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combinational test generation technique

AUTOMATIC TEST PATTERN GENERATION TECHNIQUE FOR TESTING COMBINATIONAL CIRCUITS

AUTOMATIC TEST PATTERN GENERATION TECHNIQUE FOR TESTING COMBINATIONAL CIRCUITS

... a test set that is able to distinguish between all distinguishable faults is highly ...Pattern Generation. The goal of an automatic diagnostic pattern generation (ADPG) is to generate a set of ...

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Fault Detection Probability Evaluation Approach in Combinational Circuits Using Test Set Generation Method

Fault Detection Probability Evaluation Approach in Combinational Circuits Using Test Set Generation Method

... tolerant combinational circuits were proposed using functional blocks of a VLSI-system to increase the reliability R (t) by means of linear error correcting codes ...novel technique is based on concurrent ...

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Test Case Generation for Concurrent System using UML Combinational Diagram

Test Case Generation for Concurrent System using UML Combinational Diagram

... generating Test Cases from Activity Diagram ...generate Test cases. Sun [2] proposed an approach for generating test cases from AD, in their approach converted the AD into an intermediate format ...

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Test Case Generation and Test Data Extraction Techniques

Test Case Generation and Test Data Extraction Techniques

... core test processes related approaches, which emerged during the last decade, has been covered in this ...The test cases extraction and the test data generation being the main building blocks ...

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DOMINO: Fast and effective test data generation for relational database schemas

DOMINO: Fast and effective test data generation for relational database schemas

... automated technique that generates test data according to a coverage criterion for integrity constraint ...generate test data for relational database ...generate test suites faster than the ...

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Using UML for Automatic Test Generation

Using UML for Automatic Test Generation

... This paper presents an architecture for model-based verification and testing using a profile of the Unified Modeling Language (UML). Class, object, and state diagrams are used to define essential models: descriptions ...

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Test Pattern Generation Using Lfsr With Reseeding Scheme for Bist Designs

Test Pattern Generation Using Lfsr With Reseeding Scheme for Bist Designs

... design technique that allows a circuit to test ...circuit test cost; test quality and test reuse ...Verilog. Test time is a significant component of IC ...

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Implementation and Analysis of Full Adder using Different Low Power Techniques

Implementation and Analysis of Full Adder using Different Low Power Techniques

... input technique consumes less area on the silicon chip, resulting in less countof transistor, hence as area reduces in size, node capacitance value also ...

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A FUZZY BASED BUFFER SPLIT ALGORITHM FOR BUFFER ATTACK DETECTION IN INTERNET OF 
THINGS

A FUZZY BASED BUFFER SPLIT ALGORITHM FOR BUFFER ATTACK DETECTION IN INTERNET OF THINGS

... of test cases. In fact, it is very hard to generate every possible test case ...of test cases ...of test cases from a very simple given ...each test case, and knowing the output still ...

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An enhanced test case generation technique using activity diagram for system testing

An enhanced test case generation technique using activity diagram for system testing

... efficient test suite typically involves lots of manual work and specialist (expertise) ...with test cases (input-output pairs) for imperative tasks, clustering them into test sequences and ...

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A Genetic Algorithm is Used for Test Suite Generation Aimed for Evolutionary Testing

A Genetic Algorithm is Used for Test Suite Generation Aimed for Evolutionary Testing

... fitting test information, have been created in the course of the most recent ...Discovery test cases are resolved from the particular of the project under test, though, white-box test cases ...

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Generate Test Cases From UML Use Case and State Chart Diagrams

Generate Test Cases From UML Use Case and State Chart Diagrams

... for test case ...for test case ...abstract test case into an executable or concrete test cases which uses certain templates or mappings to ensure completeness between the extracted artefacts ...

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Automatic Test Packet Generation

Automatic Test Packet Generation

... It is not an easy task to debug a network. The network engineers face problems like router misconfigurations, Fiber cut, mislabeled cables, software bug, Faulty interfaces etc. Network engineers try to solve these issues ...

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Purpose Of Low-Power Linear Feedback Shift Register (Lfsr) By Using Bipartite And Random Injection Method For Low Power Bist

Purpose Of Low-Power Linear Feedback Shift Register (Lfsr) By Using Bipartite And Random Injection Method For Low Power Bist

... It is imperative to take the proper LFSR [3] architecture consumes different power even for the same polynomial. Another Problem associated with choosing LFSR is the LFSR design issue, which includes LFSR partitioning, ...

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System on Chip Test Data Compression Based on Split Data Variable Length (SDV) Code

System on Chip Test Data Compression Based on Split Data Variable Length (SDV) Code

... the test cost, increase the prod- uct’s quality, and make easy the design characterization and test program ...to test these systems effectively, each IP core must be exercised duly with the core ...

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Efficient test compaction for combinational circuits based on Fault detection count directed clustering

Efficient test compaction for combinational circuits based on Fault detection count directed clustering

... compacted test sets obtained by FCC6þ and those obtained by Mintest [15] using both dynamic and static compaction ...known test sizes for several ...the test size of FCC6þ is smaller than Mintest ...

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Search based Software Testing Technique for Structural Test Case Generation

Search based Software Testing Technique for Structural Test Case Generation

... the generation of software tests is an undecidable problem [14, 15] and a program‟s input space is very large, exhaustive enumeration is ...of test case design is transformed into an optimization problem ...

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A Novel Technique for Speech Processing Using
Combinational Adaptive Methods

A Novel Technique for Speech Processing Using Combinational Adaptive Methods

... Abstract - This paper presents a new technic to introduce adaptive Filter with combinational Algorithm like Normalized LMS & variable stepsize LMS based on Shadow technic. Which is useful for the cancellation ...

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Adaptive Technique  For  Test Packet Generation

Adaptive Technique For Test Packet Generation

... tool, test packets are created algorithmically from the device configuration files and First information base, with minimum number of packets needed for complete ...

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Algorithms for Solving Boolean Satisfiability in Combinational Circuits

Algorithms for Solving Boolean Satisfiability in Combinational Circuits

... in test pattern generation [15], SAT models and techniques have since been applied to delay-fault testing, equivalence checking, circuit delay computation, logic synthesis and functional vector ...

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