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Chapter 2: OBJECT LIGHT FIELD RECONSTRUCTION FROM

A. A shift-variant BRDF model and analytical solution

Previous authors in the computer graphics and computer vision fields have made a variety of simplifying assumptions to BRDFs [12,13]. For example, the BRDF has been approximated as shift-invariant to compute the forward scattering problem in the frequency domain [16] and the diffuse component of the BRDF has been approximated as a constant (commonly known as the Lambertian term) to obtain solutions to the inverse scattering problem [4]. In addition, the BRDF has been modeled as separable, such as for data compression purposes [17,18]. These assumptions, although convenient for computer graphic related purposes, are not suitable for analysis of the reconstruction.

Fig. 2-6 illustrates two types of BRDFs expected in real scenes. Fig. 2-6 (a) shows a large and slowly varying diffuse component superimposed on a small quasi-shift-invariant specular component. Fig. 2-6 (b) shows a BRDF that contains only a quasi-shift-invariant specular component, but is restricted to a limited angular range.

Since the specular component is considerably wider than the measurement range, the boxed area can be considered

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as a diffuse component. In the following, we introduce a BRDF model in eq. (2-14) that covers these common shift-variant BRDFs, enabling an analytical solution to eq. (2-9). Such analytical solutions are required to fully understand the errors in reconstruction and the effect of regularization methods. Note that our BRDF model combines Durand’s model [16] for the forward scattering analysis and Shirley's model [19] for matte/specular

materials such as polished woods and tiles. Our model is thus expected to have wide applicability to real-world scattering surfaces.

Fig. 2-6. Analytically modeling two candidate BRDF functions. (a) Large diffuse component and small specular component. (b) Wide specular component with limited measurable range.

Fig. 2-6 (a) is modeled mathematically by including a shift-invariant specular term 𝑓𝑠𝑝𝑒𝑐 that is multiplied by a slowly varying window function 𝑓𝑀𝑖𝑛𝑑 to allow for commonly observed changes in specular peak-values as a function of object angle πœƒπ‘œ [16]. A symmetric diffuse component 𝑓𝑑𝑖𝑓𝑓(πœƒπ‘œ) Γ— 𝑓𝑑𝑖𝑓𝑓(πœƒπ‘š) is then added that is separable and reciprocal in terms of the input and output angles [19]:

𝑓𝐡𝑅𝐷𝐹(πœƒπ‘œ, πœƒπ‘š) = 𝑓𝑀𝑖𝑛𝑑(πœƒπ‘œ)𝑓𝑠𝑝𝑒𝑐(πœƒπ‘šβˆ’ πœƒπ‘œ) + 𝑓𝑑𝑖𝑓𝑓(πœƒπ‘œ)𝑓𝑑𝑖𝑓𝑓(πœƒπ‘š)

In the computer graphics and computer vision fields, the diffuse component is usually expressed as a constant Lambertian term. In our treatment, we allow the diffuse component to take on any functional form, as long as the function is separable with respect to the input and output angles. This generalization allows for a far more complex diffuse term to be expressed. However, the separability constraint implies that no object information is (2-14)

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conveyed to the measured signal as explained in the subsequent sections. Moreover, if 𝑓𝑠𝑝𝑒𝑐 is sufficiently narrow compared to 𝑓𝑀𝑖𝑛𝑑 (i.e. 𝑓𝑠𝑝𝑒𝑐 is considered to be delta-function like), then 𝑓𝑀𝑖𝑛𝑑(πœƒπ‘œ) Γ— 𝑓𝑠𝑝𝑒𝑐(πœƒπ‘šβˆ’ πœƒπ‘œ) β‰… 𝑓𝑀𝑖𝑛𝑑(πœƒπ‘š) Γ— 𝑓𝑠𝑝𝑒𝑐(πœƒπ‘œβˆ’ πœƒπ‘š) meaning the model has Helmholtz reciprocity considering the symmetricity of the specular and diffuse component.

