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AlN layer

Characteristic of AlN Layer Deposited by d.c. Magnetron Sputtering on AISI 410 Steel

Characteristic of AlN Layer Deposited by d.c. Magnetron Sputtering on AISI 410 Steel

... Fig. 3 shows the anodic potentiodynamic polarization curves of the untreated and treated AlN deposited by d.c. magnetron sputtering in 0.9% NaCl solution. The untreated steel did not have a passivation region, ...

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Thickness Dependence on Interfacial and Electrical Properties in Atomic Layer Deposited AlN on c plane GaN

Thickness Dependence on Interfacial and Electrical Properties in Atomic Layer Deposited AlN on c plane GaN

... 7.4-nm-thick AlN are shown in ...GaN layer, whereas the diffusion of Pt atoms into the GaN layer was suppressed effectively because of the AlN ...thick AlN layer (> ...

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Polarity Control in GaN Epilayers Grown by Metalorganic Chemical Vapor Deposition

Polarity Control in GaN Epilayers Grown by Metalorganic Chemical Vapor Deposition

... A schematic of the process flow for fabricating a lateral p/n diode: (1) LT- AlN growth, (2) AlN layer patterning, (3) GaN growth, (4) n-type ohmic contact formation on N-polar domains, [r] ...

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Impacts of Thermal Atomic Layer Deposited AlN Passivation Layer on GaN on Si High Electron Mobility Transistors

Impacts of Thermal Atomic Layer Deposited AlN Passivation Layer on GaN on Si High Electron Mobility Transistors

... of AlN-passivated device is almost unchanged compared with the sample before AlN ...the AlN/capGaN interface was not obvious ...the AlN passivation layer is negli- ...crystalline ...

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Advanced Plasma Nitriding for Aluminum and Aluminum Alloys

Advanced Plasma Nitriding for Aluminum and Aluminum Alloys

... the AlN layer surface and the inside of AlN layer in the cross-section, were listed in Table ...cross-sectional AlN layer, especially for cast and cold pressed ...the AlN ...

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Feasibility of Plasma Nitriding for Effective Surface Treatment of Pure Aluminum

Feasibility of Plasma Nitriding for Effective Surface Treatment of Pure Aluminum

... The nitriding temperature also plays an important role on AlN formation. When increasing the nitriding temperature to 873 K, the thickness of AlN increased to nearly 5 mm by 72 ks (20 h) nitriding as shown ...

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Influence of Substrate Materials upon Fabrication of Aluminum Nitride Coatings by Reactive RF Plasma Spraying

Influence of Substrate Materials upon Fabrication of Aluminum Nitride Coatings by Reactive RF Plasma Spraying

... and AlN layer, cross section micro Vickers hardness was evaluated ...into AlN layer, Al interlayer and carbon steel substrate ...of AlN layer was much lower than pure AlN ...

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Metal organic vapour phase epitaxy growth of GaN wires on Si (111) for light emitting diode applications

Metal organic vapour phase epitaxy growth of GaN wires on Si (111) for light emitting diode applications

... III-Nitride semiconductor nanowires (NWs) have recently attracted great interest due to their potential applications including light-emitting diodes (LEDs), lasers, photodetec- tors, gas sensors and solar cells [1-5]. ...

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AlN Surface Passivation of GaN Based High Electron Mobility Transistors by Plasma Enhanced Atomic Layer Deposition

AlN Surface Passivation of GaN Based High Electron Mobility Transistors by Plasma Enhanced Atomic Layer Deposition

... of AlN was reported by ...grown AlN suggested the refractive index is between ...grown AlN films, which can be attributed to a lower crystallinity of PEALD-grown ...ALD-grown AlN layer, ...

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Effects of Post Annealing Treatments on the Interfacial Chemical Properties and Band Alignment of AlN/Si Structure Prepared by Atomic Layer Deposition

Effects of Post Annealing Treatments on the Interfacial Chemical Properties and Band Alignment of AlN/Si Structure Prepared by Atomic Layer Deposition

... of AlN layer due to the exposure to air during transporting the sample to the XPS ...for AlN films deposited by PEALD using NH 3 plasma on Si ...

