Technical
Publications
Advanced Service Documentation Property of GE
For GE Service Personnel Only
No Rights Licensed Ċ Do Not Use or Copy Disclosure to Third Parties Prohibited
Direction 46–017207
Revision 11
AMX-4 Series Diagnostics
THIS SERVICE MANUAL IS AVAILABLE IN ENGLISH ONLY.
IF A CUSTOMER’S SERVICE PROVIDER REQUIRES A LANGUAGE OTHER
THAN ENGLISH, IT IS THE CUSTOMER’S RESPONSIBILITY TO PROVIDE TRANSLATION SERVICES.
DO NOT ATTEMPT TO SERVICE THE EQUIPMENT UNLESS THIS SERVICE
MANUAL HAS BEEN CONSULTED AND IS UNDERSTOOD.
FAILURE TO HEED THIS WARNING MAY RESULT IN INJURY TO THE SERVICE
PROVIDER, OPERATOR OR PATIENT FROM ELECTRIC SHOCK, MECHANICAL OR OTHER HAZARDS.
CE MANUEL DE MAINTENANCE N’EST DISPONIBLE QU’EN ANGLAIS. SI LE TECHNICIEN DU CLIENT A BESOIN DE CE MANUEL DANS UNE AUTRE
LANGUE QUE L’ANGLAIS, C’EST AU CLIENT QU’IL INCOMBE DE LE FAIRE TRADUIRE.
NE PAS TENTER D’INTERVENTION SUR LES ÉQUIPEMENTS TANT QUE LE
MANUEL SERVICE N’A PAS ÉTÉ CONSULTÉ ET COMPRIS.
LE NON-RESPECT DE CET AVERTISSEMENT PEUT ENTRAÎNER CHEZ LE
TECHNICIEN, L’OPÉRATEUR OU LE PATIENT DES BLESSURES DUES À DES DANGERS ÉLECTRIQUES, MÉCANIQUES OU AUTRES.
DIESES KUNDENDIENST–HANDBUCH EXISTIERT NUR IN ENGLISCHER
SPRACHE.
FALLS EIN FREMDER KUNDENDIENST EINE ANDERE SPRACHE BENÖTIGT,
IST ES AUFGABE DES KUNDEN FÜR EINE ENTSPRECHENDE ÜBERSETZUNG ZU SORGEN.
VERSUCHEN SIE NICHT, DAS GERÄT ZU REPARIEREN, BEVOR DIESES
KUNDENDIENST–HANDBUCH NICHT ZU RATE GEZOGEN UND VERSTANDEN WURDE.
WIRD DIESE WARNUNG NICHT BEACHTET, SO KANN ES ZU VERLETZUNGEN
DES KUNDENDIENSTTECHNIKERS, DES BEDIENERS ODER DES PATIENTEN DURCH ELEKTRISCHE SCHLÄGE, MECHANISCHE ODER SONSTIGE GEFAHREN KOMMEN.
ESTE MANUAL DE SERVICIO SÓLO EXISTE EN INGLÉS.
SI ALGÚN PROVEEDOR DE SERVICIOS AJENO A GEMS SOLICITA UN IDIOMA
QUE NO SEA EL INGLÉS, ES RESPONSABILIDAD DEL CLIENTE OFRECER UN SERVICIO DE TRADUCCIÓN.
NO SE DEBERÁ DAR SERVICIO TÉCNICO AL EQUIPO, SIN HABER
CONSULTADO Y COMPRENDIDO ESTE MANUAL DE SERVICIO.
LA NO OBSERVANCIA DEL PRESENTE AVISO PUEDE DAR LUGAR A QUE EL
PROVEEDOR DE SERVICIOS, EL OPERADOR O EL PACIENTE SUFRAN LESIONES PROVOCADAS POR CAUSAS ELÉCTRICAS, MECÁNICAS O DE OTRA
WARNING
AVERTISSEMENT
WARNUNG
ESTE MANUAL DE ASSISTÊNCIA TÉCNICA SÓ SE ENCONTRA DISPONÍVEL
EM INGLÊS.
SE QUALQUER OUTRO SERVIÇO DE ASSISTÊNCIA TÉCNICA, QUE NÃO A
GEMS, SOLICITAR ESTES MANUAIS NOUTRO IDIOMA, É DA RESPONSABILIDADE DO CLIENTE FORNECER OS SERVIÇOS DE TRADUÇÃO.
NÃO TENTE REPARAR O EQUIPAMENTO SEM TER CONSULTADO E
COMPREENDIDO ESTE MANUAL DE ASSISTÊNCIA TÉCNICA.
O NÃO CUMPRIMENTO DESTE AVISO PODE POR EM PERIGO A SEGURANÇA
DO TÉCNICO, OPERADOR OU PACIENTE DEVIDO A‘ CHOQUES ELÉTRICOS, MECÂNICOS OU OUTROS.
IL PRESENTE MANUALE DI MANUTENZIONE È DISPONIBILE SOLTANTO IN
INGLESE.
SE UN ADDETTO ALLA MANUTENZIONE ESTERNO ALLA GEMS RICHIEDE IL
MANUALE IN UNA LINGUA DIVERSA, IL CLIENTE È TENUTO A PROVVEDERE DIRETTAMENTE ALLA TRADUZIONE.
SI PROCEDA ALLA MANUTENZIONE DELL’APPARECCHIATURA SOLO DOPO
AVER CONSULTATO IL PRESENTE MANUALE ED AVERNE COMPRESO IL CONTENUTO.
NON TENERE CONTO DELLA PRESENTE AVVERTENZA POTREBBE FAR
COMPIERE OPERAZIONI DA CUI DERIVINO LESIONI ALL’ADDETTO ALLA MANUTENZIONE, ALL’UTILIZZATORE ED AL PAZIENTE PER FOLGORAZIONE ELETTRICA, PER URTI MECCANICI OD ALTRI RISCHI.
ATENÇÃO
TABLE OF CONTENTS
SECTION TITLE PAGE
REVISION HISTORY . . . xiii 1 INTRODUCTION . . . 1–1
1-1 General . . . 1–1 1-2 Diagnostics Identification . . . 1–2 1-3 Diagnostics Menu Items . . . 1–3 1-4 Sys Diagnostics . . . 1–4 1-5 Data Log . . . 1–5 1-6 Error Log . . . 1–6 1-7 Charge Batteries . . . 1–6 2 ENTERING DIAGNOSTICS . . . 2–1 2-1 Entering Diagnostics . . . 2–1 2Ć1Ć1 Entering Password . . . 2-2 2Ć1Ć2 Exit Diagnostics . . . 2-3 3 SYSTEM DIAGNOSTICS FOR AMX–4 UNITS WITH:
PROMS 46–302688G1/46–302687G1 OR 46–303272G1/46–303273G1
AND CPU BOARDS 46–232828 OR 46–264974. . . 3–1 3-1 System Block Test . . . 3–1 3Ć1Ć1 Running System Block Test . . . 3-2 3-2 Op Switch Test . . . 3–3 3Ć2Ć1 Running Op Switch Test. . . 3-4 3-3 Display Controller. . . 3–5 3-4 Battery Voltage. . . 3–6 3-5 Loop Test. . . 3–7 3-6 Demonstration Procedure. . . 3–9 3Ć6Ć1 Enter Loop Test. . . 3-9 3Ć6Ć2 Read a Port . . . 3-10 3Ć6Ć3 Write Then Read. . . 3-11 4 SYSTEM DIAGNOSTICS FOR AMX–4 UNITS WITH:
PROMS 46–303815G1/46–303816G1, 46–316685G1/46–316686G1,
OR 46–329187G1 or G2/46–329188G1 or G2 AND CPU BOARD 46–264974 4–1 4-1 System Block Test . . . 4–1 4Ć1Ć1 Running System Block Test . . . 4-2 4-2 Op Switch Test . . . 4–3 4Ć2Ć1 Running Op Switch Test. . . 4-4 4-3 Display Controller. . . 4–5 4-4 Battery Voltage. . . 4–6 4-5 Loop Test. . . 4–7 4-6 Demonstration Procedure. . . 4–9 4Ć6Ć1 Enter Loop Test. . . 4-9 4Ć6Ć2 Read a Port . . . 4-10 4Ć6Ć3 Write Then Read. . . 4-11
TABLE OF CONTENTS (Cont.)
SECTION TITLE PAGE
5 I/O PORTS . . . 5–1 5-1 Introduction . . . 5–1 5-2 Selected Functions . . . 5–2 5-3 Charger and Drive Status. . . 5–3 5-4 On–Board Status . . . 5–4 5-5 A/D Converter. . . 5–5 5-6 Operator I/O Status . . . 5–6 5-7 Generator and AEC Status . . . 5–7 5-8 Generator Control 2. . . 5–8 5-9 Charger and Drive Control . . . 5–9 5-10 AEC Control . . . 5–10 5-11 Generator Control 1. . . 5–11 5-12 A/D Control . . . 5–12 5-13 Set Back–Up Time. . . 5–13 5-14 On–Board Control . . . 5–13 5-15 Right Speed Command DAC. . . 5–14 5-16 Left Speed Command DAC . . . 5–14 5-17 Charge Current DAC. . . 5–14 5-18 Leakage Current Compensation DAC . . . 5–14 5-19 Programmable Timer. . . 5–14 5-20 Filament Current Demand DAC. . . 5–15 5-21 KVP Demand DAC . . . 5–15 5-22 Watchdog Timer. . . 5–15 5-23 Variables Unique To PROMS 46–302688G1/46–302687G1
and 46–303272G1/46–303273G1. . . 5–15 5-24 kVp/mAs Display After Exposure . . . 5–16 5-25 Critical Status . . . 5–16 5-26 Force the Use of 137 kV in Tapcal . . . 5–16 5-27 Force an Extended Charge Cycle. . . 5–16 6 DATA LOG . . . 6–1
6-1 Introduction . . . 6–1 6-2 Enter Data Log . . . 6–1 6Ć2Ć1 Enter View Data Log . . . 6-3 6Ć2Ć2 Enter Initialize Data Log. . . 6-4 6-3 Load Data Log . . . 6–4
TABLE OF CONTENTS (Cont.)