We first introduce a weighted inner product [29] (denoted by a double bracket in eq. (2-15)) and weighted basis (denoted by a tilde in eq. (2-16)) to simplify the frequency-domain expression of eq. (2-9). This basis is orthonormal with respect to the weighted inner product, so πΏπ‘œπ‘π‘— can be expressed as a linear combination of πœ‘Μƒπ‘ž as shown in eq. (2-17), where π‘‚Μƒπ‘ž is a coefficient of πΏπ‘œπ‘π‘— with respect to πœ‘Μƒπ‘ž. (The relation between π‘‚π‘ž

By substituting eq. (2-9) and (2-17) into (2-11) and referring to eq. (2-12), a new frequency domain expression can be obtained in eq. (2-18). Note that the cosine obliquity factor has been cancelled and 𝐡̃𝑝,π‘ž is simply the 2-D Fourier coefficient of the BRDF. In the following, the system matrix [𝐡̃] contains the elements 𝐡̃𝑝,π‘ž.

{

By substituting the BRDF model of eq. (2-14) into eq. (2-18), the following expression for 𝐡̃𝑝,π‘ž is obtained:

(2-15)

(2-16)

(2-17)

(2-18)

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Because we have assumed that the diffuse component is separable, the second term of eq. (2-19) can be written as eq. (2-23), where 𝐷𝑝 is the Fourier coefficient of 𝑓𝑑𝑖𝑓𝑓 defined in eq. (2-24).

Finally, by substituting eq. (2-20) and (2-23) into (2-19), 𝐡̃𝑝,π‘ž is expressed in the following simple form:

𝐡̃𝑝,π‘ž= 𝑆𝑝,π‘π‘Šπ‘βˆ’π‘ž+ π·π‘π·π‘žβˆ—

Recall that we have assumed that 𝑓𝑀𝑖𝑛𝑑 is a slowly varying function. To make further progress in the analytical solution of eq. (2-18), we approximate it as 𝑓𝑀𝑖𝑛𝑑(πœƒπ‘œ) β‰… 1. We then have

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By substituting eq. (2-27) into (2-18), and dividing both sides by 𝑆𝑝,𝑝, we have

𝑂̃𝑝= 𝑀𝑝

𝑆𝑝,π‘βˆ’ βˆ‘ 𝐷𝑝

𝑆𝑝,π‘π·π‘žβˆ—π‘‚Μƒπ‘ž

∞

π‘ž=βˆ’βˆž

Eq. (2-28) is a discrete form of the Fredholm integral equation of the second kind [30], and it has a closed-form solution because of the separable kernel in the discrete sum. By expressing eq. (2-28) with a constant 𝛼 defined in eq. (2-29) and multiplying both sides by π·π‘βˆ—, eq. (2-30) is obtained.

By calculating the discrete sum of p for both sides of eq. (2-30), the following is obtained:

βˆ‘ π·π‘βˆ—π‘‚Μƒπ‘

The left-hand-side of eq. (2-31) is equal to 𝛼, and therefore this equation can be solved in terms of 𝛼 as expressed in eq. (2-32). The expression for 𝛼 does not include unknown 𝑂̃𝑝, and therefore, an analytical closed-form

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B. Understanding the structure of the system matrix [𝑩]

From the analytical expressions in the previous section, it is possible to interpret the structure and eigenvalues of the system matrix [𝐡] in eq. (2-13). From the relation between π‘‚π‘ž and π‘‚Μƒπ‘ž in eq. (a3) in appendix A1, 𝐡𝑝,π‘ž in eq. (2-13) and 𝐡̃𝑝,π‘ž in eq. (2-18) have the following relation: 𝐡𝑝,π‘žβ‰… 𝐡̃𝑝,π‘žβ„ , where 𝛽𝛽0 0 is a constant related to the cosine obliquity factor and is given by eq. (a2) in appendix A1, and therefore, the structure of [𝐡] can be directly seen from [𝐡̃].

