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N-type silicon

The effect of oxide precipitates on minority carrier lifetime in n type silicon

The effect of oxide precipitates on minority carrier lifetime in n type silicon

... in n-type versus p-type silicon The vast majority of silicon photovoltaic cells are fabri- cated from p-type substrates, although n-type substrates may enable the ...

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Characterization of Phosphoric Acid Doped N-type Silicon Thin Films Printed on ITO Coated PET Substrate

Characterization of Phosphoric Acid Doped N-type Silicon Thin Films Printed on ITO Coated PET Substrate

... However, n-type material is an attractive alternative. In this research n-type polycrystalline silicon thin films deposited on ITO-coated polyethylene terephthalate (PET) substrate ...

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The Impact of Metallic Impurities on Minority Carrier Lifetime in High Purity n-type Silicon.

The Impact of Metallic Impurities on Minority Carrier Lifetime in High Purity n-type Silicon.

... p-type silicon is widely used as the active absorbing region in Si solar ...p-type silicon, float zone (low oxygen) silicon or in n-type silicon ...

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Ohmic Hetero Junction of n Type Silicon and Tungsten Trioxide for Visible Light Sensitive Photocatalyst

Ohmic Hetero Junction of n Type Silicon and Tungsten Trioxide for Visible Light Sensitive Photocatalyst

... DOI: 10.4236/msce.2017.58004 35 Journal of Materials Science and Chemical Engineering concept of ohmic contact (PC1/PC2, Type III in Scheme 1). In most cases, they were a photoelectrochemical (PEC) electrode ...

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Material properties of n type silicon and n type UMG solar cells

Material properties of n type silicon and n type UMG solar cells

... polycrystalline silicon feedstocks from the Siemens process these ...for n-type ...of n-type UMG Cz solar cells, however, they can be partially recovered with annealing under ...

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Implementation of EIS for dopant profile analysis in n-type silicon

Implementation of EIS for dopant profile analysis in n-type silicon

... around 0.28 cm 2 of the sample surface is exposed to the electrolyte. The setup is configured in such a way that during the etch process, the sample surface could be illuminated by UV-light which is necessary to generate ...

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Formation and Characterization of Aluminium Contacts to n-type Silicon

Formation and Characterization of Aluminium Contacts to n-type Silicon

... Czochralski grown, (100) oriented, 4”, n-type, Sb doped silicon wafers that were polished on one side and had resistivities in the range of 0.02 Ω-cm to 0.06 Ω-cm were treated with a heavy phosphorus ...

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Structural and optical properties of n- type porous silicon– effect of etching time

Structural and optical properties of n- type porous silicon– effect of etching time

... Porous silicon layers have been prepared from n-type silicon wafers of (100) orientation. SEM, FTIR and PL have been used to characterize the morphological and optical properties of porous ...

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Influence of annealing and bulk hydrogenation on lifetime limiting defects in nitrogen doped floating zone silicon

Influence of annealing and bulk hydrogenation on lifetime limiting defects in nitrogen doped floating zone silicon

... Abstract—A recombination active defect is found in as-grown high-purity floating zone n-type silicon wafers containing grown-in nitrogen. In order to identify the properties of the defect, injection- ...

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Enhanced solar energy conversion in Au doped, single wall carbon nanotube Si heterojunction cells

Enhanced solar energy conversion in Au doped, single wall carbon nanotube Si heterojunction cells

... Constructing the homogeneous semitransparent SCNT network is the first step for fabricating SCNT/n-Si photo- voltaic conversion cell. So SCNT film was prepared by the method of electrophoretic deposition (EDP) ...

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Effect of Preparation Parameters on Physical, Thermal and Optical Properties of n-type Porous Silicon

Effect of Preparation Parameters on Physical, Thermal and Optical Properties of n-type Porous Silicon

... Porous silicon (PSi) layers were formed on n-type silicon (Si) wafers using electrochemical etching ...porous silicon on silicon substrates were investigated by employing ...

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Volume 9 | Issue 4 - 2019

Volume 9 | Issue 4 - 2019

... Porous silicon (PS) sheet of different thicknesses was made on the surface of n-type and p-type silicon substrate using two methods; Electrochemical Etching (ECE) used for p-type ...

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EDESR and ODMR of Impurity Centers in Nanostructures Inserted in Silicon Microcavities

EDESR and ODMR of Impurity Centers in Nanostructures Inserted in Silicon Microcavities

... 1 silicon mi- crocavity on the n-type Si (100) wafer has been identi- fied at T = 300 K in the studies of the transmission spec- tra which have revealed the ODMR of the trigonal Fe-B pairs and the ...

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Fabrication and Identification of the Efficiency of a Si-Based Solar Cell

Fabrication and Identification of the Efficiency of a Si-Based Solar Cell

... (Al) paste on one side of the wafer. Perfectly texturing ensures the excellent pyramid height of the silicon wafers. The pyramid heights of raw, textured and doped wafers are 8233.2 Å, 15222.5 Å and 55654.1 Å ...

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Study of ICP-CVD grown Amorphous and Microcrystalline Silicon thin films in HIT structure

Study of ICP-CVD grown Amorphous and Microcrystalline Silicon thin films in HIT structure

... We have used p-type 1-10 cm <100>, crystalline silicon wafer for this study. The Si films were deposited in a planar coil ICP CVD reactor. In this system the intense degree of dissociation and ...

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Behaviour and effects of fluorine in annealed n+ polycrystalline silicon layers on silicon wafers

Behaviour and effects of fluorine in annealed n+ polycrystalline silicon layers on silicon wafers

... LPCVD polysilicon layers were deposited on 共 100 兲 sili- con wafers, implanted with 1 ⫻ 10 16 cm ⫺ 2 F ⫹ plus 1 ⫻ 10 16 As ⫹ and annealed at 850, 950, 1015, or 1065 °C 共 F specimens 兲 or similarly processed without the F ...

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The Influence of Pico Second Pulse Electron Irradiation on the Electrical Physical Properties of Silicon Crystals

The Influence of Pico Second Pulse Electron Irradiation on the Electrical Physical Properties of Silicon Crystals

... There are numerous publications devoted to the influence of irradiations, in particular high energy electron ir- radiation, on the properties of silicon crystal. One can present an extensive bibliography, however ...

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A study of electronic structure and thermal stability of engineered SOI material

A study of electronic structure and thermal stability of engineered SOI material

... analysed using SEM and AFM. Due to the thermal gradient present during annealing, different stages of the dewetting process are found across the film. Fig. 5.5(a) shows a region from the cooler side of the ~3 nm SOI, ...

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Recombination Activity of Metal-related and Boron-oxygen Defects in Crystalline Silicon

Recombination Activity of Metal-related and Boron-oxygen Defects in Crystalline Silicon

... in n- and p-type samples: in both Cu- and Ni-doped n-type samples, particles are distributed randomly and homogeneously in circular central regions and edge ...the n-type ingots ...

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Origin of dislocation luminescence centers and their reorganization in p type silicon crystal subjected to plastic deformation and high temperature annealing

Origin of dislocation luminescence centers and their reorganization in p type silicon crystal subjected to plastic deformation and high temperature annealing

... related to the technological processes of samples 2 and 3 preparation. In paper [8], it is shown that the presence of linear defects significantly modified spectrum of surface states (SS) of p-Si. It is con- nected with ...

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