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[PDF] Top 20 Investigation of the optical properties of MoS2 thin films using spectroscopic ellipsometry

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Investigation of the optical properties of MoS2 thin films using spectroscopic ellipsometry

Investigation of the optical properties of MoS2 thin films using spectroscopic ellipsometry

... (k). Spectroscopic ellips- ometry (SE) is a powerful non-destructive technique to mea- sure the optical properties of thin ...dependent optical constants and the thickness of ... See full document

6

Probing the out of plane optical response of plasmonic nanostructures using spectroscopic ellipsometry

Probing the out of plane optical response of plasmonic nanostructures using spectroscopic ellipsometry

... the optical properties of the plasmonic layer only. Thin plasmonic structures with in-plane anisotropy can be measured, the only limit to the approach being that the substrate must be optically ... See full document

6

Optical and surface characterization of radio frequency plasma polymerized 1-isopropyl-4-methyl-1,4-cyclohexadiene thin films

Optical and surface characterization of radio frequency plasma polymerized 1-isopropyl-4-methyl-1,4-cyclohexadiene thin films

... angle spectroscopic ellipsometry (VASE) measurements were performed using a ...angle spectroscopic ellipsometer to estimate sample thickness and optical properties of pp–GT ... See full document

16

Spectroscopic ellipsometry, optical, structural and electrical investigation of sprayed pure and Sn-doped ZnO thin films

Spectroscopic ellipsometry, optical, structural and electrical investigation of sprayed pure and Sn-doped ZnO thin films

... The optical constants are very important to designing the optical devises, because of their relation to the electronic polarize-ability of ions and the local field inside materials ...the films. The ... See full document

12

Effects of Al Doping on the Properties of ZnO Thin Films Deposited by Atomic Layer Deposition

Effects of Al Doping on the Properties of ZnO Thin Films Deposited by Atomic Layer Deposition

... structural, optical, and electrical properties of Al-doped ZnO films deposited by atomic layer deposition technique is reported in this ...ZnO films. Spectroscopic ellipsometry ... See full document

8

Pulsed Source MOCVD of High k Dielectric Thin Films with in situ Monitoring by Spectroscopic Ellipsometry

Pulsed Source MOCVD of High k Dielectric Thin Films with in situ Monitoring by Spectroscopic Ellipsometry

... high-k thin films by pulsed-source metal-organic chemical vapor deposition (MOCVD) has been investigated with in situ spectroscopic ...that spectroscopic ellipsometry is an effective method for ... See full document

5

Optical investigation of the natural electron doping in thin MoS2 films deposited on dielectric substrates

Optical investigation of the natural electron doping in thin MoS2 films deposited on dielectric substrates

... in thin films enhances the significance of surface interactions and charging effects requiring new ...on optical properties of a few monolayer MoS 2 ...2 films deposited ... See full document

7

The Effect of Zinc Acetate Concentration on Optical Properties of ZnS Thin Films by Spectroscopic Ellipsometry Analysis Method

The Effect of Zinc Acetate Concentration on Optical Properties of ZnS Thin Films by Spectroscopic Ellipsometry Analysis Method

... of optical band gap could be attributed to the structural and morphological change as well as the stoichiometric deviations in the film, which gave rise to the formation of located states in the band gap ...in ... See full document

6

Substrate Temperature Effect on Optical property of ZnO Thin Films

Substrate Temperature Effect on Optical property of ZnO Thin Films

... fundamental absorption. In addition, difference in absorbance can be observed clearly at wavelength shorter than 400 nm. One can note that the substrate temperature effect is clearly observed in the layer quality such as ... See full document

8

Study of Electrical Optical and Structural Properties of Lead Selenide Sulphide Ternary Thin Films

Study of Electrical Optical and Structural Properties of Lead Selenide Sulphide Ternary Thin Films

... For the preparation of ternary compound semiconductors (PbSe) x (PbS) 1-x the constituent compounds PbSe and PbS have been taken in molecular stiochiometry proportional weights and crushed and mixed homogeneously. The ... See full document