Let us first consider the simplest case where 𝑓𝑀𝑖𝑛𝑑 is unity. Fig. 2-7 (a) illustrates 𝐡̃𝑝,π‘ž in eq. (2-27) where it can be seen that the diagonal elements of [𝐡̃] are 𝑆𝑝,𝑝, or the Fourier coefficients of 𝑓𝑠𝑝𝑒𝑐 in eq. (2-21), and the off-diagonal elements are π·π‘π·π‘žβˆ— or the outer product of the Fourier coefficients of 𝑓𝑑𝑖𝑓𝑓 in eq. (2-24).

Moreover, it can be understood from eq. (2-33) that 𝑆𝑝,𝑝 can be considered as the approximate eigenvalues of [𝐡̃] because the right-hand-side of eq. (2-33) includes division by 𝑆𝑝,𝑝. As is commonly known, many actual BRFDs contain specular components whose shape can be approximated by a Gaussian function and whose Fourier coefficients monotonically decrease as a function of frequency [12,13], and therefore, the diagonal elements tend to have near zero values at higher frequencies. The extent of the non-zero portion of these diagonal elements of the matrix indicates the range of angular frequencies that can be recovered without being adversely affected by measurement noise. The length of this recoverable region is Fourier-transform related to the sharpness of the specular component (see fig. 2-7 (b)).

(2-33) (2-32)

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Second, let us consider a more general BRDF where 𝑓𝑀𝑖𝑛𝑑 is not unity but rather a slowly varying function. From eq. (2-25), the diagonal elements 𝑆𝑝,𝑝 are seen to be convolved with π‘Šπ‘βˆ’π‘ž, leading to a blur in the diagonal elements. Fig. 2-7 (b) shows an experimentally measured system matrix [𝐡] from a coated white paper. The width of the blur in this figure is a measure of the shift-variance of the specular component. In many common scattering materials where 𝑓𝑀𝑖𝑛𝑑 is slowly varying and the width of this blur is small, the 𝑆𝑝,𝑝 terms are still good approximations to the actual eigenvalues.

Fig. 2-7. Understanding the structure of the system matrix [𝑩] . (a) Schematic structure of [𝑩̃]. (b) Experimentally obtained [𝑩].

C. Influence of measurement noise on reconstruction error

In many inverse problem solutions, the relative reconstruction error can be expressed as the product of the system matrix condition number and the inverse of the measurement system signal-to-noise ratio (SNR) [25,32]. In this section, we will derive a similar expression by making use of the analytical solution of the previous section together with a newly defined BRDF parameter which we call the degree of specularity.

We assume the linear noise model shown in eq. (2-34) as a description of the signal πΏπ‘šπ‘’π‘Žπ‘  detected by the camera. The measurement noise π‘‹πœƒπ‘š is assumed to be an additive zero-mean wide-sense stationary (WSS) random process [33].

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πΏπ‘šπ‘’π‘Žπ‘ (πœƒπ‘š) = ∫ 𝑓𝐡𝑅𝐷𝐹(πœƒπ‘œ, πœƒπ‘š) cos πœƒπ‘œπΏπ‘œπ‘π‘—(πœƒπ‘œ)π‘‘πœƒπ‘œ

𝑏 π‘Ž

+ π‘‹πœƒπ‘š

Since the process is WSS, the noise can be characterized by random variables 𝐴𝑝 that are the Fourier coefficients (or more generally the Karhunen-LoΓ©ve coefficients [33,35]) of π‘‹πœƒπ‘š with respect to eq. (2-7) and (2-8). When taking the measurement noise into consideration, eq. (2-11) becomes

πΏπ‘šπ‘’π‘Žπ‘ (πœƒπ‘š) βˆ’ π‘‹πœƒπ‘š= βˆ‘ {π‘€π‘βˆ’ 𝐴𝑝}πœ‘π‘(πœƒπ‘š)