SECTION TITLE PAGE
8 CHARGER . . . 8–1 8-1 Introduction . . . 8–1 8-2 Entering Charger . . . 8–2 9 DATA BASE ACCESS . . . 9–1 9-1 Introduction . . . 9–1 9-2 Entering Data Base Access . . . 9–1 9Ć2Ć1 Entering Password . . . 9-2 9Ć2Ć2 Exit Without Changes . . . 9-3 9-3 Data Base Display. . . 9–3 9-4 Selecting Data Base Address . . . 9–4 9-5 Changing Data Base Values . . . 9–4 9-6 Check Sum and Limit Errors . . . 9–4 9-7 Demonstration Procedure. . . 9–4 9Ć7Ć1 Enter Data Base Access . . . 9-5 9Ć7Ć2 Change Field Light On-Time . . . 9-6 9Ć7Ć3 Test Change . . . 9-6 9Ć7Ć4 Enter Calibration . . . 9-7 9Ć7Ć5 Change Field Light On-Time . . . 9-7 9Ć7Ć6 Test Change Again . . . 9-7 9Ć7Ć7 Enter Data Base Access . . . 9-8 9Ć7Ć8 On Your Own . . . 9-8 9Ć7Ć9 Return The Original Value . . . 9-8 9-8 Floor Scuffing . . . 9–8 10 DATA BASE FOR AMX–4 UNITS WITH:
PROMS 46–302688G1/46–302687G1 OR 46–303272G1/46–303273G1
AND CPU BOARDS 46–232828 OR 46–264974. . . 10–1 10-1 Calibratible X–Ray Parameters . . . 10–1 10-2 Auto Cal Filament Current . . . 10–5 10-3 Filament Current Calibration Table . . . 10–6 10-4 Turns Ratio Taps . . . 10–7 10-5 System Resistance Taps . . . 10–8 10-6 Drive Parameters. . . 10–9 10-7 Charge Parameters . . . 10–12 10-8 Battery Parameters . . . 10–17 10-9 Field Light Parameters . . . 10–18
TABLE OF CONTENTS (Cont.)
SECTION TITLE PAGE
11 DATA BASE FOR AMX–4 UNITS WITH:
PROMS 46–303815G1/46–303816G1, 46–316685G1/46–316686G1,
OR 46–329187G1 or G2/46–329188G1 or G2 AND CPU BOARD 46–264974 11–1 11-1 Calibratible X–Ray Parameters . . . 11–1 11-2 Filament Current Calibration Table . . . 11–5 11-3 Turns Ratio Taps . . . 11–6 11-4 System Resistance Taps . . . 11–7 11-5 Drive Parameters. . . 11–8 11-6 Charge Parameters . . . 11–11 11-7 Battery Parameters for PROMS 46–303815G1/46–303816G1
or 46–316685G1/46–316686G1 . . . 11–15 11-8 Battery Parameters for PROMS
46–329187G1 or G2/46–329188G1 or G2 . . . 11–16 11-9 Field Light Parameters for PROMS
46–303815G1/46–303816G1 or 46–316685G1/46–316686G1 . . . 11–18 11-10 Field Light Parameters for PROMS
46–329187G1 or G2/46–329188G1 or G2 . . . 11–19 11-11 Auto Cal Filament Table . . . 11–20 11-12 Monitor Zero Capacity Millivolts for PROMS 46–303815G1/
46–303816G1 or 46–316685G1/46–316686G1 . . . 11–21 11-13 Battery Aging Capacity Offset for PROMS 46–329187G1 or G2/
46–329188G1 or G2 . . . 11–22 12 ERROR CODES . . . 12–1
12-1 Introduction . . . 12–1 12-2 Applications Error Handling Overview . . . 12–1 12-3 Circular Error Buffer . . . 12–1 12-4 Histogram Of Errors . . . 12–1
13 THEORY 13–1
13-1 Power–up Diagnostics . . . 13–1 13-2 Visual Indication Of Testing . . . 13–1 13-3 Power Up Tests . . . 13–1 13-4 80C31 Microcontroller Tests (test – 00) . . . 13–2 13-5 EPROM Checksum Test (test – 01) . . . 13–2 13-6 Ram Battery Test (test – 02) . . . 13–2 13-7 External Ram Test (test – 03) . . . 13–2 13-8 Calibration Data Checksum Test (test – 04) . . . 13–2
TABLE OF CONTENTS (Cont.)
SECTION TITLE PAGE
13-14 Battery Charge Diagnostics . . . 13–15 13Ć14Ć1 Battery Charger Run-Time Diagnostics. . . 13-15 13Ć14Ć2 Charging Diagnostics Display (Applies to PROMS 46-316685G1/
46-316686G1 and Later) . . . 13-15 13-15 Drive. . . 13–15 13Ć15Ć1 Drive Control. . . 13-15 13Ć15Ć2 Drive Diagnostics . . . 13-16 13Ć15Ć3 Drive Control Software Theory . . . 13-18 13-16 Generator Control . . . 13–21 13Ć16Ć1 Generator Control Algorithm. . . 13-21 13Ć16Ć2 Selecting The Proper KVp Demand. . . 13-21 13Ć16Ć3 Selecting The Proper Tap Relay Combination . . . 13-22 13Ć16Ć4 Selecting The Proper Filament Current Demand . . . 13-22 13Ć16Ć5 Auto Calibration . . . 13-22 13Ć16Ć6 Generator Control Diagnostics (Fault Detection) . . . 13-22 13-17 Field Light Control . . . 13–22 13-18 Bar Graph Control For Version 46–302688G1/46–302687G1 . . . 13–23 13-19 Bar Graph Control For Version 46–303272G1/46–303273G1
or 46–303815G1/46–303816G1 . . . 13–24 13-20 Bar Graph Control For Version 46–316685G1/46–316686G1 . . . 13–25 13-21 Battery Aging for Firmware 46–316685G1/46–316686G1
and Earlier. . . 13–26 13-22 Bar Graph Control For Version 46–329187G1 or G2/46–329188G1 or G2
(SMART GAUGE) . . . 13–26 13Ć22Ć1 Discharge Loads . . . 13-26 13Ć22Ć2 Emergency Capacity . . . 13-28 13Ć22Ć3 Recharge Phases . . . 13-28 13Ć22Ć4 Voltage Compensation. . . 13-32 13Ć22Ć5 Diagnostic Aids . . . 13-32 13Ć22Ć6 Battery Aging . . . 13-32 13-23 Heat Storage Tube Protection . . . 13–33 13-24 Service Mode . . . 13–33 13-25 Calibration. . . 13–33 13Ć25Ć1 Drive Handle Calibration . . . 13-33 13Ć25Ć2 Battery Charger Calibration . . . 13-33 13Ć25Ć3 Battery Voltmeter Calibration . . . 13-34 13Ć25Ć4 Generator Calibration . . . 13-34 13Ć25Ć5 mAs Calibration. . . 13-34 13Ć25Ć6 kVp Calibration . . . 13-34 13Ć25Ć7 Tap Relay Calibration. . . 13-35 13Ć25Ć8 Filament Current (X-ray Tube Characteristics) Calibration . . . 13-35 13Ć25Ć9 Field Light On Time Calibration . . . 13-36 13-26 Extended Diagnostics And Service Tools . . . 13–36 13-27 Data Log Access . . . 13–36 13-28 Data Base Access . . . 13–36
TABLE OF CONTENTS (Cont.)
SECTION TITLE PAGE
14 TROUBLESHOOTING HINTS AND SERVICE AIDS . . . 14–1 14-1 Isolating Battery Problems . . . 14–1 14Ć1Ć1 Voltage Drop Under Load. . . 14-1 14-2 CPU Dip Switch Positions . . . 14–2 14-3 Generator Cal. . . 14–3 14Ć3Ć1 Tube Spits During CALIBRATE TAPS" . . . 14-3 14Ć3Ć2 X-ray Word Limit During CAL FIL CUR TBL" . . . 14-3 14Ć3Ć3 Triggering - The Oscilloscope Prior to CALIBRATE kVp" . . . 14-3 14-4 Synchronizing Internal Capacity Meter to Capacity Displayed
(Firmware 46–329187G1 or G2 and 46–329188G1 or G2 Only). . . 14–4 15 BLOCK DIAGRAMS . . . 15–1 15-1 Illustration Listing . . . 15–1
REVISION HISTORY
REV DATE REASON FOR CHANGE
0 Feb. 15, 1988 Initial release. 1 May 20, 1988 Complete diagnostics.
2 Sept. 15, 1989 Extensive programming changes. 3 Jan. 1, 1990 New PROMS, programming changes.
4 Jan. 25, 1991 New PROMS, extensive programming changes. Add new separate sections for new PROMS for System Diagnostics and for Data Base.
