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Surface metrology

Information rich surface metrology

Information rich surface metrology

... the surface, manufacturing process and measurement process within the data processing pipeline, information-rich surface metrology surely loses generality with respect to the conventional approach to ...

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An Information Model for Surface Metrology

An Information Model for Surface Metrology

... measurement; 2) the characteristic and the measurement conditions which state the key information of a measurand. There are various file formats used to store the measured dataset in a computer. However, the information ...

8

Focus Variation – a Robust Technology for High Resolution Optical 3D Surface Metrology

Focus Variation – a Robust Technology for High Resolution Optical 3D Surface Metrology

... Nevertheless, optical measurement devices have become increasingly popular in the last decade as described by Jiang [4] in his historical overview of surface metrology. This is above all due to their ...

12

Absolute surface metrology by shear rotation with position error correction

Absolute surface metrology by shear rotation with position error correction

... Furthermore, the averaged wavefront for N = 6 with position errors (azimuthal errors and alignment error) introduced is shown in Fig. 4 and the difference of the averaged wavefront for N = 6 before and after pos- ition ...

6

Further Development of Surface Metrology Methods for Predicting the Functional Performance of Flexible PV Barrier 
Films

Further Development of Surface Metrology Methods for Predicting the Functional Performance of Flexible PV Barrier Films

... Areal surface texture parameters have been shown to be a potentially effective tool to predict the PV module performance and develop a process quality assessment ...determined. Surface segmentation through ...

10

Advances in ultra low contact force nanometric surface metrology

Advances in ultra low contact force nanometric surface metrology

... scanners. Metrology in any axis has been largely ignored, with linear relationships assumed for piezoelectric ...and metrology must be performed on the scanning ...

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The Development of a Flexible Characterisation System for Surface Metrology

The Development of a Flexible Characterisation System for Surface Metrology

... acquisition of topography data on very fine surfaces [55]. Besides, there are other possible methods for measuring surfaces but on the whole they are matched to a particular process or surface shape. One of them ...

175

Surface Metrology for the Automotive Industry

Surface Metrology for the Automotive Industry

... three surface profiles are from surfaces manufactured with inherently different properties, yet the three values of Ra are very similar, as although for example the honed surface is dominated by valleys and ...

10

A unified methodology for the application of surface metrology

A unified methodology for the application of surface metrology

... -unsigned long numpts, unsigned long *first filtered, unsigned long *last filtered { int nyquist avail ; unsigned long 1, last, used numpts double huge *temp double length mm, alpha, pi [r] ...

352

A review of NIST projects in surface and topography metrology for firearm evidence identification in forensic science

A review of NIST projects in surface and topography metrology for firearm evidence identification in forensic science

... are surface topographies by nature, it is proposed to develop a 2D/3D Topography Measurement System independent of optical lighting conditions for quantitative ballistics topography measurements and correlations ...

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Surface and topography metrology in firearm evidence identification and engineering surface quality control

Surface and topography metrology in firearm evidence identification and engineering surface quality control

... 2.5.6. Surface and topography metrology support firearm evidence identification The field of firearms identification is more than 100 years old and the field of surface metrology is at least ...

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Metrology: The Body as Measure in Les Liaisons dangereuses

Metrology: The Body as Measure in Les Liaisons dangereuses

... used by their noble (and other) contemporaries; that their worldview is shaped and measured by the same feet, leagues, pounds and ounces; and that, unsurprisingly, their conception of the human body is also informed by ...

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Legal Metrology and International Trade

Legal Metrology and International Trade

... legal metrology ensures that during the sale of any commodity in loose form, the actual delivery to the purchaser is not less than the quantity contracted and paid ...legal metrology authority protects ...

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Quantum metrology with cold atomic ensembles

Quantum metrology with cold atomic ensembles

... Traditional discussions of quantum metrology [35, 36] describe linear interferometers, or equivalently systems of non-interacting particles, as models for precision instruments. A number of recent works have ...

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Frequency metrology in quantum degenerate helium

Frequency metrology in quantum degenerate helium

... The present status of theory does not yet allow accurate extraction of nuclear charge radii from absolute level energies, however, in the isotope shift between 3 He and 4 He QED uncertai[r] ...

5

Electrical Metrology Applications of LabVIEW Software

Electrical Metrology Applications of LabVIEW Software

... Automation in measurement has wide range of electrical metrology applications and construction of powerful calibra- tion software is one of the highly accurate metrological laboratories’ priorities. Thus, two ...

8

Image-based EUVL Aberration Metrology

Image-based EUVL Aberration Metrology

... Figure 10: Schematic of a catadioptric lens using both refractive and reflective elements [24] Figure 11: Schematic of the optics used in an EUVL system showing an LPP source, illuminati[r] ...

176

ME 472 Engineering Metrology

ME 472 Engineering Metrology

... h UT system consists of: a pulser/receiver a transducer and h UT system consists of: a pulser/receiver, a transducer, and a display software/device. Pulser/receiver produces high voltage electrical pulses. Driven by the ...

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Advances in Public Perception of Metrology in the Republic of Cuba

Advances in Public Perception of Metrology in the Republic of Cuba

... of Metrology, based on case studies conducted in seven enterprises in Havana, are ...about metrology, contribute to the elevation in Cuba of the society’s scientific culture and the public perception of ...

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Optomechanical enhancements for applications in metrology

Optomechanical enhancements for applications in metrology

... the surface tension, the viscosity, and other properties of fluids at the microscopic level [124], and to perform high-precision subsurface characterization of nano-structures with high dielectric constants ...

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