∞

𝑝=βˆ’βˆž

Therefore, an analytical solution considering the measurement noise, denoted π‘‚Μƒπ‘π‘›π‘œπ‘–π‘ π‘’, can be obtained in eq. (2-35) simply by replacing 𝑀𝑝 with π‘€π‘βˆ’ 𝐴𝑝 from eq. (2-33), where 𝑒̃𝑝 is an error caused by the noise. shown below, where the pth coefficient of the power spectral density of the measurement noise is denoted as 𝑃𝑆𝐷𝑝

(note: for definition, see eq. (a15) in appendix A7. In addition, 𝐸[𝐴𝑝] = 0 and 𝐸 [|𝐴𝑝|2] = 𝑃𝑆𝐷𝑝 from

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By substituting the above equation, eq. (2-32) and (2-33) into eq. (2-36), the relative noise error can be obtained as:

where the constant 𝛾 is defined in eq. (2-38) as the degree of specularity:

𝛾 ≑

The approximation in eq. (2-38) comes from the fact that value of the second term in the numerator can often be approximated as near zero (for further details, see appendix A2). The approximated 𝛾 is totally determined by the BRDF, and has the following properties; it becomes 1 for perfectly specular BRDF i.e. 𝐷𝑝 = 0 for all 𝑝, and becomes 0 for perfectly diffusive BRDF i.e. 𝑆𝑝,𝑝= 0 for all 𝑝. In section 2.6, it will be experimentally shown that eq. (2-38) can accurately represent the characteristic of BRDFs from a variety of scattering surfaces.

If the noise π‘‹πœƒπ‘š is white and Poissonian and the mean of the measured signal is sufficiently large, its statistics can be approximated by a white-Gaussian noise with a standard deviation which is a function (generally, the square root) of the signal mean. By defining the standard deviation of π‘‹πœƒπ‘š as 𝜎(𝑀0), where 𝑀0 (average value of πΏπ‘šπ‘’π‘Žπ‘  from eq. (2-11)) represents the signal mean, we can make the following approximation:

βˆšπ‘ƒπ‘†π·π‘β‰… 𝜎(𝑀0). (Note: For satisfying Parseval’s law, 𝜎(𝑀0) needs to be divided by βˆšπ‘ when an 𝑁-point DFT is taken for computation.)

D. Intuitive understanding of the reconstruction error

An inspection of eq. (2-37) reveals the following;

(2-37)

(2-38)

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1) The first term |𝑆0,0⁄𝑆𝑝,𝑝| in eq. (2-37) can be interpreted as the condition number [25,32] of a matrix obtained by totally removing the diffuse component from the system matrix [𝐡], assuming 𝑆𝑝,𝑝 is a

monotonically decreasing function of 𝑝 and truncating the matrix to include all terms less than or equal to 𝑝. This matches our intuition that BRDFs having sharper and/or narrower specular peaks will retain higher frequency components in the object reconstruction. By contrast, BRDFs having more rounded and/or wider specular peaks will lose higher object frequency information. A similar effect was noted in fig. 2-7. In addition, the above-mentioned specular width is measured relative to the domain range [π‘Ž, 𝑏]. For example, as the range becomes wider, the relative specular width can be seen to be narrower.

2) Instead of the more common definition of the signal-to-noise ratio (or SNR) in eq. (2-39), the second term in eq. (2-37) containing 𝛾 acts as the effective signal-to-noise ratio. We define this in eq. (2-40) as 𝑆𝑁𝑅𝑒𝑓𝑓.

𝑆𝑁𝑅 = 𝑀0

βˆšπ‘ƒπ‘†π·π‘

𝑆𝑁𝑅𝑒𝑓𝑓≑ 𝑀0𝛾

βˆšπ‘ƒπ‘†π·π‘

The numerator 𝑀0𝛾 represents the part of πΏπ‘šπ‘’π‘Žπ‘  originating from the specular component of the BRDF.