5 Feb. 26, 1993 Add new PROMS 46-316685G1/46-316686G1. Add Model Numbers 46-315161 Series. Deleted references to obsolete PROMS
46-279026G9/46-279150G8 and to Charger Board 46-232842G1 which are no longer in the field. Add Section 13-15-3, Drive Control Software Theory", and add Left & Right Drive Functional Flow" diagram to Section 15. 6 Dec. 17, 1993 Add PROMS 46-329187G1/46-329188G1. Add Model 46-329267 Series.
Add Charger Board 46-288786G1.
7 Feb. 17, 1997 Corrected Monitor Full Capacity millivolts algoritm in Section 11.
8 Mar. 10, 1997 Changed name to AMX-4 Series Diagnostics;" added 2115090 and 2169360 models to effectivity (Section 1-1).
9 July 14, 1997 Updated Sections 5-24 and 5-26.
10 Apr. 12, 1999 Updated Sections 4-5, 4-6-2, 4-6-3, 7-3, 9-7-1, 9-7-2, 9-7-5, 9-7-7. Added references to firmware 46-329187G2 and 46-329188G2 for Orion x-ray tube.
10 Apr. 28, 2003 Updated format for Avantx e-tools project.
LIST OF EFFECTIVE PAGES
PAGE REVISION PAGE REVISION PAGE REVISION
NUMBER NUMBER NUMBER NUMBER NUMBER NUMBER
Title Page 11 i thru xiv 11 1-1 thru 1-6 11 2-1 thru 2-4 11 3-1 thru 3-12 11 4-1 thru 4-12 11 5-1 thru 5-16 11 6-1 thru 6-4 11 7-1 thru 7-8 11 8-1 and 8-2 11 9-1 thru 9-8 11 10-1 thru 10-18 11 11-1 thru 11-22 11 12-1 thru 12-20 11 13-1 thru 13-36 11 14-1 thru 14-4 11 15-1 thru 15-24 11
Direction 46–017207
Revision 11
AMX–4 Series Diagnostics
IMPORTANT! . . . X-RAY PROTECTION
X-ray equipment if not properlyused may cause injury. Accordingly, the instructions herein contained should be thoroughly read and understood by everyone who will use the equipment before you attempt to place this equipment in operation. The General Electric Company, Medical Systems Group, will be glad to assist and cooperate in placing this equipment in use.
Although this apparatus incorporates a high degree of
complete protection. Nor can any practical design compel the operator to take adequate precautions to prevent the possibility of any persons carelessly exposing themselves or others to radiation.
It is important that everyone having anything to do with x-radiation be properly trained and fully acquainted with the recommendations of the National Council on Radiation Protection and Measurements as published in NCRP Reports available from NCRP Publications,
on Radiation Protection, and take adequate steps to protect against injury.
The equipment is sold with the understanding that the General Electric Company, Medical Systems Group, its agents, and representatives have no responsibility for injury or damage which may result from improper use of the equipment.
Various protective material and devices are available. It is urged that such materials or devices be used.
CERTIFIED ELECTRICAL CONTRACTOR STATEMENT
All electrical installations that arepreliminary to positioning of the equipment at the site prepared for the equipment shall be performed by licensed electrical contractors. In addition, electrical feeds into the Power Distribution Unit shall be performed by licensed electrical contractors. Other connections between pieces of electrical equipment, calibrations, and testing
shall be performed by qualified GE Medical personnel. The products involved (and the accompanying electrical installations) are highly sophisticated, and special engineering competence is required. In performing all electrical work on these products, GE will use its own specially trained field engineers. All of GE’s electrical work on these products will comply with the
requirements of the applicable electrical codes.
The purchaser of GE equipment shall only utilize qualified personnel (i.e., GE’s field engineers, personnel of third-party service companies with equivalent training, or licensed electricians) to perform electrical servicing on the equipment.
DAMAGE IN TRANSPORTATION
All packages should be closelyexamined at time of delivery. If damage is apparent, have notation “damage in shipment” written on all copies of the freight or express bill before delivery is accepted or “signed for” by a General Electric representative or a hospital receiving agent. Whether noted or concealed, damage MUST be reported to the carrier immediately
upon discovery, or in any event, within 14 days after receipt, and the contents and containers held for inspection by the carrier. A transportation company will not pay a claim for damage if an inspection is not requested within this 14 day period.
Call Traffic and Transportation, Milwaukee, WI (414) 827–3449 /
8*285–3449 immediately after damage is found. At this time be ready to supply name of carrier, delivery date, consignee name, freight or express bill number, item damaged and extent of damage. Complete instructions regarding claim procedure are found in Section “S” of the Policy & Procedure Bulletins.
If you have any comments, suggestions or corrections to the information in this document, please write them down, include the document title and document number, and send them to:
GENERAL ELECTRIC COMPANY MEDICAL SYSTEMS MANAGER – INFORMATION INTEGRATION,
AMERICAS W–622 P.O. BOX 414
DIAGNOSTICS
SECTION 1 INTRODUCTION ILLUSTRATION 1–1 AMX–4 IDENTIFICATION RATING PLATE 1-1 GeneralSee Illustration 1–1. The AMX–4 Series (henceforth, in this publication, called AMX–4) is identified on the rating plate located on the top cover by Model Numbers 46–270157Gx, 46–315161Gx, 46–329267Gx, 2115090–x, 2169360–x, 2236420–x and any other model number associated with the AMX–4 Series mobile x–ray equipment.
This book is not intended to be read from cover to cover like a novel. It is intended to intro-duce you to the AMX–4 Diagnostics Service Tools and provide reference material to help you isolate problems.
You should be familiar with the operation and capabilities of Diagnostics before you need them. This book can help you with the process. Read Section 1 Introduction. It provides a brief overview of the diagnostics. Read Section 3-5 Loop Test or Section 4-5 Loop Test, as appropriate for the PROMS in this unit, and Section 9 Data Base Access. You will learn how to operate AMX–4 Diagnostics and gain some insight into it’s capabilities by performing the Demonstration Procedures.
You will need to change values between decimal, hexadecimal, and binary equivalents when using diagnostics. Many pocket calculators have functions to perform the conver-sions for you. However, a calculator is not always available when needed. Appendix 1 will help with conversions up to 16 bits or 4 hexadecimal characters when you are unable to use your calculator.
The AMX–4 contains operating safeguards providing maximum safety. Before servicing, be certain proper operating procedures are being used. Refer to Direction 46–017291
AMX–4 Operation for Model Numbers 46–270157G1, G2, G3, and G50. For Model
Numbers 270157G4 and G5, refer to Direction 46–017334, AMX–4 (Japanese) Operation. For Model Numbers 46–315161 and 46–329267 Series, refer to Direction 46–017531,
AMX–4 International Operation Manual (46–315161 & 46–329267 Series). For model
numbers 2169360–x and 2236420–x, refer to Direction 2166913–100, AMX–4+ Operation
Manual, and to Direction 2166911–100, AMX–4+ International Operation Manual.
ILLUSTRATION 1–2
PROM LOCATIONS ON CPU BOARDS
CALIBRATION PROM DIAGNOSTICS & APPLICATION PROM CPU BOARD 46-264974 CPU BOARD 46-232828 U6 U36 U51 U104 1-2 Diagnostics Identification
Diagnostics are compatible with AMX–4 Model Numbers 46–270157, 46–315161, 46–329267, 2169360–x and 2236420–x Series. The PROM locations and identification numbers are shown in Illustration 1–2, PROM Locations On CPU Boards, and listed in Table 1–1, CPU Boards, Proms And Locations.
TABLE 1–1
CPU BOARDS, PROMS AND LOCATIONS
CPU BOARD 46-232828 46-264974 PROMS Diagnostics/Application
Calibration 46-302688G1 U3646-302687G1 U6 REV 0REV 0 46-302688G1 U104 REV 046-302687G1 U51 REV 0 PROMS Diagnostics/Application 46-303272G1 U36 REV 0
TABLE 1–2
RELATED FMI’S
PROMS RELATED FMI’S 46–302688G1/46–302687G1 FMI 10271 46–303272G1/46–303273G1 FMI’S 10289 & 10291 46-303815G1/46-303816G1 N/A 46-316685G1/46-316686G1 FMI'S 10545 & 10546 46-329187G1/46-329188G1 N/A 46-329187G2/46-329188G2 N/A ILLUSTRATION 1–3 DIAGNOSTIC PROGRAM STRUCTURE DIAGNOSTICS PROGRAM DIAGNOSIS ITEMS PASSWORD END SERVC MODE
SYS DIAGNOSTICS DATA LOG ERROR LOG CHARGE BATTERYS REQUIRED
1-3 Diagnostics Menu Items
The Diagnostics program bypasses the applications program and operator console control functions, providing control for fault isolation. Illustration 1–3 is a diagram of the Diagnos-tics program structure.
