4H-SiC power diodes
Development of Optimal 4H-SiC Bipolar Power Diodes for High-Voltage High-Frequency Applications.
176
On the application of novel high temperature oxidation processes to enhance the performance of high voltage silicon carbide PiN diodes
10
MATHEMATICAL ESTIMATION OF AVALANCHE BREAKDOWN VOLTAGE EQUATION IN VERTICAL DIMOSFET WITH GAUSSIAN DOPING PROFILE ON 4H SIC WAFER
7
Developing Physics-based Models for 4H-SiC High Voltage Power Switches - MOSFET, IGBT and GTO
162
Heteroepitaxial beta Ga2O3 on 4H SiC for an FET with reduced self heating
6
Design, Analysis, and Optimization of 1.2 kV 4H-SiC Planar-Gate Power MOSFETs for Improved High Frequency Switching.
186
Polytype Stability, Microstructural Evolution, and Impurities at the Interface of Homoepitaxial 4H-SiC(1120) Thin Films Grown via Hot-Wall Chemical Vapor Deposition.
286
DYNAMIC CHARACTERISTICS OF IMPATT DIODES BASED ON WIDE BANDGAP AND NARROW BANDGAP SEMICONDUCTORS AT W-BAND
11
Design and Fabrication of 4H-SiC High Voltage Devices.
197
High Efficiency SiC Terahertz Source in Mixed Tunnelling Avalanche Transit Time Mode
9
SiC polytypes and doping nature effects on electrical properties of ZnO SiC Schottky diodes
24
Development of 4H SiC PiN diodes for high voltage applications
339
The effect of interfacial charge on the development of wafer bonded silicon on silicon carbide power devices
5
ELECTRICAL CHARACTERIZATION OF CHROMIUM/4H-SIC SCHOTTKY BARRIER DIODES
7
Static and Dynamic Characterization of High Speed Silicon Carbide (SiC) Power Transistors
10
Multidimensional characterization, Landau levels and Density of States in epitaxial graphene grown on SiC substrates
6
Nonlocal effects in thin 4H-SiC UV avalanche photodiodes
10
Crystallographic plane orientation dependent atomic force microscopy based local oxidation of silicon carbide
5
What Do We Know About Technical Assistance? Enhancing the Science and Practice of Technical Assistance via a Research Synthesis
159
Investigation of Low Temperature, Atomic-Layer-Deposited Oxides on 4H-SiC and their Effect on the SiC/SiO2 Interface.
178