Gate oxide
Application of Taguchi Method in Optimization of Gate Oxide and Silicide Thickness for 45nm NMOS Device
5
Leakage Power Reduction in Domino Logic Circuits At 45 Nm Technology
6
Analysis of Leakage Current Reduction Techniques in SRAM Cell in 90nm CMOS Technology
5
Electronic properties of the Zr-ZrO2-SiO2-Si(100) gate stack structure
10
Device reliability challenges for modern semiconductor circuit design – a review
11
A New Dual Threshold Technique for Leakage Reduction in 65nm Footerless Domino Circuits
7
Effects of Energy Relaxation via Quantum Coupling Among Three Dimensional Motion on the Tunneling Current of Graphene Field Effect Transistors
8
A Short Channel Double Gate MOSFET Model
5
Designing a Full Adder Circuit Based on Quasi Floating Gate
7
Breakdown and Reliability of CMOS Devices with Stacked Oxide/Nitride and Oxynitride Gate Dielectrics Prepared by RPECVD
145
OXIDATION OF SILICON - THE VLSI GATE DIELECTRIC
30
Quantitative Modeling and Simulation of Single Electron Transistor
7
Effect of Bandgap Variation on DGTFET
7
Review Literature for Mosfet Devices Using High K
8
The consequence of Source/Drain factor toward drive current in 10nm SOI MOSFET device
6
Overstress-Free Charge Pump White LED Driver
6
Low Power Design and Simulation of 7T SRAM Cell using various Circuit Techniques
6
Characterization of High-k Gate Stacks in Metal-Oxide-Semiconductor Capacitors
171
Analysis of Block Oxide Height Variations for a 40nm Gate Length bFDSOI-FET
5
Title: Study of Outpouring Power Diminution Technique in CMOS Circuits
7