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p/sup +/ 4H-SiC

Fabrication of uniform 4H SiC mesopores by pulsed electrochemical etching

Fabrication of uniform 4H SiC mesopores by pulsed electrochemical etching

... of SiC porous semiconductors has drawn significant attention. SiC porous structures are found applications in the gas sensors [2], supercapacitor [3], and RF planar inductor ...amorphous SiC thin ...

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Design, Analysis, and Optimization of 1.2 kV 4H-SiC Planar-Gate Power MOSFETs for Improved High Frequency Switching.

Design, Analysis, and Optimization of 1.2 kV 4H-SiC Planar-Gate Power MOSFETs for Improved High Frequency Switching.

... applications, 4H-SiC is an attractive wide bandgap semiconductor having high critical electric field (~2 MV/cm), which makes SiC power devices have a thin drift layer with high doping concentration ...

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Incipient plasticity in 4H-SiC during qusistatic nanoindentation

Incipient plasticity in 4H-SiC during qusistatic nanoindentation

... resistance, SiC is an appropriate choice to replace silicon for advanced ultra precision engineering applications especially in the electronic industry ...[1]. SiC is also recognized as a potential ...

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Static and Dynamic Characterization of High Speed Silicon Carbide (SiC) Power Transistors

Static and Dynamic Characterization of High Speed Silicon Carbide (SiC) Power Transistors

... the 4H-SiC ...in 4H-SiC have been demonstrated [9,12] with superior ...characteristics. SiC BJTs have been reported in the lit- erature to block ...of SiC, material cost, base ...

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Nonlocal effects in thin 4H-SiC UV avalanche photodiodes

Nonlocal effects in thin 4H-SiC UV avalanche photodiodes

... contrast, SiC is technologically more mature and is a potential alternative to the III-nitrides for UV ...The 4H polytype of SiC has, in addition to its superior thermophysical properties, the advan- ...

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Characterization of Nitrogen-Boron doped 4H-SiC substrates

Characterization of Nitrogen-Boron doped 4H-SiC substrates

... doped 4H-SiC single crystal was prepared by physical vapor transport method and the doping concentration was determined by secondary ion mass ...of 4H-SiC substrate was measured by contactless ...

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ELECTRICAL CHARACTERIZATION OF CHROMIUM/4H-SIC SCHOTTKY BARRIER DIODES

ELECTRICAL CHARACTERIZATION OF CHROMIUM/4H-SIC SCHOTTKY BARRIER DIODES

... of SiC for the fabrication of high quality devices depend to a large extent on the quality of the metal–SiC ...contact. 4H- SiC has been chosen for the fabrication of Schottky barrier diodes ...

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Development of 4H SiC power MOSFETs for high voltage applications

Development of 4H SiC power MOSFETs for high voltage applications

... on SiC due to its low diffusion coefficients of impurities ...suppress SiC surface roughening and dopant out-diffusion, such as annealing with a silane overpressure [122] or use of capping layers such as ...

357

On the application of novel high temperature oxidation processes to enhance the performance of high voltage silicon carbide PiN diodes

On the application of novel high temperature oxidation processes to enhance the performance of high voltage silicon carbide PiN diodes

... properties, 4H-silicon carbide (SiC) is widely expected to dis- place silicon (Si) for high voltage power electronics systems as we move into a lower carbon ...of 4H-SiC include a critical ...

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Development of 4H SiC PiN diodes for high voltage applications

Development of 4H SiC PiN diodes for high voltage applications

... for 4H-SiC, which is approximately ten times greater than that for ...of 4H-SiC compared to Si means that for the same device width, 4H-SiC can withstand around ten times the ...

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Design and Fabrication of 4H-SiC High Voltage Devices.

Design and Fabrication of 4H-SiC High Voltage Devices.

... operation. 4H-SiC provides 10 times higher critical electric field, 3 times wider band gap, and 3 times higher thermal conductivity compared to ...of 4H-SiC enable the development of a ...

