1. By microscopy techniques which characteristic information can be obtained? a. Topography
b. Morphology c. Composition d. all of the above
[d] all of the above
2. The information, how the atoms are arranged in the object is known as… a. Topography
b. Morphology c. Composition d. Crystallography
[d] Crystallography
3. The information, how the surface and texture of the object looks, is known as… a. Topography
b. Morphology c. Composition d. Crystallography
[a] Topography
4. The information about the shape and size of the particles making up the object is known as… a. Topography b. Morphology c. Composition d. Crystallography [b] Morphology
5. The information about the elements and compounds that the object is composed of, is known as.. a. Topography b. Morphology c. Composition d. Crystallography [c] Composition
6. The full form of SEM is...
a. scanning electron microscope b. scientific electron microscope c. systematic electron microscope d. super electrical microscope
[a] scanning electron microscope 7. The full form of STM is...
a. scanning tunneling microscope b. scientific technical microscope c. systematic technical microscope d. super tensile microscope
[a] scanning tunneling microscope 8. What does 'S' stand for in STM?
a. scanning b. scientific c. systematic d. super
[a] scanning 9. What does 'T' stand for in STM?
a. tunneling b. technical c. tunning d. tensile
[a] tunneling 10. What does 'M' stand for in STM?
a. microprobe b. microscope c. micron
d. None of the above
[b] microscope 11. The full form of TEM is...
a. Technical electron microscope b. Teaching electronics microscope c. Transmission electron microscope d. None of the above
[c] Transmission electron microscope 12. What does 'T' stand for in TEM?
b. technical c. transmission d. tensile
[c] transmission 13. What does 'E' stand for in TEM?
a. electrical b. electron c. electronics
d. None of the above [b] Electron 14. What does 'M' stand for in TEM?
a. microprobe b. microscope c. micron
d. None of the above
[b] Microscope 15. Which statement is true for TEM?
a. Require extensive sample preparation b. Use electron beam instead of light beam c. The structure of the sample may change d. all of the above
[d] all of the above
16. Which of the following technology do not require vacuum treatment? a. AFM
b. SEM
c. both AFM & SEM d. none of the above
[a] AFM 17. The full form of AFM is...
a. Atomic force microscope b. Atom force microscope c. Atomic force microprobe d. Atomic factor microscope
[a] scanning tunneling microscope 18. What does 'A' stand for in AFM?
a. Atom b. Atomic c. Approximate d. Approved
[b] Atomic 19. What does 'F' stand for in AFM?
a. fine b. front c. force d. flux
[c] force 20. What does 'M' stand for in AFM?
a. microprobe b. microscope c. micron
d. None of the above
[b] microscope 21. TEM was built by
a. Albert and James Hiller
b. Gerd Binning and Heinrich Rohrer c. Ralph Merkle
d. None of the above
[a] Albert and James Hiller 22. STM was invented by
a. Albert and James Hiller
b. Gerd Binning and Heinrich Rohrer c. Ralph Merkle
d. None of the above
[b] Gerd Binning and Heinrich Rohrer
23. Which microscopy can work both in contact and non contact mode? a. AFM
b. SEM c. TEM
d. none of the above [a] AFM
24. What made it possible to study atoms and their manipulation in developing new structures? a. AFM b. SEM c. TEM d. STM [d] STM
25. Which statement is true?
a. STM can only image conducting or semiconducting surfaces.
b. AFM can image any type of surface, including polymers, ceramics, composites, glass and biological samples.
c. AFM can move into potential regions inaccessible to the STM. d. All above
[d] All above 26. Which statement is true?
a. AFM does not depend on a current; it can be used to visualize any type of surface. b. AFM can move into potential regions inaccessible to the STM.
c. Both [a] & [b] d. None of the above
[c] Both [a] & [b]
27. Which statement is true for TEM?
a. A relatively large time consuming process.
b. The structure of the sample may change during the preparation process. c. The field of view is small
d. All above
[d] All above
28. Which statement is true for microscopy of nanomaterials?
a. Visible light wavelength is much larger compared to nanomaterials. b. Ultrasonic’s runs into problem of absorption.
c. X – Ray exhibit a lack of interaction both in focusing and interacting with sample. d. All above
29. Why visible light is not used for microscopy of nanomaterials? a. Visible light wavelength is much larger compared to naomaterials. b. Runs into problem of absorption.
c. Exhibit a lack of interaction both in focusing and interacting with sample. d. All above
[a] Visible light wavelength is much larger compared to naomaterials. 30. Why Ultrasonic waves are not used for microscopy of nanomaterials?
a. Wavelength is much larger compared to naomaterials. b. Runs into problem of absorption.
c. Exhibit a lack of interaction both in focusing and interacting with sample. d. All above
[b] Runs into problem of absorption.
31. Why X – Rays are not used for microscopy of nanomaterials? a. Wavelength is much larger compared to naomaterials. b. Runs into problem of absorption.
c. Exhibit a lack of interaction both in focusing and interacting with sample. d. All above
[c] Exhibit a lack of interaction both in focusing and interacting with sample. 32. We use electrons for the microscopy of nanomaterials because ….
a. Electrons have both particle and wave nature. b. They provide a better resolution.
c. Both [a] & [b] d. None of the above
[c] Both [a] & [b]
33. Which statement is not true for STM? a. It is a non – optical microscopy method. b. It uses tunneling process.
c. It can scan all type of surfaces. d. None of the above
34. Which statement is true for STM?
a. It can scan a scale from microns down to nano meter range. b. It can scan only conducting or semiconducting surfaces. c. It is a non – optical microscopy technique.
d. All above
[d] All above
35. To scan fragile material ……. microscopy is best suitable. a. AFM
b. STM c. TEM
d. None of the above [a] AFM
36. …… microscopic technique have cantilever shaped sharp tip at its end. a. AFM
b. STM c. TEM
d. None of the above [a] AFM
37. During AFM, when the cantilever tip is brought in contact to the sample material, the tip is
a. Attracted b. Repelled
c. Neither attracted nor repelled d. Both [a] & [b]
[d] Both [a] & [b]
38. Which microscopic technique is best suitable to study insulators, organic materials, biological materials, polymers and glasses in different environment?
a.AFM b. STM c. TEM
[a] AFM
39. Which statement is true for TEM?
a. The working principle is same as light microscopy. b. It produces 2D image.
c. Require extensive sample preparation. d. All above
[d] All above
40. Which statement is true for TEM?
a. The working principle is same as light microscopy. b. It produces 2D image.
c. Require extensive sample preparation. d. All above
[d] All above
41. The main drawbacks of TEM are. a. Require extensive sample preparation b. The field of view is relatively small. c. The structure of the sample may change d. all of the above
[d] all of the above
42. …… microscopy technique uses lenses. a. TEM
b. STM c. AFM
d. All of the above [a] TEM
43. …… microscopy technique require sample to be very thin and able to withstand the high vacuum present inside the instrument.
a. TEM b. STM c. AFM
d. All of the above [a] TEM
44. …… microscopy technique is known as optical technique. a. TEM
b. STM c. AFM
d. All of the above [a] TEM
45. Which microscopy uses tunneling cureent? a. STM
b. TEM c. AFM
d. All of the above [a] STM
46. All electromagnetic radiation have the velocity ……… in vacuum. a. 3 × 10 -8 cm/sec b. 3 × 10 8 cm/sec c. 3 × 10 -10 cm/sec d. 3 × 10 10 cm/sec [d] 3 × 10 10 cm/sec 47. 48. 49. 50.
UNIT V NANOTECHNOLOGY APPLICATION