Secondary Ion Mass Spectrometry (SIMS)
Helium ion microscope – secondary ion mass spectrometry for geological materials
12
Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy
5
A comprehensive protocol for chemical analysis of flame combustion emissions by secondary ion mass spectrometry
23
Towards practical time-of-flight secondary ion mass spectrometry lignocellulolytic enzyme assays
13
Identification and imaging of modern paints using Secondary Ion Mass Spectrometry with MeV ions
23
An image formation model for Secondary Ion Mass Spectrometry imaging ofbiological tissue samples
10
Solid-material-based Coupling Efficiency Analyzed with Time-of-Flight Secondary Ion Mass Spectrometry
9
Determining the chronology of deposition of natural fingermarks and inks on paper using secondary ion mass spectrometry
14
Determining the chronology of deposition of natural fingermarks and inks on paper using secondary ion mass spectrometry
13
Nanometer-scale molecular organization in lipid membranes studied by time-of-flight secondary ion mass spectrometry
11
Biological tissue sample preparation for time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging
13
Improved depth resolution of secondary ion mass spectrometry profiles in diamond: A quantitative analysis of the delta-doping
16
Three-dimensional time-of-flight secondary ion mass spectrometry imaging of primary neuronal cell cultures
182
Chemical Imaging of Buried Interfaces in Organic-Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry
18
The Development of MeV Secondary Ion Mass Spectrometry.
155
Surface chemical analysis Secondary-ion mass spectrometry Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
20
Secondary Ion Mass Spectrometry Imaging of Dictyostelium discoideum Aggregation Streams
9
The development of secondary ion mass spectrometry for two dimensional impurity profiling in semiconductors
212
Organic Secondary Ion Mass Spectrometry: Signal Enhancement by Water Vapor Injection
6
Developing Protein Tags for Secondary Ion Mass Spectrometry to Determine Protein Interaction
35