AFM tip
Automatic hammering of nano patterns on special polymer film by using a vibrating AFM tip
... the AFM tip, and the sentence double vSetPoint = ...the tip from center O to point A by a distance of 2 μm; the command of LithoTranslate (−size, size, rate) moved the tip from point A to B to ...
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Fabrication of nanoscale pits with high throughput on polymer thin film using AFM tip-based dynamic plowing lithography
... much smaller. In contrast, the depth is independent of the scratching direction. Separate pits can be generated with scratching velocities larger than the critical value of 100 μm/s. The total number of fabricated pits ...
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Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip
... sTNP tip is located slightly inward at the end of the AFM cantilever; therefore, the end of the AFM cantilever is susceptible to striking the edge of the top electrode when the distance between the ...
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Nano structure fabrication of GaAs using AFM tip induced local oxidation method: different doping types and plane orientations
... thus AFM-based local oxidation (AFM-LO) process has been intensively investigated to fabricate and modulate nano-structures and devices such as field-effect transistors and single-electron transistors with ...
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Predictive Modeling and Optimization of Vibration-assisted AFM Tip-based Nanomachining
... the AFM-based nanofabrication methods can easily achieve nanometer-scale resolution, they have been used widely in recent ...these AFM-based nanomachining processes, such as nanometer scale resolution as ...
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Characterization of single 1 8 nm Au nanoparticle attachments on AFM tips for single sub 4 nm object pickup
... tipless AFM cantilever with ...an AFM tip to increase the resolution of magnetic force mi- ...the AFM tip is approximately 1 μm [10], due mainly to the colloidal attachment process ...
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Local Oxide Growth Mechanisms on Nickel Films
... different size oxide dots were analyzed at the anodized voltages of 8 and 10 V and between the anodization times of 0.02–100 s. During the AFM tip-induced anodization proc- ess, the electric field enhanced ...
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Measurement of local optomechanical properties of a direct bandgap 2D semiconductor
... an AFM tip to investigate the fun- damental optomechanical properties of locally strained TMD ...cantilever tip that we used for indentation was approximately 400 nm. The tip was intentionally ...
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Baumann, Fabian (2016): Atomic force microscopy for high-specificity manipulations of proteins and high-throughput analysis in nanoapertures. Dissertation, LMU München: Fakultät für Physik
... the AFM tip and the position of the nanoapertures with the microscope ...the AFM cantilever tip is a stochastical process where only the functionalization density is controlled and kept within ...
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Controlled nanodot fabrication by rippling polycarbonate surface using an AFM diamond tip
... Scratching angles of 0°, 45°, and 90° were used to scratch PC surfaces with zigzag traces of the AFM tip. The ma- chined structures and corresponding cross-sections are shown in Figure 2, with a scanning ...
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Surface force analysis of glycine adsorption on different crystal surfaces of titanium dioxide (TiO2)
... glycine-modified AFM tips at room temperature in a phosphate-buffered saline (PBS) solution (pH ...modified AFM tip onto the measured surface to a maximum load of 400 pN at a loading rate of 6 nN/s, ...
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Vibration Studying of AFM Piezoelectric Microcantilever Subjected to Tip-Nanoparticle Interaction
... between tip and nanoparticle. But as tip approaches to nanoparticle and the Van der Waals force is intensified, increase of amplitude will be ...MC tip to the nanoparticle and thus intensification of ...
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Imaging of gan algan high electron mobility transistors
... There is another mode of operation for an STM, namely STS: Scanning Tunnel ling Spectroscopy, where, apart from topographical images, the electronic properties can be imaged in detail. Here the tip is held over ...
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Electrical Characterization of TiSi2 Nanoscale Islands by Scanning Probe Microscopy
... Since the inception of scanning tunneling microscope (STM) in 1981 by Binnig and Rohrer, many variations of STM have been introduced [1]. These scanning probe microscopies (SPM) can provide location specific information. ...
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Conductive AFM for CNT characterization
... The outcome proves that none of both experiments influences somehow the electric response and sustains a very good reproducibility of the I-V spectroscopy. The estimated average error bar approaches 2% and 4% relative to ...
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Soluble Structure of CLIC and S100 Proteins Investigated by Atomic Force Microscopy
... first AFM liquid cell images of the A8/A9 heterocomplex, along with images of its interaction with artificial lipid membranes ...earlier AFM study of interactions between the soluble A8/A9 complex and ...
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Detection of hepatitis C virus core protein in serum by atomic force microscopy combined with mass spectrometry
... of AFM chips were used, ie, AFM chips with immobilized antibodies and control AFM chips with an amino-modified surface but without immobilized ...the AFM chip surface was estimated using ...
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CONCENTRATION IMPACT AND STRUCTURE SUITABILITY OF ACETYL SALICYLATE MOEITY (ASPIRIN) AS MULTI-FUNCTIONALIZED DRUG
... Furthermore AFM-microscopy was to visualize a real 3D- imaging of sample’s surface topography ...resolution AFM-investigations indicated that crystalline aspirin has regular arrays of atomic arrangement ...
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A Software Tool For Programming Training Trough Accumulative Frame System
... fact that frames force students to systemise information, to focus on concepts, and to achieve a higher level of concentration. The paper presents a part of a study on the application of frames for the representation of ...
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Dynamic response of a cracked atomic force microscope cantilever used for nanomachining
... Cracks may occur in the AFM cantilever during the nanomachining experiments or in the fabrication of can- tilever [12]. The cantilever with cracks will affect its per- formance when used. The finite element method ...
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