The Diagnostics Menu has four choices:
1. SYS DIAGNOSTICS Software routines to aid fault isolation. 2. DATA LOG Loading, viewing and initializing of the Data
3. ERROR LOG Viewing and initializing of the error log and error histogram files.
4. CHARGE BATTERYS Charge batteries when the AMX is not fully calibrated. Voltmeter and Charger must be calibrated. ILLUSTRATION 1–4 SYS DIAGNOSTICS STRUCTURE SYS DIAGNOSTICS OP SWITCH TEST
SYS BLOCK TEST DISP CNTRL TEST
DISP BATRY VOLTS LOOP TEST
1-4 Sys Diagnostics
As shown on Illustration 1–4, Diagnostics has the following menu items: 1. SYS BLOCK TEST Checks selected blocks of circuitry.
2. OP SWITCH TEST Displays the name of an operator accessible switch or switches that are closed.
ILLUSTRATION 1–5
DATA LOG FUNCTIONS
DATA LOG
LOAD DATA LOG VIEW DATA LOG INIT DATA LOG
1-5 Data Log
As shown on Illustration 1–5, there are three Data Log functions:
1. View View Data Log information.
2. Initialize Sets all Data Log information to zero. 3. Load Data log Put information into specific Data Log eleĆ
ILLUSTRATION 1–6
ERROR LOG FUNCTIONS
ERROR LOG
ERROR LIST HISTOGRAMS
1-6 Error Log
As shown on Illustration 1–6, there are two Error Log functions:
1. Histograms View and initialize the Histograms. 2. Error List View and initialize the Error List.
1-7 Charge Batteries
Charge Batteries does not have additional menu selections. Follow the displayed prompts.
SECTION 2
ENTERING DIAGNOSTICS
ILLUSTRATION 2–1
SERVICE SWITCH LOCATION
SERVICE SWITCH IN LEFT SIDE KEY SWITCH É É É É É É É 2-1 Entering Diagnostics
Before using Diagnostics you must start the diagnostic program. To start the diagnostic pro-gram, perform the following steps:
1. Set the service switch shown on Illustration 2-1 up to the application position. 2. Reset the AMX-4 using one of the following methods.
If power is off, turn the Key Switch to the ON position.
If power is on and the top cover is installed, turn the power key OFF for more than two seconds, then back ON again.
If power is on and the top cover is removed, providing access to the processor board, press the processor reset switch (AMX1 A2 A1 S183 for CPU Board 46–264974 or AMX1 A2 A1 S29 for CPU Board 46–232828).
3. While Power Up tests are running, set the service switch down to the service position.
When the diagnostic program is ready the END SERVCăMODE menu selection appears on the Message Display.
ILLUSTRATION 2–2
DIAGNOSTIC MENU SELECTION
NEXT PREVIOUS kVp kVp ENTER mAs NEXT PREVIOUS kVp kVp ENTER mAs DIAGNOSTICS PROGRAM DIAGNOSIS ITEMS PASSWORD END SERVC MODE
SYS DIAGNOSTICS DATA LOG ERROR LOG CHARGER REQUIRED
After END SERVC MODE appears on the display, you must reach the DIAGNOSIS ITEMS menu selection.
Illustration 2–2 shows diagnostics selection using the kVp , kVp , and mAsă switches. Shaded boxes illustrates the selection path. Use the following steps to select DIĆ AGNOSIS ITEMS.
1. Press either kVp or kVp until the DIAGNOSIS ITEMS menu selection appears.
2. Press mAs . The prompt changes to ENTER PASSWORD-- indicating that Data Base Access may be entered.
2-1-1 Entering Password
Enter password. If password is not available, contact Service Engineering. After entering the password, the prompt changes to SYS DIAGNOSTICS indicating that Diagnostics has
2-1-2 Exit Diagnostics
To exit DIAGNOSIS ITEMS press mAsĂ when one of the menu selections shown on Illustration 2–2 displays.
The prompt changes to EXITING--- then to DIAGNOSIS ITEMS indicating that Diagnostics is not active. Return to the applications program by performing the follow-ing steps:
1. Press either kVp or kVp . The END SERVICE MODE menu selection displays.
2. Press mAs . The prompt changes to SWITCH TO RUN.
3. Set the service switch up to the run position. The prompt changes to CYCLE KEY SWITCH. Turn the power key OFF for more than two seconds, then back ON again.
SECTION 3
SYSTEM DIAGNOSTICS FOR AMX–4 UNITS WITH: PROMS 46–302688G1/46–302687G1 OR
46–303272G1/46–303273G1
AND CPU BOARDS 46–232828 OR 46–264974
System Diagnostics allows you to display the battery voltage, check for stuck switches, and check blocks of circuitry.
ILLUSTRATION 3–1
SYSTEM BLOCK TEST
SYS DIAGNOSTICS
OP SWITCH TEST
SYS BLOCK TESTS DISP CNTRL TEST
DISP BATRY VOLTS LOOP TEST NEXT PREVIOUS kVp kVp ENTER mAs
3-1 System Block Test
System Block Test checks the digital to analog and analog to digital converters. It also checks the tap selection circuitry.To check the D/A and A/D converters, DAC U332 on CPU 46–232828 or U355 on CPU 46–264974 is set up so that it will send a KVP DMN+ signal to the Filament and kVp Control Board. The signal is received by the Filament and kVp Con-trol Board at J2 pins 11 and 12, schematic location 2–D1. The signal leaves this board unal-tered as KVP DMN FBK+ at J2 pins 13 and 14, schematic location 2–E4, and returns to the CPU Board on connector J5 pins 13 and 14, schematic location 5–E1. Analog buffer AR398 on CPU 46–232828 or AR392 on CPU 46–264974 conditions the signal for multiplexer U406 on CPU 46–232828 or U342 on CPU 46–264974. The signal is ultimately read by the processor and compared with the output signal. If they agree the test passes.
Taps are checked by individuals selecting TAP1* through TAP5* signals at the Generator Control 2 Port, schematic location 4–B9 on CPU board. The six tap signals go to six identi-cal circuits on the 1kHz Driver Board, schematic sheet 2. On the 1kHz Driver Board these signals are converted to 110 volt coil driving signals and tap feed back logic signals. TAP1 FDBK through TAP5 FDBK return to the CPU board Generator and AEC Status port, schematic location 3–E7. Tap select and feedback signals are compared. If they agree the test passes.
By examining the tap feedback circuit, you can see that a shorted coil will produce a feed-back signal. Keep this in mind when running System Block Test. You should hear six (see note) equally spaced clicks of the relays being selected when the tap test is running. If you don’t, and the test passes, check the relays.
Note that with this firmware, TAP6* is not tested.
3-1-1 Running System Block Test
Illustration 3–1 shows Block Test selection using the kVp , kVp , and mAsă switches. Shaded boxes illustrates the selection path. Use the following steps to select SYS BLOCK TESTS.
1. Press either kVp or kVp until the SYS BLOCK TESTS menu selection appears.
2. Press mAs . The test starts to run. The prompt changes to ANALOG TEST, then to TAP TEST. If the test passes, PASS appears after the prompt, if the test fails FAIL appears after the prompt.
When Tap Test runs, you should hear six equally spaced clicks of the relays being selected.
3. End System Block Tests by Pressing and holding mAs until the display goes blank and the test stops. Release mAs . The test makes one last check, then the prompt changes to SYS BLOCK TESTS indicating that another selection may be made from the Diagnostics menu.
ILLUSTRATION 3–2
SWITCH TEST
SYS DIAGNOSTICS
OP SWITCH TEST
SYS BLOCK TESTS DSP CNTRL TEST
DSP BATRY VOLTS LOOP TEST NEXT PREVIOUS kVp kVp ENTER mAs 3-2 Op Switch Test
Op Switch looks for closed switches. When a closed switch is found, its name appears on the message display. If all switches are open the display prompts with NOSWITCH PRESSED. When more than one switch is pressed, they display tone after the other. Fol-lowing is a list of switches checked, their signal names, and CPU Schematic locations: EXPOSE EXP SW J8- pin 23 sheet 3 location B-7, supplied from
HAND SW COM J8 pin 24 sheet 3 location F-1.
PREP PREP SW J8 pin 25 sheet 3 location B-7, supplied from HAND SW COM J8 pin 24 sheet 3 location F-1.
FIELD LIGHT FIELD LIGHT SW and FIELD LIGHT SW RTN Collimator connection J3 pins 17 and 18, Hand Switch connections J8 pins 21 and 24 sheet 3 location F-1. Collimator loop passes through Rotor Control Board AMX 1 A3 A2, sheet 2. DRIVE ENABLE DRIVE ENA SW and DRIVE ENA SW RTN J8 pins 27 and
28 sheet 3 location D-1.
TUBE PARKED TUBE PARKED SW and TUBE PARKED SW RTN J8 pins 13 and 14 sheet 3 location C-1
RUN SERVICE SW and SERVICE SW RTN J8, 10 and 20 on sheet 4 location H-6.
HIGH TUBE PRESS X-RAY PRESS SW and X-RAY PRESS SW RTN J3 pins 6 and 7 sheet 3 location C-8. This signal passes through RoĆ tor Control Board AMX 1 A3 A2 sheet 2.
BUMPER BUMPER* J2 pin 10 then to Drive Control Board AMX1 A5 A1 J11 pins 1 and 2 sheet 4 location E-1.