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MATHEMATICAL ESTIMATION OF AVALANCHE BREAKDOWN VOLTAGE EQUATION IN VERTICAL DIMOSFET WITH GAUSSIAN DOPING PROFILE ON 4H  SIC WAFER

MATHEMATICAL ESTIMATION OF AVALANCHE BREAKDOWN VOLTAGE EQUATION IN VERTICAL DIMOSFET WITH GAUSSIAN DOPING PROFILE ON 4H SIC WAFER

... c-axis. 4H-SiC devices have lower specific on-resistance with respect to other semiconductors such as Si, GaAs and 6H- ...before SiC- based devices and circuits can be scaled-up and reliably ...

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IN.PACTTM AdmiralTM drug-coated balloons in peripheral artery disease: current perspectives

<p>IN.PACT<sup>TM</sup> Admiral<sup>TM</sup> drug-coated balloons in peripheral artery disease: current perspectives</p>

... DEEP trial, a total of 358 patients mostly with CLI were randomized to IN.PACT Amphirion DCB treatment group or BA treatment group. Coprimary efficacy outcomes were TLR and angiographic LLL at 12 months, and the primary ...

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What Do We Know About Technical Assistance? Enhancing the Science and Practice of Technical Assistance via a Research Synthesis

What Do We Know About Technical Assistance? Enhancing the Science and Practice of Technical Assistance via a Research Synthesis

... Silicon carbide crystal lattice is structured from closely packed silicon-carbon bilayers (also called Si-C double layers). Si-C bilayer can be viewed as a planar sheet of silicon atoms coupled with a planar sheet of ...

159

The Effects of Ability Grouping on Gifted & Talented Third, Fourth, and Fifth Grade Students in Selected South Carolina Public School Districts

The Effects of Ability Grouping on Gifted & Talented Third, Fourth, and Fifth Grade Students in Selected South Carolina Public School Districts

... properly. SiC allows to eliminate the need of cryogenic cooling attachments making it more compact, light-wight, low power consuming detection systems ...[1]. SiC is a wide band gap semiconductor material ...

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Investigation of Low Temperature, Atomic-Layer-Deposited Oxides on 4H-SiC and their Effect on the SiC/SiO2 Interface.

Investigation of Low Temperature, Atomic-Layer-Deposited Oxides on 4H-SiC and their Effect on the SiC/SiO2 Interface.

... oxidize SiC during device ...the SiC side of the interface is not a result of thermal oxidation, but is the expected standard width of the SiC side of the interfacial ...the SiC side of the ...

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An integrated safety analysis of combined acetaminophen and ibuprofen (Maxigesic&reg;/ Combogesic&reg;) in adults

<p>An integrated safety analysis of combined acetaminophen and ibuprofen (Maxigesic<sup>&reg;</sup>/ Combogesic<sup>&reg;</sup>) in adults</p>

... Analysis of the safety data pooled from multiple repeated- dose Phase II/III clinical studies illustrates the excellent tolerability and safety of multiple FDC APAP/IBP oral tablet dos[r] ...

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EFFECTS OF 3.0 MeV ELECTRON IRRADIATION ON 4H-SiC WAFER PROPERTIES

EFFECTS OF 3.0 MeV ELECTRON IRRADIATION ON 4H-SiC WAFER PROPERTIES

... Ferrero, S., Porro, S., Giorgis, F., Pirri, C. F., Mandracci, P., Ricciardi, C., Scaltrito, L., Sgorlon, C., Richieri, G. and Merlin, L. (2002). Defect Characterization of 4H-SiC wafers for Power ...

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Heteroepitaxial beta Ga2O3 on 4H SiC for an FET with reduced self heating

Heteroepitaxial beta Ga2O3 on 4H SiC for an FET with reduced self heating

... growth on a 4H-SiC substrate. Using a recently published device as a model, the reduction achieved in self-heating allows the device to be driven at higher gate voltages and increases the overall ...

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Polytype Stability, Microstructural Evolution, and Impurities at the Interface of Homoepitaxial 4H-SiC(1120) Thin Films Grown via Hot-Wall Chemical Vapor Deposition.

Polytype Stability, Microstructural Evolution, and Impurities at the Interface of Homoepitaxial 4H-SiC(1120) Thin Films Grown via Hot-Wall Chemical Vapor Deposition.

... The difference in the surface characteristics at 1450ºC, compared to the lesser temperatures, may be the result of surface decomposition or re-deposition of the SiC coating. To determine if re-deposition was ...

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