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Interface Reference of the Probe

In document GENEX Probe User Guide-(V200R003_04) (Page 141-145)

Test Terminal

Step 3 View the information about the protocols used by data packets Choose View > Message > IP Messages.

12 Interface Reference of the Probe

About This Chapter

This describes the interface and parameters of the Probe. You can refer to these parameters when you collect, view, and replay the data through the Probe.

12.1 Interface Description: Test Plan Control Window

This describes the Test Plan Control window and helps you understand the window component, the function of each component, and the function of the shortcut icon.

12.2 Interface Description: Engineering Parameter management Window

This describes the Engineering Parameter management window and helps you understand the window component, the function of each component, and the function of the shortcut icon.

12.3 Interface Description: OutdoorMap Window

This describes the OutdoorMap window and helps you understand the window component, the function of each component, and the function of the shortcut icon.

12.4 Interface Description: IndoorMap Window

This describes the IndoorMap window and helps you understand the window component, the function of each component, and the function of the shortcut icon.

12.5 Interface Description: Test Data View

This describes the test data view. You can learn the mode in which the Probe displays the data.

12.6 Interface Description: Line Chart View

This describes the Line Chart window and helps you understand the window components, the function of each component, and the function of the shortcut icon.

12.7 Parameters for Configuring External Devices

This section describes the parameters for configuring external devices. You can refer to this section when configuring parameters for a test terminal, a GPS, or a scanner.

12.8 Parameters for Filtering the Original Data

This describes the parameters for filtering the original data in the Filter dialog box. You can refer to these parameters when you configure whether to report or collect the signaling on a test terminal.

This describes the parameters for configuring the test items and attributes of the MS and scanner. You can refer to these parameters when you configure the MS or scanner test plan in the Test Plan Control window.

12.10 Parameters for Monitoring the Test

This describes the parameters for monitoring the test. During the test or replay, you can refer to these parameters when you query the status and statistics value of each test item in the test plan in the Test Plan Control window.

12.11 Parameters for Importing the Engineering Parameters

This describes the parameters for importing the engineering parameters. You can refer to these parameters when you import the engineering parameters.

12.12 Parameters for Importing the Outdoor Raster Map

This describes the parameters for importing the outdoor raster map. You can refer to these parameters when you import the outdoor raster map or add the outdoor raster map.

12.13 Parameters for Configuring the Legend Properties

This describes the parameters for configuring the legend properties of the IE layer and layer offset properties. You can refer to the description when configuring the legend properties of the IE layer in the Layer Parameter dialog box or configuring the layer offset properties in the Layer Offset dialog box.

12.14 Parameters for Configuring the Layer Control Properties

This describes the parameters for configuring the layer control properties, such as layer display properties and layer label properties. You can refer to these parameters when you configure the layer display properties in the Layer Control dialog box.

12.15 Parameters for Setting the Predefined Event

This describes the proprieties of the predefined event. You can refer to these parameters when you set the properties of the predefined event in the System Configure dialog box.

12.16 Parameters for Configuring the Device Alarm

This describes the parameters for configuring the device alarm. You can refer to these parameters when you configure the device alarm in the System Configure dialog box.

12.17 Parameters for Setting IE Audio Indications

This describes the parameters about setting audio indications for IEs. You can set related parameters according to the following information when configuring audio indications for IEs.

12.18 Parameter for Other System Settings

This describes the parameters related to other system settings. You can refer to this part when synchronizing the external device time, setting logfile storage properties, or setting event replay mode.

12.19 Parameters for Configuring the Properties of the List Views

This describes the parameters for configuring the properties of the list view. You can refer to the description when configuring the properties of the list view.

12.20 Parameters for Configuring the Properties of the Line Chart View

This describes the parameters for configuring the properties of the line chart view. You can refer to these parameters when you configure the properties of the line chart view.

12.21 Parameters for Testing the Forcing Feature of the GSM

This describes the parameters for testing the forcing function of the GSM. You can refer to this part when setting the parameters for testing the forcing function of the GSM in the GSM Forcing Feature dialog box.

12.22 Parameters for WCDMA Forcing Feature Test

12 Interface Reference of the Probe

GENEX Probe User Guide

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Copyright © Huawei Technologies Co., Ltd.

This describes the parameters related to the WCDMA forcing feature test. You can refer to this part when setting WCDMA forcing feature test parameters in the WCDMA Forcing Feature dialog box.

12.23 Parameter Description: LTE Forcing Feature Test

This section describes the parameters related to the LTE forcing feature test. You can set parameters related to the LTE forcing feature test in the LTE Forcing Feature dialog box by referring to this section.

12.24 Parameters for Performing the C/A Measurement of the GSM

This describes the parameters for performing the C/A measurement of the GSM. You can refer to this part when setting parameters for performing the C/A measurement of the GSM in the GSM C/A Setting dialog box.

12.25 Parameters for Exporting the Data

This describes the parameters for exporting data. You can refer to this part when converting a .gen file to the file in other formats or converting a .phu file to a .gen file.

12.26 Parameters for Configuring the Data Export Format of the Scanner

This describes the parameters for configuring the export format of the CW data of the PCTel DTI scanner. You can refer to this part when exporting the CW data of the PCTel DTI scanner.

12.1 Interface Description: Test Plan Control Window

This describes the Test Plan Control window and helps you understand the window component, the function of each component, and the function of the shortcut icon.

Figure 12-1 shows the Test Plan Control window and Table 12-1 provides the description of the Figure 12-1.

Figure 12-1 Test Plan Control window

Table 12-1 Description of the Test Plan Control window

No. Name Description

1 Toolbar for Controlling the Test Plan

Provides the shortcut icon for editing the test item and controlling the test plan.

2 Test item list Provides the default test item. You can select the

test item according to requirements. 12 Interface Reference of the Probe

GENEX Probe User Guide

12-4 Huawei Proprietary and Confidential

Copyright © Huawei Technologies Co., Ltd.

No. Name Description 3 Attribute and statistics value

list

Contains the Config and Statistic tab pages. l Config tab page: You can set the properties

of each test item.

l Statistic tab page: Displays the statistics value of the test item that is performed. For detailed description of the parameters, see

12.10 Parameters for Monitoring the Test.

4 List of the test item that is performed

Displays the test item that is performed.

In document GENEX Probe User Guide-(V200R003_04) (Page 141-145)