KVP-DWN KVP DOWN J6 pin 13 sheet 3 location F-1. Switch is on Display Board AMX1 A1 A2 sheet 1 location F2
MAS-DWN MAS DOWN J6 pin 7 sheet 3 location F-1. Switch is on DisĆ play Board AMX1 A1 A2 sheet 1 location F2
MAS-UP MAS UP J6 pin 5 sheet 3 location F-1. Switch is on Display Board AMX1 A1 A2 sheet 1 location F2
3-2-1 Running Op Switch Test
Illustration 3–2 shows OP Switch selection using the kVp , kVp , and mAsă switches. Shaded boxes illustrates the selection path. Use the following steps to select OP SWITCH TEST.
1. Press either kVp or kVp until the OP SWITCH TEST menu selection appears.
2. Press mAs . The prompt changes to NOSWITCH PRESSED indicating that the test is running.
If a switch is closed, the name of the switch appears on the message display. 3. End the Op Switch Test by Pressing mAs . The prompt may not display mAs
when pressed but change to OP SWITCH TEST indicating that another seĆ lection may be made from the Diagnostics menu and that the mAs switch is funcĆ tioning correctly.
ILLUSTRATION 3–3
DISPLAY CONTROLLER TEST
SYS DIAGNOSTICS
OP SWITCH TEST
SYS BLOCK TESTS DSP CNTRL TEST
DSP BATRY VOLTS LOOP TEST NEXT PREVIOUS kVp kVp ENTER mAs 3-3 Display Controller
This test checks the Display Controller Module. Each display is checked to see that seg-ments are not shorted, then they are checked to see that each segment lights. This is a visual test.
Illustration 3–3 shows Display Controller Test selection using the kVp , kVp , and mAsă switches. Shaded boxes illustrates the selection path. Use the following steps to select DISP CNTRL TEST.
1. Press either kVp or kVp until the DISP CNTRL TEST menu selection appears.
2. Press mAs . The test starts to run.
3. Press and hold mAs . When all displays are blank, release the switch. The prompt changes to DISP CNTRL TEST indicating that another selection may be made from the Diagnostics menu.
ILLUSTRATION 3–4
BATTERY VOLTAGE
SYS DIAGNOSTICS
OP SWITCH TEST
SYS BLOCK TEST DISPCNTRL TEST
DISP BATRY VOLTS LOOP TEST NEXT PREVIOUS kVp kVp ENTER mAs 3-4 Battery Voltage
Battery Voltage displays on the kVp and mAs Display. This may be used instead of remov-ing covers to check battery voltage. The displayed voltage should match the actual voltage within +0.2 volts. Correct the display by using the calibration procedure Calibrate Voltme-ter. Generator calibration must be done after calibrating the volt meter, if the voltage differ-ence is more than 0.2 volts.
Illustration 3–4 shows Battery Voltage selection using the kVp , kVp , and mAsă switches. Shaded boxes illustrates the selection path. Use the following steps to select DISP BATRY VOLTS.
1. Press either kVp or kVp until the DISP BATRY VOLTS menu selection appears.
2. Press mAs . The prompt changes to BATTERY VOLTS, and Battery voltage appears on the kVp and mAs Display.
Each time you press mAs , the battery voltage is sampled and displayed. 3. Press either kVp or kVp to make your next selection from the DiagnosĆ
tics Menu.
func-ILLUSTRATION 3–5
LOOP TEST
SYS DIAGNOSTICS
OP SWITCH TEST
SYS BLOCK TEST DISP CHTRL TEST
DISP BATRY VOLTS
LOOP TEST NEXT PREVIOUS kVp kVp ENTER mAs DEFINE ADDRESS –WRITE– –READ– DATA 3-5 Loop Test
Loop Test continuously reads a selected address, or writes data that you specify to a selected address. The prompt LOOPING appears on the Message Display while the test is running. Data being read or written appears on the kVp and mAs Display. Any CPU address bus loca-tion can be accessed with this test.
Writing to RAM can corrupt the Calibration Data Base, producing a Check Sum Error. Calibration is required if this occurs. Limiting your use of Loop Test to the I/O ports listed in Section 5 will prevent this problem.
Loop Test can be used to check circuits that are not tested by other portions of diagnostics. Command signals may be set, and feedback checked to see if circuits are functioning. You may use Loop Test for signal tracing by setting selected signals to a known state. When a potential fault is discovered, Loop Test may be used to set the signal high and low to verify the fault.
Exit Diagnostics and turn the AMX OFF when you finish using Loop Test. This resets the system and makes sure the CPU Port Latches are properly set for other tests. (Setting the
CAUTION
Illustration 3–5 shows Loop Test selection using the kVp , kVp , and mAsă switches. Shaded boxes illustrate the selection path. Use the following steps to select LOOP TEST.
1. Press either kVp or kVp until the LOOP TEST menu selection appears. 2. Press mAs . The prompt DEFINE ADDRESS appears on the Message DisĆ play, and an address appears on the kVp and mAs Display. To exit without enterĆ ing an address, press mAs .
The prompt changes to EXITING---, then to LOOP TEST.
ILLUSTRATION 3–6
HEXADECIMAL REPRESENTATION
Addresses and data are changed starting with the left, or most significant, hexadecimal character and moving right to the least significant character. Notice the difference between hexadecimal B and 6 as shown on Illustration 3–6. It is easy to mistake a B for a 6. Address or Data appearing on the mAs and kVp display is entered when either mAsă is pressed to enter the selection, or when mAsă is pressed to change the last value.
3. Change address by first pressing mAsă, then pressing kVp or kVp to select the proper hexadecimal value. After the required value displays, press mAsă to enter the value and move to the next character. The prompt changes to -READ- when the last value is changed.
4. Using either kVp or kVp , select -READ- to read the address or -WRITE- to write to the address.
5. Press mAsă at the prompt -READ- and the prompt changes to LOOPĆ ING---. The address and data appear on the kVp and mAs display. Data will change if the bit pattern on the port changes.
6. Press mAsă at the prompt -WRITE- and the prompt changes to DATA. Change data by first pressing mAs two times, then pressing kVp or kVp to select the proper hexadecimal value. After the required value displays, press
ILLUSTRATION 3–7
LOOP TEST DISPLAY
ËËË mAs UP mAs MESSAGE DISPLAY kVp UP kVp kVp AND mAs DISPLAY DOWN DOWN kVp mAs Address Data Prompts and Errors Increase Value Decrease Value Enter Value or Shift Data Entry Exit
3-6 Demonstration Procedure
During this demonstration you will learn to operate Loop Test. You will see that Loop Test continually addresses a port.
3-6-1 Enter Loop Test
Illustrations 3–5 and 3–7 show Loop Test selection. Shaded boxes illustrate the selection path.
See Illustration 3–7. Loop Test prompts appear on the Message Display. Address and data appear on the kVp and mAs display. Address and data are the Hexadecimal equivalent of a Decimal number. Enter Loop Test by performing the following steps:
1. Enter the Service Mode by placing the service switch up to the application posiĆ tion and turn the unit ON. While Power Up tests are running set the service switch down to the service position. After completing power up diagnostics, the display changes to END SERVC MODE.
2. Display the DIAGNOSIS ITEMS menu selection by Pressing kVp .
3. Enter Diagnostics by pressing mAs . The prompt changes to ENTER PASSĆ WORD--.
4. Enter the password. The prompt changes to SYS DIAGNOSTICS.
5. Enter System Diagnostics by pressing mAsă. The prompt changes to SYS BLOCK TEST.
6. Select Loop Test from the System Diagnostics Menu by pressing kVp . The prompt changes to LOOP TEST.
7. Enter Loop Test by pressing mAsă. The prompt changes to DEFINE ADĆ DRESS, and an address 0000 Hex appears on the kVp and mAs display. You
ILLUSTRATION 3–8
READ PORT DISPLAY
ËËË ËËË mAs UP mAs MESSAGE DISPLAY kVp UP kVp kVp AND mAs DISPLAY DOWN DOWN kVp mAs 1000 Data Prompts and Errors Increase Value Decrease Value Enter Value or Shift Data Entry Exit
3-6-2 Read a Port
You will read the Charger and Drive Status Port at location 1000 Hex. This port is read by Op Switch Test to display a closed switch. Refer to Section 5-3 Charger and Drive Status for signal identification. By pressing switches you will see that the port is continually being read and the result displayed. Read the Charger and Drive Status Port by performing the following steps:
1. Enter Loop Test as described in Section 3Ć6Ć1 Enter Loop Test.
2. Press kVp and kVp . You haven't selected a character so nothing happens. 3. Select the first character by pressing mAs .
4. Press kVp and kVp to see how the first address character changes, then change it to 1. The address 1000 Hex should display as shown on Illustration 3-8.
5. Select the second character by pressing mAsă. Press kVp and kVp to see how the second address character changes then change it to 0.
6. Step past the next two characters and enter the address by pressing mAsă three times. The prompt changes to -READ-.
3-6-3 Write Then Read
You will activate tap relays by writing to the Generator Control 2 Port located at 1000 Hex. By reading the Generator and AEC Status Port at 1600 Hex you will see that the relays are active. Refer to Section 5-8 Generator Control 2 and Section 5-7 Generator and AEC Status for signal identification. These two ports are used by Block Test when it checks the tap re-lays.
Select Port 1000 Hex.
1. Enter Loop Test as described in Section 3-6-1 Enter Loop Test. 2. Select the first character of the port address by pressing mAsă. 3. Change this character to 1 by pressing kVp or kVp .
4. Step past the next two characters and enter the address by pressing mAsă three times. The prompt changes to -READ-.
Enter 38 Hex, energizing tap selection relays 1, 2, and 3.
