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Continuity

In document SOFTWARE DESCRIPTION (Page 88-100)

User interface Enhanced Generic Test Software Library R&S EGTSL

5.5 Test Steps

5.5.2 Continuity

5.5.2.1 General

NOTE:

The continuity test is described in section 10.4.

Figure 5-16 Test Step Continuity, Test Properties General Pins

Pin List All measuring pins entered in the Pin List are checked for continuity.

Opens the Pins dialog box for inserting / removing pins on the Pin List. For more information, see section 5.5.12.2.

Evaluation

Resistor Limit The maximum resistance that is still evaluated as continuity is entered

in this field. Value range: 1  ... 1 k

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Source Instrument

Voltage The voltage of the voltage source is entered in this field.

Value range: 0.1 V ... 0.5 V Default: 0.2 V

Current Limit The current limit of the voltage source is entered in this field.

Value range: 1 µA ... 100 mA Default:

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Enhanced Generic Test Software Library R&S EGTSL

5.5.2.2 Timing

Figure 5-17 Test Step Continuity, Test Properties Timing NOTE:

The individual options for the timing of the measurement opera- tion are described in more detail in section 5.5.12.1.

Max. Wait Interval The maximum duration of the test interval for each individual pin is en-

tered in this field (maximum 20 samples). Value range:

0 ms ... 10 s Resolution:

1 ms (at a Max. Wait Interval of 1 ms a sample is taken every 50 µs) Default:

20 ms

Max. Wait Accuracy In this field the maximum percentage difference between two meas-

ured values in succession (samples) is entered for test steps in which the measured value is applied (measurement with “Max. Wait Inter-

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5.5.2.3 Results Details

For the Continuity test step, the following information is displayed in the

Results/Details window after the execution of test step:

Figure 5-18 Test Step Continuity, Results Details

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User interface

Enhanced Generic Test Software Library R&S EGTSL

5.5.3 Diode

5.5.3.1 Limits

NOTE:

The diode test is described in section 10.5.

Figure 5-19 Test Step Diode, Test Properties Limits

Enable During the diode test, two measurements are performed optionally:

Voltage Measurement

Measurement of the forward bias voltage (knee voltage)

Current Measurement

Measurement of the reverse bias current

The related measurement is performed when the check box is select- ed. At least one measurement must be activated.

Voltage Measurement

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Upper Limit Lower Limit

The upper and lower limits of the measured forward bias voltage (knee voltage) can be entered in these fields. The fields on the left contain the absolute value in the same unit as the nominal value. The fields on the right contain the deviation from the nominal value as a percentage.

Inactive input fields (which appear in grey) are recalculated and dis- played with the command “Edit…Apply”.

Absolute / Relative This setting determines whether limits will be entered as absolute val-

ues or relative values.

Current Measurement

Nominal The nominal value for the reverse bias current to be measured is en-

tered in this field.

Upper Limit Lower Limit

The upper and lower limits of the measured reverse bias current can be entered in these fields. The fields on the left contain the absolute value in the same unit as the nominal value. The fields on the right contain the deviation from the nominal value as a percentage. Inactive input fields (which appear in grey) are recalculated and dis- played with the command “Edit…Apply”.

Absolute / Relative This setting determines whether limits will be entered as absolute val-

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User interface

Enhanced Generic Test Software Library R&S EGTSL

5.5.3.2 Settings

Figure 5-20 Test Step Diode, Test Properties Settings Voltage Measurement

Voltage The voltage of the voltage source is entered in this field.

Value range: -5.0 V ... 5.0 V Default: 2.0 V

Current The current limit of the voltage source is entered in this field.

Value range: 1.0 µA ... 100 mA Default:

10 mA

Range The measuring range of the voltmeter is entered in this field.

Value range: 10 mV ... 5.0 V Default:

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Current Measurement

Voltage The voltage of the voltage source is entered in this field.

Value range: -5.0 V ... 5.0 V Default: -1.5 V

Current The current limit of the voltage source is entered in this field.

Value range: 1.0 µA ... 100.0 mA Default:

10 mA

Range The measuring range of the current meter is entered in this field.

Value range: 0.0 µA ... 200 mA Default:

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User interface

Enhanced Generic Test Software Library R&S EGTSL

5.5.3.3 CNX

Figure 5-21 Test Step Diode, Test Properties CNX

Pin HI The Pin HI (diode anode) is entered in this field. Only one measuring

pin can be entered.

Pin LO The Pin LO (diode cathode) is entered in this field. Only one measur-

ing pin can be entered.

Pin Guard The Pin Guard is entered in this field. Several measuring pins can be

entered. The individual entries (measuring pins) are separated with commas.

Opens the Pins dialog box for inserting / removing pins on the Pin List. For more information, see section 5.5.12.2.

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5.5.3.4 Timing

Figure 5-22 Test Step Diode, Test Properties Timing NOTE:

The individual options for the timing of the measuring process are described in more detail in section 5.5.12.1.

The timing settings can be made separately for the Voltage Measurement and the Current Measurement.

Delay The fixed delay to the start of the measurement is entered in this field.

Value range: 0 ms ... 1 s Resolution: 1 ms Default: 0 ms

Max. Wait Interval The maximum duration of the test interval is entered in this field (max-

imum 20 samples). Value range: 0 ms ... 10 s Resolution:

1 ms (at a Max. Wait Interval of 1 ms a sample is taken every 50 µs) Default:

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Enhanced Generic Test Software Library R&S EGTSL

Max. Wait Accuracy In this field the maximum percentage difference between two meas-

ured values in succession (samples) is entered for test steps in which the measured value is applied (measurement with “Max. Wait Inter- val”).

Value range: 0.0 % ... 10.0 % Default:

1.0 %

Average The number of measured values from which the mean for the meas-

ured result is to be determined is entered in this field. Value range:

1 ... 1000 Default: 1

Sample Interval The waiting time between the individual measurements for the forma-

tion of the mean is entered in this field (measurement with Average ). Value range: 5 µs ... 1 s Resolution: 5 µs Default: 5 µs (200 kHz)

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5.5.3.5 Results Details

For the Diode test step, the following information is displayed in the Re-

sults/Details window after the execution of test step:

Figure 5-23 Test Step Diode, Results Details

MU = voltage measuring unit CMU = current measuring unit

Status Status of the measuring hardware:

Normal, Overrange, Underrange, Max Wait Timeout.

Range Range of the measuring hardware in which the measurement was

carried out.

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Enhanced Generic Test Software Library R&S EGTSL

In document SOFTWARE DESCRIPTION (Page 88-100)

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