SIMS - Secondary Ion Mass Spectrometry
Biological tissue sample preparation for time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging
... Time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging is an analytical technique rapidly expanding in use in biological ...In mass spectrometry imaging (MSI), ...
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Imaging of crystalline and amorphous surface regions using time of flight secondary ion mass spectrometry (ToF SIMS): application to pharmaceutical materials
... time-of-flight secondary-ion mass spectroscopy (ToF-SIMS) measurements for quench-cooled amorphous and recrystal- lized samples of the drugs indomethacin, felodipine and ...
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The Development of MeV Secondary Ion Mass Spectrometry.
... The mass spectrom eter was mounted at a 45° angle to the incident beam and normal to the sample’s surface ...transmission ion microscopy (STIM) [64] and beam current, ...ary ion beam across a m etal ...
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Helium ion microscope – secondary ion mass spectrometry for geological materials
... backscattered ion imaging (RBI) and secondary ion mass spectrometry (SIMS) ...only. SIMS, however, opens the entire range of mass numbers, from a few atomic ...
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Surface chemical analysis Secondary-ion mass spectrometry Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
... 4.2 Preparation of polycarbonate sample 4.2.1 Instructions for the preparation of a PC reference sample are provided. This method can give sample-to-sample repeatability in ToF SIMS spectra of better than 1,9 % ...
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A study of shallow implants in silicon by secondary ion mass spectrometry
... The depth scale of a SIMS depth profile is calibrated after the analysis and usually a constant sputter rate is assumed to have pertained throughout the analysis. The presence of highly defected regions in the ...
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Secondary Ion Mass Spectrometry Imaging of Dictyostelium discoideum Aggregation Streams
... different mass spectrometry imaging ap- ...a mass of spore cells which can then be dispersed by the wind to start new ...situ mass spectrometry imaging since it does not require the use ...
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The development of secondary ion mass spectrometry for two dimensional impurity profiling in semiconductors
... cm'3. SIMS is currently used to measure the depth profile o f dopant species with both high resolution and ...employ SIMS directly to determine the impurity distribution, at the required spatial resolution, ...
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Organic Secondary Ion Mass Spectrometry: Signal Enhancement by Water Vapor Injection
... Results and Discussion The goal of this article is to assess the interest of the injection of high-pressure water vapor in the selvedge region of organic samples for SIMS analysis. The choice of the used set ...
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Developing Protein Tags for Secondary Ion Mass Spectrometry to Determine Protein Interaction
... of secondary ions. These ions are then mass analyzed, usually with a time of flight mass ...analyzer. SIMS instruments have already been used to analyze the chemical composition of ...
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Transmission secondary ion mass spectrometry using 5 MeV C60[+] ions
... In SIMS, secondary ions emitted from a sample in the backward direction with respect to the direction of a primary ion are generally ...the secondary ions emitted in the forward direction upon ...
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Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy
... Mass spectrometry techniques serve as indispensable an- alytical tools in the investigation of molecular metabolic pathways that are essential for maintaining cell ...analysis, mass ...
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Towards practical time-of-flight secondary ion mass spectrometry lignocellulolytic enzyme assays
... A ToF-SIMS peak pattern related to sodium (23 Da) was observed in the MCR model of the samples exposed to buffer (Figure 1A,B). The samples continuously washed with water exhibited the highest salt contents ...
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The Application of Time-of-Flight Secondary Ion Mass Spectrometry for the Analysis of Overlapping Fingerprints and Inks.
... Lee et al. (2008) carried out research into red sealing-inks used in documentation in Asia [47]. They utilised ToF-SIMS in order to investigate whether the red sealing-ink was on top or below ink from a common ...
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Identification and imaging of modern paints using Secondary Ion Mass Spectrometry with MeV ions
... Time-of-flight Secondary Ion Mass Spectrometry with keV ions (keV-ToF-SIMS) [19] is established in the cultural heritage for many ...and mass resolution and has already been ...
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An image formation model for Secondary Ion Mass Spectrometry imaging ofbiological tissue samples
... 2.1. SIMS technique and image generation The diagram in ...of SIMS instrumentation and the main analysis results. SIMS utilizes a par- tially destructive bombardment (sputtering) of the sample ...
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A comprehensive protocol for chemical analysis of flame combustion emissions by secondary ion mass spectrometry
... flight secondary ion mass spectrometry (ToF-SIMS) is an analytical technique used to probe the composition (elemental and/or molecular) of any predefined micro-volume from any solid ...
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Determining the chronology of deposition of natural fingermarks and inks on paper using secondary ion mass spectrometry
... ight secondary ion mass spectrometry (ToF-SIMS) for determining the deposition sequence of fi ngermarks and ink on a porous paper ...
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Determining the chronology of deposition of natural fingermarks and inks on paper using secondary ion mass spectrometry
... 3.4. Blind tests A comprehensive blind test series that looked at 51 latent n- germark samples deposited over/under laser-printed ink resul- ted in a success rate of 100%. This corroborated our previous work and showed ...
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Solid-material-based Coupling Efficiency Analyzed with Time-of-Flight Secondary Ion Mass Spectrometry
... Despite modern surface-sensitive spectroscopic techniques like IR- or XP-spectroscopy it is still challenging to analyze complex chemically modified thin films like the polymer coated silicon sup- ports presented herein. ...
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