This indicates that BRDFs having larger diffuse components result in smaller values of 𝛾 and 𝑆𝑁𝑅𝑒𝑓𝑓, making the object reconstruction more difficult. In the case of a perfectly diffusive BRDF (𝛾 = 0), the 𝑆𝑁𝑅𝑒𝑓𝑓 becomes zero, meaning no object information can be retrieved. (Note: We defined the diffuse component as a separable function, and in general, any non-separable component of the BRDFs can convey object information.) In addition, the 𝛾 coefficient depends on the domain range [π‘Ž, 𝑏]. For example, if the measurable range in fig. 2-6 (b) becomes wider, 𝛾 becomes larger.

(2-39)

(2-40)

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For categorizing different types of BRDFs from the viewpoint of solving the inverse problem, the two parameters,

|𝑆0,0⁄𝑆𝑝,𝑝| and 𝑆𝑁𝑅𝑒𝑓𝑓, are informative because they directly reflect the reconstruction error which determines the quality of the reconstructed light field πΏπ‘œπ‘π‘—.

E. Examples of noise analysis on wavelength and polarization

Observing the scene with longer wavelength light, such as infrared and terahertz wavelengths, can sometimes lead to a BRDF with a narrower specular peak [37]. This reduces |𝑆0,0⁄𝑆𝑝,𝑝| in eq. (2-37) meaning the error is suppressed and higher frequency object information can be preserved.

Moreover, the specular and diffuse reflections each have polarization properties governed by the characteristics of the scattering surface. The 𝑆𝑁𝑅𝑒𝑓𝑓 can be taken to determine suitable usage of polarizers for better light field reconstruction. If we assume the simplest situation, such as P-polarized specular reflection and un-polarized Lambertian diffuse, it can be shown that the highest 𝑆𝑁𝑅𝑒𝑓𝑓 can be achieved simply by using a P-polarizer during measurement. Some imaging systems attempt to remove the diffuse component by subtracting a second measurement with S-polarization from that with P-polarization [38]. However, this procedure does not improve the 𝑆𝑁𝑅𝑒𝑓𝑓 because the subtraction adds more noise. See appendix A3 for details.

2.5 Two fundamental regularization methods derived from the analytical solution

A. Fourier truncation regularization

As explained in section 2.4.B, the Fourier coefficients 𝑆𝑝,𝑝 of the specular component serve as approximate eigenvalues of the system matrix [𝐡] in eq. (2-13). Thus, removing small values of 𝑆𝑝,𝑝 by truncating the higher frequency components of the system matrix [𝐡] can serve as a simple regularizer. Note that

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this is similar to the commonly known truncation procedure for Fourier series when performing deconvolution (or inverse filtering) and truncation of the SVD when performing general inversions [22,26]. We previously derived an expression for the relative noise error in eq. (2-37). However, this expression is not appropriate for the present purpose since it lacks the error inherent in a truncated Fourier series [29]. Instead, we will derive a general error expression for the mean-squared error (MSE) to include both errors, and then use the first derivative of this MSE with respect to Fourier terms p as a criterion for selecting the best truncation point for regularization.

- Total MSE expressed as a sum of the truncation error and the noise error

πΏπ‘œπ‘π‘— is the original object and πΏπ‘’π‘Ÿπ‘Ÿπ‘œπ‘π‘— is the reconstructed object defined in eq. (2-42) to include both

By expanding eq. (2-41) (see appendix A4 for details), the total MSE can be obtained in eq. (2-43) as a function of the truncation term π‘π‘šπ‘Žπ‘₯. The first and second terms represent the truncation error, and the third term represents the measurement noise error.