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Annealing of an AlN buffer layer in N2-CO for growth of a high-quality AlN film on sapphire

Annealing of an AlN buffer layer in N2-CO for growth of a high-quality AlN film on sapphire

... MOVPE-grown AlN layer on sapphire without annealing of the AlN bu ff er layer is 1000 – 2000 arcsec, and the density of type- a dislocations is 10 10 cm − 2 ...

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Improving the emission efficiency of MBE grown GaN/AlN QDs by strain control

Improving the emission efficiency of MBE grown GaN/AlN QDs by strain control

... In our previous experiments, GaN/AlN QDs with var- ied morphologies have been obtained by properly choos- ing the growth parameters. The emission peaks of the QDs vary from 400 to 670 nm, and the QDs with a lar- ...

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Aluminum Nitride Bulk Crystal Growth in a Resistively Heated Reactor

Aluminum Nitride Bulk Crystal Growth in a Resistively Heated Reactor

... of AlN bulk crystals on SiC seeds was investigated as a means to scale up maximum single crystal size and pre-define crystal ...of AlN growth was highly sensitive to the growth temperature, and influenced ...

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Al-rich AlGaN and AlN Growth on Bulk AlN Single Crystal Substrates

Al-rich AlGaN and AlN Growth on Bulk AlN Single Crystal Substrates

... polished AlN substrates, shown in Figure ...the AlN substrate surfaces, which are thought to be related to the surface passivation, are not present on freshly grown epitaxial film ...

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INTERFACES IN NOVEL ELECTRONIC MATERIALS

INTERFACES IN NOVEL ELECTRONIC MATERIALS

... optoelectronic devices. Unlike silicon and other traditional materials such as GaAs, III- nitrides are particularly suitable for high-frequency, high-power and high-temperature applications. Unfortunately, the choice of ...

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Efficiency improvement of GaN based ultraviolet light emitting diodes with reactive plasma deposited AlN nucleation layer on patterned sapphire substrate

Efficiency improvement of GaN based ultraviolet light emitting diodes with reactive plasma deposited AlN nucleation layer on patterned sapphire substrate

... cap layer (p-doping = 5 × 10 17 cm −3 ) grown at 1,030°C, and a 4-nm-thick p-type InGaN con- tact ...RPD AlN nucleation layer ...(ITO) layer was employed to be a p-type ohmic con- tact ...

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Analyses of 2 DEG characteristics in GaN HEMT with AlN/GaN super lattice as barrier layer grown by MOCVD

Analyses of 2 DEG characteristics in GaN HEMT with AlN/GaN super lattice as barrier layer grown by MOCVD

... rier layer, this increases the strength of polarization; on the other hand, increasing the Al content in the ternary layer may deteriorate the quality of AlGaN due to large lattice mis-match, and ternary ...

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Effects of residual stress distribution on Interfacial Adhesion of Magnetron Sputtered

Effects of residual stress distribution on Interfacial Adhesion of Magnetron Sputtered

... residual stress profiles for the two coatings with Al bond layer (AlN/Al with -30V and -100V bias), obtained by 221. using the FIB-DIC depth profiling method described in [14].[r] ...

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Fabrication of AlN Coatings by Reactive Atmospheric Plasma Spray Nitriding of Al Powders

Fabrication of AlN Coatings by Reactive Atmospheric Plasma Spray Nitriding of Al Powders

... ature was measured on the back surface of the substrate by thermocouple. The existence of AlN phase in the deposited coatings and the collected particles were verified by X-ray diffraction analysis (XRD: RINT-2500, ...

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Influence of Sputter Deposition Time on the Growth of c Axis Oriented AlN/Si Thin Films for Microelectronic Application

Influence of Sputter Deposition Time on the Growth of c Axis Oriented AlN/Si Thin Films for Microelectronic Application

... oms with more energy favor the formation of {002} sur- face plane. Another factor, which strongly influences the formation of preferred surface planes, is packing habit of such planes. For the development of close-packed ...

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