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Automatic test pattern generation

AUTOMATIC TEST PATTERN GENERATION TECHNIQUE FOR TESTING COMBINATIONAL CIRCUITS

AUTOMATIC TEST PATTERN GENERATION TECHNIQUE FOR TESTING COMBINATIONAL CIRCUITS

... An Automatic test pattern generation technique using a pseudo-random number generator algorithm for testing combinational circuit is ...For generation of automatic multiple ...

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Study on Test Compaction in High Level Automatic Test Pattern Generation (ATPG) Platform

Study on Test Compaction in High Level Automatic Test Pattern Generation (ATPG) Platform

... gate-level test generation more ...of automatic test pattern genera- tion ...ATPG, test generation could be started earlier at higher abstraction level, which is in line ...

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WRL 90 3 pdf

WRL 90 3 pdf

... Efficient Generation of Test Patterns Using Boolean Difference Tracy Larrabee March 1990 Abstract Most automatic test pattern generation systems for combinational circuits generate a tes[r] ...

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Automatic Test Packet Generation

Automatic Test Packet Generation

... Network managers today use primitive tools such as and trace route. Our survey results indicate that they are eager for more sophisticated tools. Other fields of engineering indicate that these desires are not ...

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Automatic Test Packet Generation

Automatic Test Packet Generation

... Network managers today use primitive tools such as and. Our survey results indicate that they are eager For more sophisticated tools. Other fields of engineering indicate that these desires are not unreasonable: For ...

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Automatic Test Packet Generation

Automatic Test Packet Generation

... Network administrator use primitive tools such as Ping and traceroute. My survey results indicate they are esager for more sophisticated tools. Other field of engineering indicate that desires are not unreasonable: For ...

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ULTRA LOW POWER LFSR FOR BIST

ULTRA LOW POWER LFSR FOR BIST

... both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) ...

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Standard Cell Transistor Level ATPG Coverage

Standard Cell Transistor Level ATPG Coverage

... the automatic test pattern generator including the cell-aware library modeling [13], ATPG tool to generate patterns to detect physical defects as close to the gate model as ...model generation ...

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Test Pattern Generation for Jump Bit Insertion in Scan Diagnosis

Test Pattern Generation for Jump Bit Insertion in Scan Diagnosis

... simulation, test patterns have to be generated. The input test patterns are applied to simulate the combinational logic to force states (values) into the ...corresponding test vectors will be used as ...

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Adaptive Test Pattern Generation Using BIST Schemes

Adaptive Test Pattern Generation Using BIST Schemes

... fault-free test response sequence, the BMA is used to synthesize an LFSR capable of generating this sequence in an economical ...of test patterns ...deterministic test pattern ...BIST ...

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Test the S27 Benchmark Circuit by Using Built In Self Test and Test Pattern Generation

Test the S27 Benchmark Circuit by Using Built In Self Test and Test Pattern Generation

... If a primary input sequence A is applied in functional mode starting from a reachable state, all the states traversed under A are reachable states. Any one of these states can be used as the initial state for the ...

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Accumulator Based 3-Weight Test Pattern Generation

Accumulator Based 3-Weight Test Pattern Generation

... self test (BIST) generators have been globally used to test integrated circuit and ...the generation, application of the test vectors and analysis of the resulting response are part of the ...

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Automatic Test Stimulus Generation for RF Transceiver Diagnosis

Automatic Test Stimulus Generation for RF Transceiver Diagnosis

... In this paper RF Testing is done using BPSK modulation technique. Optimized signals are generated with linear feedback shift register and carrier signals are generated by increasing the count value where modulation and ...

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Automatic Test Data Generation Based on Hierarchical Model

Automatic Test Data Generation Based on Hierarchical Model

... It is clear that the proposed method not only gives better coverage but also ensures coverage of more important States. Doerner and Gutjahr (Gutjahr et al., 2003) used Ant colony optimization to create a model based on ...

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Automatic Test Case Generation using Sequence Diagram

Automatic Test Case Generation using Sequence Diagram

... of test input domain such that, if for one of the point the outcome of a selected predicate r is true, then for the other point the outcome of r is ...should test carefully because domain boundaries are ...

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A Survey on Generation of Automatic Test Packet for Fault Localisation

A Survey on Generation of Automatic Test Packet for Fault Localisation

... generating test packets to act on each and every link in the network and also on every rule in the ...of automatic test packet generation are as follows: ...

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TRAINING AND DEVELOPMENT OFARTIFICIAL NEURAL NETWORK MODELS: SINGLE LAYER 
FEEDFORWARD AND MULTI LAYER FEEDFORWARD NEURAL NETWORK

TRAINING AND DEVELOPMENT OFARTIFICIAL NEURAL NETWORK MODELS: SINGLE LAYER FEEDFORWARD AND MULTI LAYER FEEDFORWARD NEURAL NETWORK

... This paper proposes an approach to automatically transform source code of a web application into an abstraction model. A Web Application Program Dependency (WAPD) meta-model is being proposed to store dependency ...

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REVIEW PAPER ON AUTOMATIC TEST PACKET GENERATION AND FAULT LOCALIZATION

REVIEW PAPER ON AUTOMATIC TEST PACKET GENERATION AND FAULT LOCALIZATION

... proposing automatic and systematic approach for testing and debugging networks called “Automatic Test Packet Generation and Fault ...of test packets to exercise every link in network ...

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Area Reduction of Test Pattern Generation Used in BIST Schemes

Area Reduction of Test Pattern Generation Used in BIST Schemes

... area test pattern generation for the BIST ...for test pattern generation has high the area and power ...the test patterns generated using Johnson counter and accumulator ...

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Area and Power Efficient MSIC Test Pattern Generation for BIST

Area and Power Efficient MSIC Test Pattern Generation for BIST

... Let us consider m primary inputs, M scan chains and l scan cells. Fig.1 shows pattern generation technique for BIST. The seed vector is produced using LFSR with the primitive polynomial, and the Johnson ...

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