5. Change the prompt to -WRITE- by pressing kVp or kVpă. 6. Select the first character by pressing mAsă two times.
7. Change the first character to 3 by pressing kVp or kVp , then press mAsă to select the second character.
8. Change the second character to 8, then enter the value by pressing mAsă. The relays pull in and the prompt -LOOPING- displays.
9. Exit Loop Test by pressing mAsă. The prompt changes to LOOP TEST. ReĆ lays remain pulled in because the port latch was not reset.
Re–enter Loop Test and read the Generator and AEC Status Port at 1600 Hex. 10. Enter Loop Test.
11. Select the Generator and AEC Status Port at location 1600 Hex using kVp , kVp , and mAsă.
12. Read the port by selecting the -READ- prompt and pressing mAsă. Depending on the status of bit 7, AEC EXP EN, the data will either be 07 Hex or 87 Hex. Reset the Generator Control Port by writing 00 Hex to location 1000 Hex. You will hear the relays drop out when the data is written to the port.
SECTION 4
SYSTEM DIAGNOSTICS FOR AMX–4 UNITS WITH: PROMS 46–303815G1/46–303816G1, 46–316685G1/ 46–316686G1, OR 46–329187G1/46–329188G1 OR 46–329187G2/46–329188G2
AND CPU BOARD 46–264974
System Diagnostics allows you to display the battery voltage, check for stuck switches, and check blocks of circuitry.
ILLUSTRATION 4–1
SYSTEM BLOCK TEST
SYS DIAGNOSTICS
OP SWITCH TEST
SYS BLOCK TESTS DISP CNTRL TEST
DISP BATRY VOLTS LOOP TEST NEXT PREVIOUS kVp kVp ENTER mAs
4-1 System Block Test
System Block Test checks the digital to analog and analog to digital converters. It also checks the tap selection circuitry.To check the D/A and A/D converters, DAC U355 on CPU 46–264974, is set up so that it will send a KVP DMN+ signal to the Filament and kVp Control Board. The signal is received by the Filament and kVp Control Board at J2 pins 11 and 12, schematic location 2–D1. The signal leaves this board unaltered as KVP DMN FBK+ at J2 pins 13 and 14, schematic location 2–E4, and returns to the CPU Board on connector J5 pins 13 and 14, schematic location 5–E1. Analog buffer AR392 on CPU 46–264974 conditions the signal for multiplex U342 on CPU 46–264974. The signal is ulti-mately read by the processor and compared with the output signal. If they agree the test passes.
Taps are checked by individuals selecting TAP1* through TAP6* signals at the Generator Control 2 Port, schematic location 4–B9. The six tap signals go to six identical circuits on the 1kHz Driver Board, schematic sheet 2. On the 1kHz Driver Board these signals are con-verted to 110 volt coil driving signals and tap feed back logic signals. TAP1 FDBK through TAP6 FDBK return to the CPU board Generator and AEC Status port, schematic location 3–E7. Tap select and feedback signals are compared. If they agree the test passes. By examining the tap feedback circuit, you can see that a shorted coil or stuck contacts will produce a feedback signal. Keep this in mind when running System Block Test. You should hear seven equally spaced clicks of the relays being selected when the tap test is running. If you don’t, and the test passes, check the relays.
4-1-1 Running System Block Test
Illustration 4–1 shows Block Test selection using the kVp , kVp , and mAsă switches. Shaded boxes illustrates the selection path. Use the following steps to select SYS BLOCK TESTS.
1. Press either kVp or kVp until the SYS BLOCK TESTS menu selection appears.
2. Press mAs . The test starts to run. The prompt changes to ANALOG TEST, then to TAP TEST. If the test passes, PASS appears after the prompt, if the test fails FAIL appears after the prompt.
When Tap Test runs, you should hear seven equally spaced clicks of the relays being selected.
3. End System Block Tests by Pressing and holding mAs until the display goes blank and the test stops. Release mAs . The test makes one last check, then the prompt changes to SYS BLOCK TESTS indicating that another selection may be made from the Diagnostics menu.
ILLUSTRATION 4–2
SWITCH TEST
SYS DIAGNOSTICS
OP SWITCH TEST
SYS BLOCK TESTS DSP CNTRL TEST
DSP BATRY VOLTS LOOP TEST NEXT PREVIOUS kVp kVp ENTER mAs 4-2 Op Switch Test
Op Switch looks for closed switches. When a closed switch is found, its name appears on the message display. If all switches are open the display prompts with NOSWITCH PRESSED. When more than one switch is pressed, they display tone after the other. Fol-lowing is a list of switches checked, their signal names, and CPU Schematic locations: EXPOSE EXP SW J8- pin 23 sheet 3 location B-7, supplied from
HAND SW COM J8 pin 24 sheet 3 location F-1.
PREP PREP SW J8 pin 25 sheet 3 location B-7, supplied from HAND SW COM J8 pin 24 sheet 3 location F-1.
FIELD LIGHT FIELD LIGHT SW and FIELD LIGHT SW RTN Collimator connection J3 pins 17 and 18, Hand Switch connections J8 pins 21 and 24 sheet 3 location F-1. Collimator loop passes through Rotor Control Board AMX 1 A3 A2 sheet 2. DRIVE ENABLE DRIVE ENA SW and DRIVE ENA SW RTN J8 pins 27 and
28 sheet 3 location D-1.
TUBE PARKED TUBE PARKED SW and TUBE PARKED SW RTN J8 pins 13 and 14 sheet 3 location C-1
RUN SERVICE SW and SERVICE SW RTN J8, 10 and 20 on sheet 4 location H-6.
HIGH TUBE PRESS X-RAY PRESS SW and X-RAY PRESS SW RTN J3 pins 6 and 7 sheet 3 location C-8. This signal passes through RoĆ tor Control Board AMX 1 A3 A2 sheet 2.
BUMPER BUMPER* J2 pin 10 then to Drive Control Board AMX1 A5 A1 J11 pins 1 and 2 sheet 4 location E-1.
KVP-DWN KVP DOWN J6 pin 13 sheet 3 location F-1. Switch is on Display Board AMX1 A1 A2 sheet 1 location F2
MAS-DWN MAS DOWN J6 pin 7 sheet 3 location F-1. Switch is on DisĆ play Board AMX1 A1 A2 sheet 1 location F2
MAS-UP MAS UP J6 pin 5 sheet 3 location F-1. Switch is on Display Board AMX1 A1 A2 sheet 1 location F2
4-2-1 Running Op Switch Test
Illustration 4–2 shows OP Switch selection using the kVp , kVp , and mAsă switches. Shaded boxes illustrates the selection path. Use the following steps to select OP SWITCH TEST.
1. Press either kVp or kVp until the OP SWITCH TEST menu selection appears.
2. Press mAs . The prompt changes to NOSWITCH PRESSED indicating that the test is running.
If a switch is closed, the name of the switch appears on the message display. 3. End the Op Switch Test by Pressing mAs . The prompt may not display mAs
when pressed but change to OP SWITCH TEST indicating that another seĆ lection may be made from the Diagnostics menu and that the mAs switch is funcĆ tioning correctly.
ILLUSTRATION 4–3
DISPLAY CONTROLLER TEST
SYS DIAGNOSTICS
OP SWITCH TEST
SYS BLOCK TESTS DSP CNTRL TEST
DSP BATRY VOLTS LOOP TEST NEXT PREVIOUS kVp kVp ENTER mAs 4-3 Display Controller
This test checks the Display Controller Module. Each display is checked to see that seg-ments are not shorted, then they are checked to see that each segment lights.
Illustration 4–3 shows Display Controller Test selection using the kVp , kVp , and mAsă switches. Shaded boxes illustrates the selection path. Use the following steps to select DISP CNTRL TEST.
1. Press either kVp or kVp until the DISP CNTRL TEST menu selection appears.
2. Press mAs . The test starts to run.
3. Press and hold mAs . When all displays are blank, release the switch. The prompt changes to DISP CNTRL TEST indicating that another selection may be made from the Diagnostics menu.
ILLUSTRATION 4–4
BATTERY VOLTAGE
SYS DIAGNOSTICS
OP SWITCH TEST
SYS BLOCK TEST DISPCNTRL TEST
DISP BATRY VOLTS LOOP TEST NEXT PREVIOUS kVp kVp ENTER mAs 4-4 Battery Voltage
Battery Voltage displays on the kVp and mAs Display. This may be used instead of remov-ing covers to check battery voltage. The displayed voltage should match the actual voltage within +0.2 volts. Correct the display by using the calibration procedure Calibrate Voltme-ter. Generator calibration must be done after calibrating the volt meter, if the voltage differ-ence is more than 0.2 volts.
Illustration 4–4 shows Battery Voltage selection using the kVp , kVp , and mAsă switches. Shaded boxes illustrates the selection path. Use the following steps to select DISP BATRY VOLTS.
1. Press either kVp or kVp until the DISP BATRY VOLTS menu selection appears.
2. Press mAs . The prompt changes to BATTERY VOLTS, and Battery voltage appears on the kVp and mAs Display.
Each time you press mAs , the battery voltage is sampled and displayed. 3. Press either kVp or kVp to make your next selection from the DiagnosĆ
tics Menu.
Battery voltage stays on the display until the display controller is reset by some other func-tion.
