Si 3 N 4 ...dispersive analysis of X-ray (EDAX) ...
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Importance of mass transport and spatially heterogeneous flux processes for in situ atomic force microscopy measurements of crystal growth and dissolution kinetics
... One of the most notable features of Table 2 is that the dissolution rates extrapolated from step velocities, from in-situ AFM experiments, are always much smaller than fluxes from macroscopic dissolution experiments by ...
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Annealing of gold nanostructures sputtered on polytetrafluoroethylene
... by atomic force microscopy, electrical sheet resistance by two point technique, zeta potential by electrokinetic analysis and chemical composition by X-ray photoelectron spectroscopy (XPS) in ...
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Atomic Force Microscopy in Microbiology: New Structural and Functional Insights into the Microbial Cell Surface
... cells. Analysis of fungal mutant strains altered in cell wall composition showed that coadhesion primarily involves Als pro- teins and O-mannosylations, which presumably recognize Als li- gands and lectins on the ...
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Nanoscale observation of surface potential and carrier transport in Cu2ZnSn(S,Se)4 thin films grown by sputtering based two step process
... two atomic planes next to the twin boundary by high-resolution scanning transmission elec- tron microscopy and electron energy-loss spectroscopy ...conductive atomic force microscopy ...
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Improved osseointegration properties of hierarchical microtopographic/nanotopographic coatings fabricated on titanium implants
... The analysis of the fabricated nanostructured relief employing scanning electron microscopy, atomic force microscopy, and electron spectroscopy for chemical analysis clearly ...
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Nanofractal Analysis of Material Surfaces Using Atomic Force Microscopy
... by atomic force microscopy (AFM) and analyzed by one-dimensional fractal ...(2D-FFT) analysis is also applied to these surfaces and their characteristics are ...
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