- The first derivative of MSE as a criterion to determine the best truncation term for regularization (2-41)

(2-42)

(2-43)

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As can be seen from eq. (2-43) and fig. 2-8 (a), the behavior of the MSE is governed by the two error sources. The truncation error monotonically decreases as π‘π‘šπ‘Žπ‘₯ increases and eventually converges to zero, whereas the noise error monotonically increases as π‘π‘šπ‘Žπ‘₯ increases and eventually diverges. This indicates that the MSE can have a minimum at a particular value π‘π‘šπ‘Žπ‘₯ and the first derivative of the MSE can be used to find the best truncation point. By approximating a derivative as a finite difference and an integration as a discrete summation, the discrete Leibniz integral rule is expressed as shown below, where 𝑐 is a constant.

𝑑

By applying the above rule to eq. (2-43), the following equation can be obtained (note: the first line assumes |𝑂̃𝑝| and |𝑒̃𝑝| are symmetric with respect to 𝑝 = 0 because they are computed from real functions.):

By substituting eq. (2-33) and (2-35) into the above equation, the analytical first derivative of the MSE can be obtained in eq. (2-44), which is completely determined by the known information. Consequently, the best truncation term can be determined by finding the π‘Μ‚π‘šπ‘Žπ‘₯ which makes eq. (2-44) near zero. If the measurement noise is white and approximated as Gaussian with a standard deviation 𝜎(𝑀0), βˆšπ‘ƒπ‘†π·π‘π‘šπ‘Žπ‘₯β‰… 𝜎(𝑀0).

Note that eq. (2-43) does not guarantee an unique global minimum and eq. (2-44) may have some oscillations and multiple zeros. In this case, it is reasonable to fit eq. (2-44) with some slow function and take its zero-crossing point as π‘Μ‚π‘šπ‘Žπ‘₯.

(2-44)

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- Relation between the first derivative of MSE and the relative noise error

Let us assume a single delta-function object (i.e. a point source) expressed as πΏπ‘œπ‘π‘—(πœƒπ‘œ) = 𝛿(πœƒπ‘œ), which leads to 𝑂̃𝑝= 𝑂̃0 for any 𝑝 from eq. 33) and (a3) in appendix A1. Noting that the first term of eq. (2-44) is π‘‚Μƒπ‘π‘šπ‘Žπ‘₯, we can replace this term with 𝑂̃0. By considering the relation: π‘₯2βˆ’ 𝑦2= (π‘₯ βˆ’ 𝑦) Γ— (π‘₯ + 𝑦), we have

|βˆšπ‘ƒπ‘†π·π‘Μ‚π‘šπ‘Žπ‘₯

π‘†π‘Μ‚π‘šπ‘Žπ‘₯,π‘Μ‚π‘šπ‘Žπ‘₯| βˆ’ |𝑀0βˆ’ 𝛼𝐷0

𝑆0,0 | = 0

By referring to eq. (2-37), the following can be obtained from the above equation:

| 𝑆0,0

π‘†π‘Μ‚π‘šπ‘Žπ‘₯,π‘Μ‚π‘šπ‘Žπ‘₯| |βˆšπ‘ƒπ‘†π·π‘Μ‚π‘šπ‘Žπ‘₯

𝑀0βˆ’ 𝛼𝐷0| = 1 = βˆ†Μƒπ‘Μ‚π‘šπ‘Žπ‘₯

Finally, we see that the Fourier term π‘Μ‚π‘šπ‘Žπ‘₯ (the MSE minimizer) corresponds to a Fourier term which makes the relative noise error βˆ†Μƒπ‘ in eq. (2-37) equal to one, as illustrated in fig. 2-8 (b). Therefore, it can be said that the π‘Μ‚π‘šπ‘Žπ‘₯ directly reflects the BRDF characteristics, such as 𝑆𝑝,𝑝, 𝛾 and 𝑆𝑁𝑅𝑒𝑓𝑓 explained in section 2.4.C and

2.4.D. Although this requires the object to be a delta function, it is reasonable to expect the similar tendency of π‘Μ‚π‘šπ‘Žπ‘₯ for more general objects.