ILLUSTRATION 4–5
LOOP TEST
SYS DIAGNOSTICS
OP SWITCH TEST
SYS BLOCK TEST DISP CHTRL TEST
DISP BATRY VOLTS
LOOP TEST NEXT PREVIOUS kVp kVp ENTER mAs DEFINE ADDRESS SELECT
HEXADECIMAL OR BINARY FOR-MAT
–WRITE– –READ–
DATA
4-5 Loop Test
Loop Test continuously reads a selected address, or writes data that you specify to a selected address. The prompt LOOPING appears on the Message Display while the test is running. Data being read or written appears on the kVp and mAs Display. Any CPU address bus loca-tion can be accessed with this test.
Writing to RAM can corrupt the Calibration Data Base, producing a Check Sum Error. Calibration is required if this occurs. Limiting your use of Loop Test to the I/O ports listed in Section 4 will prevent this problem.
Loop Test can be used to check circuits that are not tested by other portions of diagnostics. Command signals may be set, and feedback checked to see if circuits are functioning. You may use Loop Test for signal tracing by setting selected signals to a known state. When a potential fault is discovered, Loop Test may be used to set the signal high and low to verify the fault.
Exit Diagnostics and turn the AMX OFF when you finish using Loop Test. This resets the system and makes sure the CPU Port Latches are properly set for other tests. (Setting the
CAUTION
Illustration 4–5 shows Loop Test selection using the kVp , kVp , and mAsă switches. Shaded boxes illustrate the selection path. Use the following steps to select LOOP TEST.
1. Press either kVp or kVp until the LOOP TEST menu selection appears. 2. Press mAs . The prompt DEFINE ADDRESS appears on the Message DisĆ play, and an address appears on the kVp and mAs Display. To exit without enterĆ ing an address, press mAs twice.
The prompt changes to EXITING---, then to LOOP TEST.
ILLUSTRATION 4–6
HEXADECIMAL REPRESENTATION
Addresses and data are changed starting with the left, or most significant, hexadecimal character and moving right to the least significant character. Notice the difference between hexadecimal B and 6 as shown on Illustration 4–6. It is easy to mistake a B for a 6. Address or Data appearing on the mAs and kVp display is entered when either mAsă is pressed to enter the selection, or when mAsă is pressed to change the last value.
3. Change address by first pressing mAsă, then pressing kVp or kVp to select the proper hexadecimal value. After the required value displays, press mAsă to enter the value and move to the next character. Note that the digit being changed will flash.
4. The messages MAS UP for HEX ",MAS DN for BIN" will alternate on the display. Pressing MAS will display in hexadecimal format. Pressing MAS will display data in a binary format.
5. The prompt changes to -READ-. Using either kVp or kVp , select -READ- to read the address or -WRITE- to write to the address.
6. Press mAsă at the prompt -READ- and the prompt changes to LOOPĆ ING---. The address and data appear on the kVp and mAs display. Data will change if the bit pattern on the port changes. Only data will appear if binary format is selected.
7. Press mAsă at the prompt -WRITE- and the prompt changes to DATA. Change data by first pressing mAs two times, then pressing kVp or kVp
ILLUSTRATION 4–7
LOOP TEST DISPLAY
ËËË mAs UP mAs MESSAGE DISPLAY kVp UP kVp kVp AND mAs DISPLAY DOWN DOWN
Address and Data
Prompts and Errors Increase Value Decrease Value Enter Value or Shift Data Entry Exit
Data
Binary Mode or Hexadecimal Mode
4-6 Demonstration Procedure
During this demonstration you will learn to operate Loop Test. You will see that Loop Test continually addresses a port.
4-6-1 Enter Loop Test
Illustrations 4–5 and 4–7 show Loop Test selection. Shaded boxes illustrate the selection path.
See Illustration 4–7. Loop Test prompts appear on the Message Display. Address and data appear on the kVp and mAs display. Address and data are the Hexadecimal equivalent of a Decimal number. Enter Loop Test by performing the following steps:
1. Enter the Service Mode by placing the service switch up to the application posiĆ tion and turn the unit ON. While Power Up tests are running set the service switch down to the service position. After completing power up diagnostics, the display changes to END SERVC MODE.
2. Display the DIAGNOSIS ITEMS menu selection by Pressing kVp .
3. Enter Diagnostics by pressing mAs . The prompt changes to ENTER PASSĆ WORD--.
4. Enter the password. The prompt changes to SYS DIAGNOSTICS.
5. Enter System Diagnostics by pressing mAsă. The prompt changes to SYS BLOCK TEST.
6. Select Loop Test from the System Diagnostics Menu by pressing kVp . The prompt changes to LOOP TEST.
7. Enter Loop Test by pressing mAsă. The prompt changes to DEFINE ADĆ DRESS, and an address 0000 Hex appears on the kVp and mAs display. You
ILLUSTRATION 4–8
READ PORT DISPLAY
ËËË ËËË mAs UP mAs MESSAGE DISPLAY kVp UP kVp kVp AND mAs DISPLAY DOWN DOWN kVp mAs 1000 Data Prompts and Errors Increase Value Decrease Value Enter Value or Shift Data Entry Exit
4-6-2 Read a Port
You will read the Charger and Drive Status Port at location 1000 Hex. This port is read by Op Switch Test to display a closed switch. Refer to Section 5-3 Charger and Drive Status for signal identification. By pressing switches you will see that the port is continually being read and the result displayed. Read the Charger and Drive Status Port by performing the following steps:
1. Enter Loop Test as described in Section 4Ć6Ć1 Enter Loop Test.
2. Press kVp and kVp . You haven't selected a character so nothing happens. 3. Select the first character by pressing mAs .
4. Press kVp and kVp to see how the first address character changes, then change it to 1. The address 1000 Hex should display as shown on Illustration 4-8. The digit being changed will flash.
5. Select the second character by pressing mAsă. Press kVp and kVp to see how the second address character changes then change it to 0.
6. Step past the next two characters and enter the address by pressing mAsă three times. The messages MAS UP for HEX ",MAS DN for BIN" will alterĆ nate on the display. Pressing MAS will display in hexadecimal format. PressĆ ing MAS will display data in a binary format.
4-6-3 Write Then Read
You will activate tap relays by writing to the Generator Control 2 Port located at 1000 Hex. By reading the Generator and AEC Status Port at 1600 Hex you will see that the relays are active. Refer to Section 5-8 Generator Control 2 and Section 5-7 Generator and AEC Status for signal identification. These two ports are used by Block Test when it checks the tap re-lays.
Select Port 1000 Hex.
1. Enter Loop Test as described in Section 4Ć6Ć1 Enter Loop Test. 2. Select the first character of the port address by pressing mAsă. 3. Change this character to 1 by pressing kVp or kVp .
4. Step past the next two characters and enter the address by pressing mAsă three times. Press mAs for Hexadecimal. Press mAs for Binary. The prompt changes to -READ-.
Enter 38 Hex, energizing tap selection relays 1, 2, and 3.
5. Change the prompt to -WRITE- by pressing kVp or kVpă. 6. Select the first character by pressing mAsă two times.
7. Change the first character to 3 by pressing kVp or kVp , then press mAsă to select the second character.
8. Change the second character to 8, then enter the value by pressing mAsă. The relays pull in and the prompt -LOOPING- displays.
9. Exit Loop Test by pressing mAsă. The prompt changes to LOOP TEST. ReĆ lays remain pulled in because the port latch was not reset.
Re–enter Loop Test and read the Generator and AEC Status Port at 1600 Hex. 10. Enter Loop Test.
11. Select the Generator and AEC Status Port at location 1600 Hex using kVp , kVp , and mAsă.
12. Read the port by selecting the -READ- prompt and pressing mAsă. Depending on the status of bit 7, AEC EXP EN, the data will either be 07 Hex or 87 Hex. Reset the Generator Control Port by writing 00 Hex to location 1000 Hex. (Setting the Ser-vice Switch up and down will also reset the Generator Control Port) You will hear the relays drop out when the data is written to the port.
SECTION 5 I/O PORTS
5-1 Introduction
This section contains listings of CPU Port addresses, signal names, and schematic loca-tions. Using Loop Test, you can read from and write to these ports.
Tables 5–1 and 5–2 cross reference the read and write port select signals with the hex ad-dress, port name, and section where signal descriptions are located. These signals originate at U78 on CPU 46–232828 or U170 on CPU 46–264974 and U139 on CPU 46–232828 or U24 on CPU 46–264974. Signal names appear along the right edge of CPU Schematic page two.
TABLE 5–1
READ PORTS
Signal Address Port
Name Hex Name Section
RDP0* 1000 Charger and Drive Status 5–3 RDP1* 1100 On Board Status 5–4
RDP2* 1200 A/D Converter 5–5 RDP3* 1300 Not Used
RDP4* 1400 Operator I/O Status 5–6
RDP5* 1500 Programmable Timer Not Described RDP6* 1600 Generator and AEC Status 5–7
TABLE 5–2
WRITE PORTS
Signal Address Port
Name Hex Name Section
WRP0* 1000 Generator Control 2 5–8 WRP1* 1080 Not Used
WRP2* 1100 Charger and Drive Control 5–9 WRP3* 1180 AEC Control 5–10
WRP4* 1200 Generator Control 1 5–11 WRP5* 1280 A/D Control 5–12
WRP6* 1300 Set Backup Time 5–13 WRP7* 1380 On Board Control 5–14
WRP8* 1400 Right Speed Command DAC 5–15 1401 Left Speed Command DAC 5–16 WRP9* 1480 Charge Current DAC 5–17
1481 Leakage Compensation DAC 5–18 WRP10* 1500 Programmable Timer 5–19
WRP11* 1580 Filament Current Demand DAC 5–20 1584 kVp Demand DAC 5–21
WRP12* 1600 Watchdog Timer 5–22 WRP13* 1680 Not Used
WRP14* 1700 Not Used WRP15* 1780 Not Used
5-2 Selected Functions
This table lists selected functions with their address and data. You may activate these func-tions by writing the data value to the address listed for the function. When finished, always reset any port that you wrote to by writing 00 Hex to it, or resetting the CPU.