8

Optical, Photophysical, Stability and Mirrorless Lasing Properties of Novel Fluorescein Derivative Dye in Solution

Optical, Photophysical, Stability and Mirrorless Lasing Properties of Novel Fluorescein Derivative Dye in Solution

... ing properties of laser dyes in liquid solutions show a strong dependence on the molecular structure of the dye ...and optical properties ...lasing properties should be ... See full document

8

Ultrafast Nonlinear Optical and Optical Limiting Properties of Phthalocyanine Thin Films Studied Using Z Scan

Ultrafast Nonlinear Optical and Optical Limiting Properties of Phthalocyanine Thin Films Studied Using Z Scan

... nonlinear optical properties, optical limiting thresholds, and figures of merits for five different phthalocyanine thin films, achieved through doping in PMMA polymer, using the ... See full document

8

Enhancement of optical and electrical properties of zno thin films using indium doping

Enhancement of optical and electrical properties of zno thin films using indium doping

... The XRD profiles show that the crystalline quality of the ZnO films have deteriorated with indium doping. As the concentration of indium increases the intensity of 002 peak decreases and growth appeared in 100 and ... See full document

5

Structural and Optical Properties of ZnO Thin Films Deposited by Pyrolysis Spray Method: Effect of Substrate Temperature

Structural and Optical Properties of ZnO Thin Films Deposited by Pyrolysis Spray Method: Effect of Substrate Temperature

... present investigation, chemical spray deposition technique (SPT) was used to grow undoped ZnO thin films on glass substrates by varying the substrate ...and optical properties ... See full document

6

Study Of Electrical And Optical Properties Of Thin Films

Study Of Electrical And Optical Properties Of Thin Films

... SnO2 thin film is fabricated by shower, synthetic vapor testimony, and ...a thin film develops can influence the electrical and optical properties of the thin ...and optical ... See full document

14

The Effect of Zn Concentration on the Optical Properties of Cd10–xZnxS Films for Solar Cells Applications

The Effect of Zn Concentration on the Optical Properties of Cd10–xZnxS Films for Solar Cells Applications

... the films are crystalline with hexagonal structure .The optical properties of the prepared films were studied using measurements from VIS-UV-IR spectrophotometer at wave- length with ... See full document

6

Optimised atmospheric pressure CVD of monoclinic VO2 thin films with picosecond phase transition

Optimised atmospheric pressure CVD of monoclinic VO2 thin films with picosecond phase transition

... It is found that prolonged growth experiments led to slightly rougher films, with Rms values only ranging from 6.2 to 10.5 nm as the film thickness increased (Table 3). This in turn implies that increasing film ... See full document

26

Indium Doped Zinc Oxide Thin Films: Effect on Structural, Optical and Electrical Characteristics

Indium Doped Zinc Oxide Thin Films: Effect on Structural, Optical and Electrical Characteristics

... Figure 1 shows the SEM micrograph of both undoped and doped IZO films with 11.0kx magnification. Undoped films have smooth, closely packed grains which are uniformly distributed. When Indium (1%) was ... See full document

5

Structural, Electrical and Optical Characteristics of Zn100–xCdxO Thin Films

Structural, Electrical and Optical Characteristics of Zn100–xCdxO Thin Films

... to 450˚C showing semiconductor behavior. The lowest resistivity value 5.3 × 10 − 5 Ω-cm has been obtained for annealed film at temperature of 450˚C. It is ob- servable also that, the carriers mobility increased with ... See full document

12

In situ real time spectroscopic ellipsometry study of HfO2 thin films grown by using the pulsed source MOCVD

In situ real time spectroscopic ellipsometry study of HfO2 thin films grown by using the pulsed source MOCVD

... 2 thin films under ...by using EDX analy- sis that the concentrations of Hf and O increase in the inter- facial layer region while the concentration of Si decreases gradually in the direction from ... See full document

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