Fig. 2-8. (a) Mean-squared error (MSE) as a sum of two error sources. (b) Relation between π’‘Μ‚π’Žπ’‚π’™ and βˆ†Μƒπ’‘ assuming a single delta object.

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B. Wiener filter regularization

By assuming a perfectly shift-invariant BRDF, a Wiener filter similar to those applied to image restoration can be derived [2,26,27]. In this work, however, we require a more general form of the Wiener filter that can be applied to the shift-variant BRDF of section 2.4. The derivation of the Wiener filter based on the Bayesian theorem [22,33] and the minimization principle [29] is outlined in appendix A5 ~ A7 for completeness (see also [23,24,25]), and the resulting Wiener filter is shown in eq. (2-45), where π΅π‘Ÿ,π‘ βˆ— is the complex-conjugate of π΅π‘Ÿ,𝑠 defined in eq. (2-13) (note: π‘Ÿ and 𝑠 correspond to 𝑝 and π‘ž in eq. (2-13) respectively), and π‘‚Μ‚π‘ž is the Fourier coefficient of the Wiener filter estimate 𝐿̂ . (Definitions of other coefficients: π‘€π‘œπ‘π‘— 𝑠 from eq. (2-11), 𝐡𝑝,π‘ž from eq. (2-13), 𝑆𝑠,𝑠 from eq. (2-21), 𝐷𝑠 from eq. (2-24), 𝛼 from eq. (2-32), 𝛽0 from eq. (a2) in

If the measurement noise is white and approximated as Gaussian with a standard deviation 𝜎(𝑀0), eq. (2-45) is simplified to eq. (2-46). The second term is a regularizer defined as the inverse of π‘†π‘π‘…π‘ π‘Šπ‘–π‘’π‘›π‘’π‘Ÿ in eq.

(2-47). We will use these expressions for the experimental verifications.

βˆ‘ {π΅π‘Ÿ,π‘ βˆ— βˆ‘ π΅π‘Ÿ,π‘žπ‘‚Μ‚π‘ž

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2.6 Experimental verification

In this section, the relative noise error and the two regularization methods derived in the previous sections will be experimentally verified with a variety of scattering materials.

A. Experimental setup and BRDF measurements

Fig. 2-9. (a) Experimental set-up (top view). (b) One-dimensional radiometric intensity from LCD used as 𝑳𝒐𝒃𝒋. (c) and (d) Actual photographs of the set-up in the enclosure.

Fig. 2-9 (a) shows a schematic of the experimental set-up which reproduces the imaging scenario of fig.

1-1 assuming one-dimensional objects, and fig. 2-9 (c) and (d) are actual photographs of the set-up. It consists of shot-noise limited CMOS camera in the visible wavelength (Photometrics Prime) mounted on a computer controlled angular stage, and an LCD monitor. Though the methods and analyses of the previous sections are applicable to the entire light field, we measure only the angular component from a single spatial location in the

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current experiment since it is sufficient for verifying the above conclusions. For this reason, the camera captures one single point on the scattering surface 𝑦𝑠 = π‘π‘Ÿ= 0 (restricted by eq. (2-4)) from a variety of different camera angles (29 ~ 61 degree range with 0.5 degree resolution) resulting in the measured radiometric intensity πΏπ‘šπ‘’π‘Žπ‘ (πœƒπ‘š). In addition, rather than use real objects as shown in fig. 1-1, we employ a well-calibrated LCD monitor to generate the object light field distribution πΏπ‘œπ‘π‘—(πœƒπ‘œ) (shown in fig. 2-9 (b)) appropriate for the point on the scattering surface restricted by eq. (2-5). For suppressing ambient and stray light, the enclosure is designed with an interior entirely covered with black felt, and baffles are employed to reduce unwanted reflections.