TABLE 5–3
SELECTED FUNCTIONS PORT
Address Data
Function Hex Value Hex Value
60 Hz Clocks 1200 01
Turns on 60 Hz clocks to 60 Hz Inverter.
1k Hz Clocks 1200 02
Turns on 1k Hz clocks to the 1k Hz Inverter.
2k Hz Clocks 1200 04
Turns on 2k Hz and 16k Hz clocks to the 1k Hz Inverter.
Field Light 1200 11
Turns on the Collimator Field Light.
2k Hz Filament Inverter 1200 15
Turns on the 2k Hz filament inverter at 4.5 Amps.
Turn the Rotor On
First enter 1000 02
Then enter 1200 11
Pull in Safety Contactor 1000 04
Press the PREP switch Charge at 2.5 Amps Plug in charging cord
First enter 1100 04
5-3 Charger and Drive Status
Read only port with address location 1000 hex. Schematic location; sheet 3, 1–A to 1–D. Port select signal is RDP0*.
TABLE 5–4
CHARGER AND DRIVE STATUS PORT
BIT SIGNAL NAME DESCRIPTION
0 LINE SENSE Logic 1 charger is plugged in to a live socket. 1 OPTION SW 3 Logic 1 selects English prompts.
Logic 0 selects French prompts.
2 OPTION SW 4 (Not used)
3 BUMPER Logic 1 bumper switch is engaged, something was hit. 4 TUBE PARKED SW Logic 1 x–ray tube arm is locked in place.
Logic 0 x–ray tube arm is not locked in place. 5 LEFT STALL Logic 1 left drive motor has overheated or stalled. 6 RIGHT STALL Logic 1 right drive motor has overheated or stalled. 7 DRIVE ENA SW Logic 1 drive enable bar is activated.
5-4 On–Board Status
Read only port with address location 1100 hex. Schematic location; sheet 4, 7–F to 7–H. Port select signal is RDP1*.
TABLE 5–5
ON–BOARD STATUS PORT
BIT SIGNAL NAME DESCRIPTION
0 BU TMR OKAY Logic 1 back–up exposure timer has not timed out 1 EXP CMND STATUS Indicates the status of the hardware synchronized
START EXP CMND signal
2 A/D STATUS Logic 1 conversion is in progress
3 XMIT OK Logic 1 sending data to the display without flicker Logic 0 sending data to display causes flicker Note that this bit toggles while displayed. This is a normal condition.
4 DISPLAY OK Logic 1 display controller is scanning 5 BAUD RATE SW Logic 1 selects 375k Baud
Logic 0 selects 187.5k Baud 6 OPTION SW 1 ** Logic 1 enable +24, 15V tests
Logic 0 disable +24, 15V tests 7 SERVICE SW Logic 1service mode requested
5-5 A/D Converter
Port select signal is RDP2*. Start 8-bit Conversion
Read only port with address location 1201 hex. Schematic location; sheet 5. Reading from this address with the READ A/D signal = “0”,starts an 8–bit conversion (data read in this case is irrelevant).
Start 12-bit Conversion
Read only port with address location 1200 hex. Schematic location; sheet 5. Reading from this address with the READ A/D signal = “0”, starts a 12–bit conversion (data read in this case is irrelevant).
Read A/D MSB
Read only port with address location 1200 hex. Schematic location; sheet 5. Reading from this address with the READ A/D signal = “1”, reads the 8 most significant bits of the A/D output.
Read A/D LSB
Read only port with address location 1201 hex. Schematic location; sheet 5. Reading from this address with the READ A/D signal = “1”, reads the 4 least significant bits of the 12–bit A/D output followed by the 4 trailing zeroes in the least significant nibble.
5-6 Operator I/O Status
Read only port with address location 1400 hex. Schematic location; sheet 3, 1–D to 1–H. Port select signal is RDP4*.
TABLE 5–6
OPERATOR I/O STATUS PORT
BIT SIGNAL NAME DESCRIPTION
0 SER PORT EN Logic 1 serial port is to be enabled 1 KEY SWITCH ON Logic 1 key switch is in the ON position. 2 OPTION SW 2 Logic 1 cycles CPU at Power–Up.
Logic 0 normal run mode.
3 FIELD LIGHT SW Logic 1 field light switch is pressed. 4 MAS UP Logic 1 MAS UP switch is pressed 5 MAS DOWN Logic 1 MAS DOWN switch is pressed 6 KVP UP Logic 1 KVP UP switch is pressed 7 KVP DOWN Logic 1 KVP DOWN switch is pressed.
5-7 Generator and AEC Status
Read only port with address location 1600 hex. Schematic location; sheet 3, 5–D to 1–H. Tap feedback signals originate on the 1 kHz driver board. Tap selection is through the Gen-erator Control 2 port. Tap numbers and tap selection relay numbers are the same. Tap 6 and relay K6 should not be active during applications. Port select signal is RDP6*.
TABLE 5–7
GENERATOR AND AEC STATUS PORT
BIT SIGNAL NAME DESCRIPTION
0 TAP 1 FDBK Logic 1 tap 1 signal was received by the 1khz inverter 1 TAP 2 FDBK Logic 1 tap 2 signal was received by the 1khz inverter 2 TAP 3 FDBK Logic 1 tap 3 signal was received by the 1khz inverter 3 TAP 4 FDBK Logic 1 tap 4 signal was received by the 1khz inverter 4 TAP 5 FDBK Logic 1 tap 5 signal was received by the 1khz inverter 5 TAP 6 FDBK Logic 1 tap 6 signal was received by the 1khz inverter 6 AEC ON Logic 1 when Automatic Exposure Control is selected.
Allows AEC EXP EN to terminate exposure. 7 AEC EXP EN Logic 1 exposure allowed when AEC ON is active.
Logic 0 exposure stops when AEC ON is active. Logic 1 when AEC is not installed.
TABLE 5–8
KVP TAP SELECTION RELAY
00H 0 0 0 0 0 0 01H 0 0 0 0 0 1 02H 0 0 0 0 1 0 03H 0 0 0 0 1 1 04H 0 0 0 1 0 0 05H 0 0 0 1 0 1 06H 0 0 0 1 1 0 07H 0 0 0 1 1 1 08H 0 0 1 0 0 0 09H 0 0 1 0 0 1 0AH 0 0 1 0 1 0 0BH 0 0 1 0 1 1 0CH 0 0 1 1 0 0 0DH 0 0 1 1 0 1 0EH 0 0 1 1 1 0 0FH 0 0 1 1 1 1 10H 0 1 0 0 0 0 20H 1 0 0 0 0 0 30H 1 1 0 0 0 0 40H = AEC ON 80H = AEC EXP EN
5-8 Generator Control 2
Write only port with address location 1000 hex. Schematic location; sheet 4, 9–B. Port se-lect signal is WRP0*.
TABLE 5–9
GENERATOR CONTROL 2 PORT
BIT SIGNAL NAME DESCRIPTION
0 TAP 6 Logic 1 selects tap relay 6
1 ROTOR SELECT Logic 1 pulls in a relay which enables current to flow through the stator. If this relay is not pulled in, the field lamp circuit is enabled.
2 SAFETY CONT ENB Logic 1 pulls in a relay whose contacts pull in the safety contactor which supplies power to the 1 khz inverter. In addition, the prep switch must be depressed in order to pull in the safety contactor.
3 TAP 1 Logic 1 selects tap relay 1 4 TAP 2 Logic 1 selects tap relay 2 5 TAP 3 Logic 1 selects tap relay 3 6 TAP 4 Logic 1 selects tap relay 4 7 TAP 5 Logic 1 selects tap relay 5
5-9 Charger and Drive Control
Write only port with address 1100 hex. Schematic location; sheet 4, 11–D to 11–F. Port se-lect signal is WRP2*.
TABLE 5–10
CHARGER AND DRIVE CONTROL PORT
BIT SIGNAL NAME DESCRIPTION
0 TRIP BREAKER Logic 1 trips the circuit breaker.
1 CHARGE SCALE–SELECT Logic 1 sets charger to trickle charge rate. Logic 0 sets charger to full charge rate.
2 CHARGER RELAY Logic 1 connects isolation transformer to charger. 3 REVERSE ONLY Logic 1 motion is allowed in reverse only. 4 FULL SPD ENA Logic 1 enables peak drive speed.
Logic 0 limits drive speed.
5 MOTOR ENA Logic 1 connects the motor drives to the motors and releases the brakes.
6 DRIVE RESET Logic 1 resets the drive boards.
7 BAT V & CHARGE CUR SEL Logic 1 selects charge current feedback. Logic 0 selects battery voltage feedback.
