IEEE 1149.1 boundary scan test
An IEEE 1149 x Embedded Test Coprocessor
12
New Built In Self Test Boundary Scan Architectures for Digital Integrated Circuits in Industrial Applications
15
Secure tap controller ip core
7
VHDL IMPLEMENTATION OF TEST ACCESS PORT CONTROLLER
9
Test Pattern Generation for Jump Bit Insertion in Scan Diagnosis
6
Low power test pattern generation using Test Per Scan technique for BIST implementation
9
Safe Energy to Refine the Test Model to Cover the Transition Error in the Scan-Based Test Speed
8
Test Accuracy of CT Scan for the Detection of Malignant Liver Mass
5
Test Pattern Generation by Sharing Scan Sequence in block level
9
A low power broadcast scan scheme
5
Minimising power dissipation during test application in full scan sequential circuits by primary input freezing
24
A Novel Bandwidth management EDT scan-based test And TAM test application time and scheduling
9
Low hardware Accumulator Based 3-Weight Pattern Generation for Boundary Scan
5
An Experimental Investigation Into the Performance of a Flush Water Jet Inlet
21
Low hardware Accumulator Based 3-Weight Pattern Generation for Boundary Scan
5
Aggressive Exclusion of Scan Flip-Flops from Compression Architecture for Better Coverage and Reduced TDV: A Hybrid Approach
25
Download Download PDF
9
Volume 35 - Article 39 | Pages 1149–1168
22
1149.pdf
153
Design for Test and Hardware Security Utilizing Tester Authentication Techniques
76