Since our experiments are designed for one-dimensional objects, the measurement of the BRDF is greatly simplified. The measurement consists of illuminating the scattering surface with a single narrow slit of light from the LCD screen and recording the scattered light with the camera as a function of output angle of the BRDF πœƒπ‘š. This measurement is repeated many times, each for a different slit location corresponding to various input angles of the BRDF πœƒπ‘œ. Fig. 2-10 shows measured BRDFs at three input angles with their corresponding degree of specularity 𝛾 as defined by eq. (2-38) of four scattering materials.

Fig. 2-10 (c) shows how the measurements are fit to the BRDF model of eq. (2-14) to compute our analytical expressions. The window function 𝑓𝑀𝑖𝑛𝑑 is sufficiently slowly varying in all samples that it can be ignored in the analytical expressions and the regularization methods derived in the previous sections. The shift-invariant specular component 𝑓𝑠𝑝𝑒𝑐 is approximated as the area above the dotted line connecting both edges of the solid curve having a peak around the center of the angular domain, and the area below the dotted line represents the diffuse component. As the simplest expression, the separable function of the diffuse component is approximated as 𝑓𝑑𝑖𝑓𝑓(πœƒπ‘œ) Γ— 𝑓𝑑𝑖𝑓𝑓(πœƒπ‘š) β‰… (𝑙1πœƒπ‘œ+

𝑙2) Γ— (𝑙1πœƒπ‘š+ 𝑙2), and the constants 𝑙1 and 𝑙2 are determined so the expression can fit the dotted line in a least square sense. In addition, the camera's measurement noise was previously measured, and its standard deviation was obtained as a function of signal mean.

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Fig. 2-10. Experimentally measured BRDF samples: (a) Brushed metal, (b) coated white-paper with highlights #1, (c) coated white-paper with highlights #2, and (d) white paint with a pearl finish applied to glass.

B. Experimental verification of the relative noise error

The relative noise error βˆ†π‘ defined in eq. (2-48) (see eq. (2-10) for 𝑂𝑝) was computed from experimentally measured data through the following steps; 1) a sinusoidal intensity pattern of the pth Fourier component on a bias was reproduced on the LCD screen, 2) the camera data πΏπ‘šπ‘’π‘Žπ‘  (including measurement noise) was recorded as a function of camera angle, and 3) eq. (2-13) was then solved for π‘‚π‘π‘›π‘œπ‘–π‘ π‘’ with a truncated system matrix [𝐡] that included only Fourier terms from zero to 𝑝. This procedure was repeated 500 times to generate the standard deviation statistic for π‘‚π‘π‘›π‘œπ‘–π‘ π‘’ and eq. (2-48) was computed for a specific value of p.

βˆ†π‘β‰‘

βˆšπ‘‰π‘Žπ‘Ÿ[π‘‚π‘π‘›π‘œπ‘–π‘ π‘’]

|𝑂0| , where π‘‚π‘π‘›π‘œπ‘–π‘ π‘’β‰‘ 𝑂𝑝+ π‘›π‘œπ‘–π‘ π‘’ π‘’π‘Ÿπ‘Ÿπ‘œπ‘Ÿ (2-48)

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Fig 2-11 shows a comparison between the experimentally obtained values of βˆ†π‘ from eq. (2-48) and the theoretically calculated values of βˆ†Μƒπ‘ from eq. (2-37) for the four different BRDF samples in fig. 2-10. (Note:

The theoretical βˆ†Μƒπ‘ can be directly compared with the experimental βˆ†π‘, because βˆ†π‘β‰… βˆ†Μƒπ‘ from eq. (a3) in appendix A1.) Good agreements can be seen in all of the samples, which shows that the analytical BRDF model

The theoretical βˆ†Μƒπ‘ can be directly compared with the experimental βˆ†π‘, because βˆ†π‘β‰… βˆ†Μƒπ‘ from eq. (a3) in appendix A1.) Good agreements can be seen in all of the samples, which shows that the analytical BRDF model

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